TY - CONF
TI - Locational marginal pricing in the campus power system at the power distribution level
T2 - 2016 IEEE Power and Energy Society General Meeting (PESGM)
SP - 1
EP - 5
AU - Jun Hao
AU - Yi Gu
AU - Yingchen Zhang
AU - Jun Jason Zhang
AU - David Wenzhong Gao
PY - 2016
KW - load flow
KW - power distribution economics
KW - pricing
KW - smart power grids
KW - University of Denver
KW - alternate current optimal power flow
KW - campus power system
KW - direct current optimal power flow
KW - distributional nodal prices
KW - locational marginal pricing
KW - optimal power flow
KW - power distribution system
KW - power grid
KW - real-time nodal pricing
KW - smart grid
KW - Buildings
KW - Load modeling
KW - Power grids
KW - Pricing
KW - Real-time systems
KW - Renewable energy sources
KW - Distribution locational marginal price
KW - campus power system
KW - distribution power system
KW - load shedding
KW - optimal power flow
DO - 10.1109/PESGM.2016.7741569
JO - 2016 IEEE Power and Energy Society General Meeting (PESGM)
IS -
SN -
VO -
VL -
JA - 2016 IEEE Power and Energy Society General Meeting (PESGM)
Y1 - 17-21 July 2016
ER -
TY - CONF
TI - Optical absorption and electrical conductivity in amorphous In-Zn-O: A new TCO for CIGS PV
T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
SP - 001141
EP - 001143
AU - J. D. Perkins
AU - T. Gennett
AU - M. F. A. M. van Hest
AU - L. M. Gedvilas
AU - D. S. Ginley
PY - 2009
KW - amorphous semiconductors
KW - carrier density
KW - electrical conductivity
KW - electron mobility
KW - indium compounds
KW - semiconductor thin films
KW - sputtered coatings
KW - transparency
KW - wide band gap semiconductors
KW - InZnO
KW - amorphous films
KW - carrier concentration
KW - electrical conductivity
KW - electron mobility
KW - metal compositions
KW - optical absorption
KW - optimal oxygen level
KW - oxygen deficient
KW - sputter gas mixture
KW - transparent conducting oxide
KW - wavelength 400 nm to 1000 nm
KW - Absorption
KW - Amorphous materials
KW - Argon
KW - Conductive films
KW - Conductivity
KW - Electron mobility
KW - Electron optics
KW - Indium
KW - Optical coupling
KW - Optical films
DO - 10.1109/PVSC.2009.5411220
JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Y1 - 7-12 June 2009
ER -
TY - CONF
TI - Imaging of shunts and junction breakdown in multicrystalline silicon solar cells
T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
SP - 001184
EP - 001189
AU - N. J. Call
AU - S. W. Johnston
AU - R. K. Ahrenkiel
AU - M. J. Romero
AU - B. Yang
PY - 2009
KW - crystal defects
KW - electroluminescence
KW - elemental semiconductors
KW - impurities
KW - infrared imaging
KW - photoluminescence
KW - semiconductor device breakdown
KW - silicon
KW - solar cells
KW - Si
KW - crystallographic defect
KW - dark lock-in thermography
KW - electroluminescence
KW - emission spectra
KW - impurity
KW - junction breakdown
KW - multicrystalline silicon solar cells
KW - photoluminescence
KW - photonic emission
KW - radiative recombination
KW - shunting behavior
KW - visible breakdown emission
KW - Avalanche breakdown
KW - Charge coupled devices
KW - Charge-coupled image sensors
KW - Crystalline materials
KW - Electric breakdown
KW - Laboratories
KW - Photovoltaic cells
KW - Renewable energy resources
KW - Shunt (electrical)
KW - Silicon
DO - 10.1109/PVSC.2009.5411230
JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Y1 - 7-12 June 2009
ER -
TY - CONF
TI - All-laser scribing for thin-film CuInGaSe2 solar cells
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 003479
EP - 003484
AU - F. J. Pern
AU - L. Mansfield
AU - S. Glynn
AU - B. To
AU - C. DeHart
AU - S. Nikumb
AU - C. Dinkel
AU - M. Rekow
AU - R. Murison
AU - T. Panarello
AU - C. Dunsky
PY - 2010
KW - copper compounds
KW - electroluminescence
KW - gallium compounds
KW - indium compounds
KW - laser beam applications
KW - photoluminescence
KW - solar cells
KW - thin film devices
KW - CuInGaSe2
KW - NREL
KW - Performance degrading factors
KW - all-laser-scribing technology
KW - electroluminescence
KW - fiber laser system
KW - fill factor
KW - monolithically integrated minimodules fabrication
KW - photoluminescence
KW - programmable pulse shape
KW - pulse train
KW - scribe lines
KW - series resistance
KW - shunt resistance
KW - small-beam localized quantum efficiency analysis
KW - thin film solar cells
KW - three specific samples fabrication
KW - wavelength 1064 nm
KW - Atmospheric measurements
KW - Image edge detection
KW - Integrated optics
KW - Optical fibers
KW - Optical imaging
KW - Photonic band gap
DO - 10.1109/PVSC.2010.5614717
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - Compositional and structural characterization by TEM of lattice-mismatched III-V epilayers
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 000449
EP - 000451
AU - S. P. Ahrenkiel
AU - M. Rathi
AU - R. Nesheim
AU - N. Zheng
AU - S. Vunnam
AU - J. J. Carapella
AU - M. W. Wanlass
PY - 2011
KW - III-V semiconductors
KW - X-ray chemical analysis
KW - chemical vapour deposition
KW - electron diffraction
KW - gallium arsenide
KW - photovoltaic cells
KW - principal component analysis
KW - solar cells
KW - transmission electron microscopy
KW - CBED
KW - EDX
KW - GaAs
KW - HOLZ lines
KW - LMM
KW - MOCVD
KW - NREL
KW - PCA
KW - SDSM&T development
KW - TEM imaging
KW - bright-field disks
KW - compositional transmission electron microscopy characterization
KW - convergent-beam electron diffraction
KW - defect morphology
KW - embedded epilayers
KW - energy-dispersive X-ray spectrometry
KW - extracting compositions
KW - high-efficiency multijunction solar cells
KW - high-order Laue zone
KW - home-built system
KW - lattice-mismatched
KW - lattice-mismatched lll-V epilayers
KW - lattice-mismatched structures
KW - metalorganic chemical vapor deposition
KW - photovoltaic technology
KW - principal-component analysis
KW - standards-based method
KW - strain parameters
KW - structural transmission electron microscopy characterization
KW - thicknesses morphology
KW - zeta-factor approach
KW - Diffraction
KW - Gallium arsenide
KW - Lattices
KW - MOCVD
KW - Metals
KW - Principal component analysis
KW - Substrates
DO - 10.1109/PVSC.2011.6185990
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - CONF
TI - Rapid, enhanced IV characterization of multi-junction PV devices under one sun at NREL
T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
SP - 1
EP - 3
AU - T. Moriarty
AU - R. France
AU - M. Steiner
PY - 2015
KW - iterative methods
KW - optimisation
KW - solar cells
KW - IV characterization resources
KW - NREL
KW - device optimization
KW - enhanced IV characterization
KW - multijunction PV devices
KW - multijunction technology
KW - Buildings
KW - Junctions
KW - Shape measurement
KW - Spectral shape
KW - Sun
KW - Temperature distribution
KW - Temperature measurement
DO - 10.1109/PVSC.2015.7355845
JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Y1 - 14-19 June 2015
ER -
TY - CONF
TI - Visualization of wide area measurement information from the FNET system
T2 - 2011 IEEE Power and Energy Society General Meeting
SP - 1
EP - 8
AU - Y. Zhang
AU - L. Chen
AU - Y. Ye
AU - P. Markham
AU - J. Bank
AU - J. Dong
AU - Z. Yuan
AU - Z. Lin
AU - Y. Liu
PY - 2011
KW - angular measurement
KW - data visualisation
KW - frequency measurement
KW - phase measurement
KW - power engineering computing
KW - power system faults
KW - power system measurement
KW - voltage measurement
KW - FDR measurements
KW - FNET system
KW - advanced visualization tools
KW - animated event replay
KW - combined matrices
KW - computer techniques
KW - frequency information
KW - geographical information
KW - graphic formats
KW - modal oscillations
KW - oscillation mode analysis visualization
KW - phase angle information
KW - post-event analysis
KW - power system dynamic monitoring
KW - power system operation
KW - programming languages
KW - propagation effect visualization
KW - real-time visualization
KW - two-dimensional systems
KW - voltage magnitude
KW - wide area measurement information
KW - widely-distributed frequency disturbance recorders
KW - Data visualization
KW - Frequency measurement
KW - Oscillators
KW - Power system dynamics
KW - Real time systems
KW - Shape
KW - data visualization
KW - frequency disturbance recorder (FDR)
KW - frequency monitoring network (FNET)
KW - mode shape
KW - oscillation
KW - post event analysis
KW - realtime monitoring
DO - 10.1109/PES.2011.6039619
JO - 2011 IEEE Power and Energy Society General Meeting
IS -
SN - 1932-5517
VO -
VL -
JA - 2011 IEEE Power and Energy Society General Meeting
Y1 - 24-29 July 2011
ER -
TY - CONF
TI - Adhesion of antireflective coatings in multijunction photovoltaics
T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
SP - 0850
EP - 0853
AU - R. Brock
AU - D. C. Miller
AU - R. H. Dauskardt
PY - 2016
KW - adhesion
KW - antireflection coatings
KW - cantilevers
KW - germanium
KW - photovoltaic cells
KW - solar cells
KW - antireflective coating adhesion
KW - cDCB thin-film adhesion testing method
KW - composite dual cantilever beam
KW - damp heat
KW - fragile thin substrate
KW - germanium substrate
KW - interface chemistry
KW - interfacial adhesion
KW - morphology
KW - multijunction cell
KW - multijunction photovoltaics
KW - temperature 85 C
KW - Adhesives
KW - Aging
KW - Coatings
KW - Germanium
KW - Reliability
KW - Structural beams
KW - Substrates
KW - adhesion
KW - antireflective
KW - concentrator photovoltaic
KW - delamination
KW - durability
KW - multijunction cell
KW - reliability
DO - 10.1109/PVSC.2016.7749728
JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Y1 - 5-10 June 2016
ER -
TY - CONF
TI - Virtual Oscillator Control subsumes droop control
T2 - 2015 American Control Conference (ACC)
SP - 2353
EP - 2358
AU - M. Sinha
AU - F. Dörfler
AU - B. B. Johnson
AU - S. V. Dhople
PY - 2015
KW - distributed power generation
KW - invertors
KW - limit cycles
KW - nonlinear control systems
KW - oscillators
KW - reactive power control
KW - stability
KW - time-domain analysis
KW - voltage control
KW - VOC dynamics
KW - amplitude
KW - complex dynamics
KW - controlling inverter
KW - desired sinusoidal steady state
KW - globally stabilizing control strategy
KW - harmonic steady state
KW - higher-order harmonics
KW - islanded microgrid
KW - nonlinear Liénard-type oscillator
KW - nonlinear limit-cycle oscillator
KW - phase dynamics
KW - power-electronic inverter
KW - quasi-stationary sinusoidal steady state
KW - reactive power injection
KW - time-domain alternative
KW - time-domain control strategy
KW - ubiquitous droop control method
KW - virtual oscillator control
KW - voltage frequency
KW - Inverters
KW - Limit-cycles
KW - Nonlinear dynamical systems
KW - Oscillators
KW - Power system dynamics
KW - Steady-state
KW - Voltage control
DO - 10.1109/ACC.2015.7171084
JO - 2015 American Control Conference (ACC)
IS -
SN - 0743-1619
VO -
VL -
JA - 2015 American Control Conference (ACC)
Y1 - 1-3 July 2015
ER -
TY - CONF
TI - Optimizing carbon nanotube contacts for use in organic photovoltaics
T2 - 2008 33rd IEEE Photovoltaic Specialists Conference
SP - 1
EP - 5
AU - T. M. Barnes
AU - J. L. Blackburn
AU - R. C. Tenent
AU - A. Morfa
AU - M. Heben
AU - T. J. Coutts
PY - 2008
KW - Carbon nanotubes
KW - Contacts
KW - Costs
KW - Flexible manufacturing systems
KW - Morphology
KW - Optical devices
KW - Optical fiber networks
KW - Optical films
KW - Photovoltaic cells
KW - Thin film devices
DO - 10.1109/PVSC.2008.4922486
JO - 2008 33rd IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2008 33rd IEEE Photovoltaic Specialists Conference
Y1 - 11-16 May 2008
ER -
TY - CONF
TI - An Evaluation of 27+ Years Old Photovoltaic Modules Operated in a Hot-Desert Climatic Condition
T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
SP - 2145
EP - 2147
AU - Y. Tang
AU - B. Raghuraman
AU - J. Kuitche
AU - G. TamizhMani
AU - C. E. Backus
AU - C. Osterwald
PY - 2006
KW - environmental factors
KW - failure analysis
KW - life testing
KW - solar cells
KW - -40 C
KW - 1000 hours
KW - 85 C
KW - 90 C
KW - average power degradation
KW - damp-heat
KW - encapsulant
KW - failure mechanism identification
KW - fiberglass-like substrate
KW - hot-desert climatic condition
KW - hot-spot stress tests
KW - long-term field deployed modules
KW - monoSi cells
KW - neoprene cable
KW - photovoltaic modules
KW - potted junction box
KW - silicone rubber superstrate
KW - thermal cycling test
KW - water pumping array
KW - Failure analysis
KW - IEC standards
KW - Laboratories
KW - Manufacturing
KW - Optical fiber cables
KW - Photovoltaic systems
KW - Qualifications
KW - Solar power generation
KW - Testing
KW - Thermal stresses
DO - 10.1109/WCPEC.2006.279929
JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
IS -
SN - 0160-8371
VO - 2
VL - 2
JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
Y1 - 7-12 May 2006
ER -
TY - CONF
TI - Acceleration factor determination for potential-induced degradation in crystalline silicon PV modules
T2 - 2013 IEEE International Reliability Physics Symposium (IRPS)
SP - 4B.1.1
EP - 4B.1.5
AU - P. Hacke
AU - R. Smith
AU - K. Terwilliger
AU - S. Glick
AU - D. Jordan
AU - S. Johnston
AU - M. Kempe
AU - S. Kurtz
PY - 2013
KW - elemental semiconductors
KW - failure analysis
KW - life testing
KW - probability
KW - silicon
KW - sodium
KW - solar cells
KW - statistical analysis
KW - Si
KW - accelerated lifetime test data
KW - acceleration factor determination
KW - chamber testing
KW - constant relative humidity
KW - crystalline silicon PV modules
KW - dark I-V measurements
KW - electron volt energy 0.73 eV
KW - environmental chamber
KW - failure mechanism
KW - initial module power
KW - lognormal analysis
KW - module failure probability
KW - module power in-situ estimation
KW - negative-voltage arrays
KW - p-type silicon-based photovoltaic solar cell modules
KW - potential-induced degradation
KW - statistical data
KW - Acceleration
KW - Degradation
KW - Life estimation
KW - Photovoltaic systems
KW - Stress
KW - Temperature measurement
KW - Testing
KW - Current-voltage characteristics
KW - Degradation
KW - High-voltage techniques
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Reliability
DO - 10.1109/IRPS.2013.6532009
JO - 2013 IEEE International Reliability Physics Symposium (IRPS)
IS -
SN - 1541-7026
VO -
VL -
JA - 2013 IEEE International Reliability Physics Symposium (IRPS)
Y1 - 14-18 April 2013
ER -
TY - CONF
TI - Thermal treatment improvement of CuSbS2 absorbers
T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
SP - 1
EP - 5
AU - F. W. de Souza Lucas
AU - A. W. Welch
AU - L. L. Baranowski
AU - P. C. Dippo
AU - L. H. Mascaro
AU - A. Zakutayev
PY - 2015
KW - antimony compounds
KW - copper compounds
KW - etching
KW - grain size
KW - oxygen compounds
KW - photoconductivity
KW - photoluminescence
KW - potassium compounds
KW - solar absorber-convertors
KW - solar cells
KW - thin films
KW - CuSbS2
KW - KOH
KW - Sb2S3
KW - chemical etching
KW - crystallographic texture
KW - earth-abundant absorber
KW - grain size
KW - photoconductivity
KW - photoluminescence intensity
KW - photovoltaic performance
KW - surface layer
KW - thermal treatment
KW - thin films
KW - Optical diffraction
KW - Optical films
KW - Optical imaging
KW - Optical reflection
KW - Performance evaluation
KW - X-ray scattering
KW - CuSbS2
KW - Sb2S3 selective chemical etch
KW - annealing
KW - non-toxic and earth-abundant absorber
DO - 10.1109/PVSC.2015.7355898
JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Y1 - 14-19 June 2015
ER -
TY - CONF
TI - Comparison of Cu2SnS3 and CuSbS2 as potential solar cell absorbers
T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
SP - 2436
EP - 2438
AU - A. Zakutayev
AU - L. L. Baranowski
AU - A. W. Welch
AU - C. A. Wolden
AU - E. S. Toberer
PY - 2014
KW - antimony compounds
KW - copper compounds
KW - semiconductor thin films
KW - solar absorber-convertors
KW - solar cells
KW - ternary semiconductors
KW - thin film devices
KW - tin compounds
KW - CZTS performance
KW - Cu2SnS3
KW - CuSbS2
KW - chemical complexity
KW - composition stability ranges
KW - earth-abundant chalcogenide thin-film solar cells
KW - electrical transport properties
KW - high-throughput combinatorial approach
KW - layered structure
KW - optical absorption
KW - phase stability range
KW - photovoltaic field
KW - potential solar cell absorbers
KW - ternary copper chalcogenides
KW - Absorption
KW - Chemicals
KW - Conductivity
KW - Materials
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - combinatorial sputtering
KW - solar cell absorber
KW - ternary copper metal sulfide
DO - 10.1109/PVSC.2014.6925421
JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Y1 - 8-13 June 2014
ER -
TY - CONF
TI - Impacts of short-term solar power forecasts in system operations
T2 - 2016 IEEE/PES Transmission and Distribution Conference and Exposition (T&D)
SP - 1
EP - 5
AU - E. Ibanez
AU - I. Krad
AU - B. M. Hodge
AU - E. Ela
PY - 2016
KW - load forecasting
KW - photovoltaic power systems
KW - power generation economics
KW - power generation reliability
KW - intraday operations
KW - short-term forecasting strategies
KW - short-term solar power forecasts
KW - solar PV forecasting method
KW - system operations
KW - Clouds
KW - Forecasting
KW - Mathematical model
KW - Power system reliability
KW - Reliability
KW - Wind forecasting
KW - Forecasting
KW - Security Constrained Economic Dispatch (SCED)
KW - Security Constrained Unit Commitment (SCUC)
KW - Solar power generation
KW - power system economics
KW - power system reliability
DO - 10.1109/TDC.2016.7519885
JO - 2016 IEEE/PES Transmission and Distribution Conference and Exposition (T&D)
IS -
SN -
VO -
VL -
JA - 2016 IEEE/PES Transmission and Distribution Conference and Exposition (T&D)
Y1 - 3-5 May 2016
ER -
TY - CONF
TI - A comparative study of the defect point physics and luminescence of the kesterites Cu2ZnSnS4 and Cu2ZnSnSe4 and chalcopyrite Cu(In,Ga)Se2
T2 - 2012 38th IEEE Photovoltaic Specialists Conference
SP - 003349
EP - 003353
AU - M. J. Romero
AU - I. Repins
AU - G. Teeter
AU - M. A. Contreras
AU - M. Al-Jassim
AU - R. Noufi
PY - 2012
KW - II-VI semiconductors
KW - cathodoluminescence
KW - chemical potential
KW - copper compounds
KW - electrostatics
KW - gallium compounds
KW - grain boundaries
KW - indium compounds
KW - solar cells
KW - ternary semiconductors
KW - tin compounds
KW - zinc compounds
KW - Cu2ZnSnS4
KW - Cu2ZnSnSe4
KW - CuInGaSe2
KW - cathodoluminescence
KW - chalcopyrite
KW - chemical potentials
KW - defect point physics
KW - electronic properties
KW - electrostatic
KW - grain boundary
KW - kesterite-based solar cells
KW - luminescence spectroscopy
KW - Electric potential
KW - Fluctuations
KW - Grain boundaries
KW - Luminescence
KW - Photovoltaic cells
KW - Spectroscopy
KW - Temperature measurement
KW - cathodoluminescence
KW - chalcopyrite
KW - kesterite
KW - thin film
DO - 10.1109/PVSC.2012.6318290
JO - 2012 38th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2012 38th IEEE Photovoltaic Specialists Conference
Y1 - 3-8 June 2012
ER -
TY - CONF
TI - Single crystal growth and phase stability of photovoltaic grade ZnSiP2 by flux technique
T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
SP - 1
EP - 5
AU - A. D. Martinez
AU - E. L. Warren
AU - P. C. Dippo
AU - D. Kuciauskas
AU - B. R. Ortiz
AU - H. Guthrey
AU - A. Duda
AU - A. G. Norman
AU - E. S. Toberer
AU - A. C. Tamboli
PY - 2015
KW - crystal growth
KW - optoelectronic devices
KW - solar cells
KW - zinc compounds
KW - ZnSiP2
KW - flux growth technique
KW - flux technique
KW - optoelectronic material
KW - phase stability
KW - photovoltaic grade
KW - photovoltaic material
KW - single crystal growth
KW - Crystals
KW - Epitaxial growth
KW - Heating
KW - Photovoltaic systems
KW - Silicon
KW - Zinc
KW - ZnSiP2
KW - photovoltaic cells
KW - silicon
KW - single crystal growth
KW - tandem photovoltaics
DO - 10.1109/PVSC.2015.7355697
JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Y1 - 14-19 June 2015
ER -
TY - CONF
TI - Degradation in PV encapsulant strength of attachment: An interlaboratory study towards a climate-specific test
T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
SP - 0095
EP - 0100
AU - D. C. Miller
AU - E. Annigoni
AU - A. Ballion
AU - J. G. Bokria
AU - L. S. Bruckman
AU - D. M. Burns
AU - X. Chen
AU - J. Feng
AU - R. H. French
AU - S. Fowler
AU - C. C. Honeker
AU - M. D. Kempe
AU - H. Khonkar
AU - M. Köhl
AU - L. E. Perret-Aebi
AU - N. H. Phillips
AU - K. P. Scott
AU - F. Sculati-Meillaud
AU - J. H. Wohlgemuth
PY - 2016
KW - compressive strength
KW - electron microscopy
KW - life testing
KW - optical images
KW - shear strength
KW - solar cells
KW - EVA formulation
KW - PV components
KW - PV encapsulant strength of attachment
KW - UV light source
KW - accelerated aging tests
KW - compressive shear test
KW - electron microscopy
KW - environmental stress
KW - mechanical load-frame
KW - optical imaging
KW - poly(ethylene-co-vinyl acetate)
KW - shear strain
KW - shear strength
KW - toughness
KW - Adhesives
KW - Aging
KW - Glass
KW - IEC Standards
KW - Strain
KW - Temperature measurement
KW - Xenon
KW - Xenon
KW - durability
KW - reliability
DO - 10.1109/PVSC.2016.7749556
JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Y1 - 5-10 June 2016
ER -
TY - CONF
TI - Optimization of organic photovoltaic devices using tuned mixed metal oxide contact layers
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 000102
EP - 000104
AU - K. X. Steirer
AU - N. E. Widjonarko
AU - A. K. Sigdel
AU - M. T. Lloyd
AU - D. S. Ginley
AU - D. C. Olson
AU - J. J. Berry
PY - 2010
KW - nickel compounds
KW - optimisation
KW - pulsed laser deposition
KW - solar cells
KW - sputtering
KW - NiOx
KW - bulk heterojunction device
KW - highest occupied molecular orbital level
KW - hole collection
KW - hole transport layers
KW - optimization
KW - organic photovoltaic device
KW - oxide materials
KW - pulsed laser deposition
KW - solution precursor
KW - sputtering
KW - tuned mixed metal oxide contact layers
KW - Electrodes
KW - Heterojunctions
KW - Materials
KW - Performance evaluation
KW - Photovoltaic systems
KW - Plasmas
DO - 10.1109/PVSC.2010.5614501
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - Beneficial effects of sodium on CuIn1-XGaXS2 thin film solar cells
T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
SP - 001098
EP - 001101
AU - A. Kaul
AU - P. Vasekar
AU - N. G. Dhere
AU - H. Moutinho
PY - 2009
KW - carrier density
KW - copper compounds
KW - gallium compounds
KW - indium compounds
KW - semiconductor thin films
KW - sodium
KW - solar cells
KW - ternary semiconductors
KW - thin film devices
KW - CuIn1-xGaxS2-Na
KW - chalcopyrites
KW - film morphology
KW - free carrier concentration
KW - microstructure
KW - solar cells
KW - sulfurization
KW - thin films
KW - Absorption
KW - Copper
KW - Etching
KW - Gallium compounds
KW - Indium
KW - Microstructure
KW - Morphology
KW - Photonic band gap
KW - Photovoltaic cells
KW - Transistors
DO - 10.1109/PVSC.2009.5411211
JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Y1 - 7-12 June 2009
ER -
TY - CONF
TI - Characterization of laser edge isolation in multicrystalline silicon solar cells
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 001721
EP - 001726
AU - C. S. Jiang
AU - H. R. Moutinho
AU - S. Johnston
AU - Y. Yan
AU - M. M. Al-Jassim
AU - J. Gorman
AU - A. Blosse
PY - 2010
KW - atomic force microscopy
KW - electron backscattering
KW - failure analysis
KW - laser ablation
KW - scanning electron microscopy
KW - silicon
KW - solar cells
KW - SEM
KW - Si
KW - ablated material
KW - conductive atomic force microscopy
KW - electron backscattering diffraction
KW - emitter dopant
KW - failure analysis
KW - laser ablation
KW - laser edge isolation
KW - laser groove
KW - lock-in thermography
KW - microscopic electrical tools
KW - molten material
KW - morphological tools
KW - multicrystalline solar cells
KW - polycrystalline stripes
KW - scanning capacitance microscopy
KW - scanning electron microscopy
KW - structural tools
DO - 10.1109/PVSC.2010.5616118
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - An assessment of the impact of stochastic day-ahead SCUC on economic and reliability metrics at multiple timescales
T2 - 2015 IEEE Power & Energy Society General Meeting
SP - 1
EP - 5
AU - H. Wu
AU - E. Ela
AU - I. Krad
AU - A. Florita
AU - J. Zhang
AU - B. M. Hodge
AU - E. Ibanez
AU - Wenzhong Gao
PY - 2015
KW - optimisation
KW - power generation control
KW - power generation dispatch
KW - power generation economics
KW - power generation reliability
KW - power generation scheduling
KW - power system security
KW - solar power stations
KW - stochastic processes
KW - wind power plants
KW - RTS-96 system
KW - automatic generation control
KW - economic metrics
KW - multitimescale multischeduling application
KW - progressive hedging algorithm
KW - reliability metrics
KW - stochastic DASCUC
KW - stochastic day-ahead security-constrained unit commitment
KW - Automatic generation control
KW - Load modeling
KW - Optimization
KW - Production
KW - Reliability
KW - Stochastic processes
KW - Uncertainty
KW - Area control error
KW - multiple timescales
KW - progressive hedging
KW - security-constrained unit commitment
KW - stochastic optimization
DO - 10.1109/PESGM.2015.7286542
JO - 2015 IEEE Power & Energy Society General Meeting
IS -
SN - 1932-5517
VO -
VL -
JA - 2015 IEEE Power & Energy Society General Meeting
Y1 - 26-30 July 2015
ER -
TY - CONF
TI - Investigation of thermal interface materials using phase-sensitive transient thermoreflectance technique
T2 - Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
SP - 1296
EP - 1307
AU - X. Feng
AU - C. King
AU - D. DeVoto
AU - M. Mihalic
AU - S. Narumanchi
PY - 2014
KW - adhesives
KW - diffusion bonding
KW - greases
KW - plastic packaging
KW - thermal management (packaging)
KW - bulk thermal conductivity
KW - contact resistance
KW - diffusion bonded interface
KW - electronics modules
KW - electronics packages
KW - grease material
KW - heat removal
KW - multilayer heat conduction model
KW - phase sensitive transient thermoreflectance technique
KW - power electronics application
KW - thermal interface material
KW - thermal management
KW - thermal resistances
KW - thermoplastic adhesives
KW - Electronic packaging thermal management
KW - Heating
KW - Laser excitation
KW - Materials
KW - Pump lasers
KW - Thermal conductivity
KW - Thermal resistance
KW - Thermal interface materials
KW - bulk thermal conductivity
KW - contact resistance
KW - phase-sensitive transient thremoreflectance
KW - thermophysical properties
DO - 10.1109/ITHERM.2014.6892430
JO - Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
IS -
SN - 1087-9870
VO -
VL -
JA - Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
Y1 - 27-30 May 2014
ER -
TY - CONF
TI - Independent blade pitch controller design for a three-bladed turbine using disturbance accommodating control
T2 - 2016 American Control Conference (ACC)
SP - 2301
EP - 2306
AU - N. Wang
AU - A. D. Wright
AU - K. E. Johnson
PY - 2016
KW - blades
KW - control system synthesis
KW - pitch control (position)
KW - velocity control
KW - wind turbines
KW - DAC-based IPCs
KW - Kronecker product
KW - MBC transformed turbine model
KW - TSA turbine model
KW - above-rated wind speed
KW - actuator dynamics
KW - actuator phase delay
KW - asymmetrical linear shear component
KW - blade root flapwise bending loads
KW - collective horizontal component
KW - disturbance accommodating control
KW - independent blade pitch controller design
KW - multiblade coordinate transformed turbine model
KW - once-per-revolution load reductions
KW - rotor speed regulation
KW - step waveform disturbance
KW - three-bladed controls advanced research turbine
KW - three-bladed turbine
KW - transformed symmetrical-asymmetrical turbine model
KW - twice-per-revolution load reductions
KW - vertical shear component
KW - wind disturbances
KW - Blades
KW - Load modeling
KW - Mathematical model
KW - Rotors
KW - Wind speed
KW - Wind turbines
DO - 10.1109/ACC.2016.7525261
JO - 2016 American Control Conference (ACC)
IS -
SN -
VO -
VL -
JA - 2016 American Control Conference (ACC)
Y1 - 6-8 July 2016
ER -
TY - CONF
TI - Ion implanted passivated contacts for interdigitated back contacted solar cells
T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
SP - 1
EP - 5
AU - D. L. Young
AU - W. Nemeth
AU - V. LaSalvia
AU - R. Reedy
AU - N. Bateman
AU - P. Stradins
PY - 2015
KW - annealing
KW - electrical resistivity
KW - electron-hole recombination
KW - ion implantation
KW - passivation
KW - solar cells
KW - tunnelling
KW - Sinton lifetime tester
KW - TLM patterns
KW - contact resistivity
KW - electron passivated contact
KW - hole passivated contact
KW - interdigitated back contacted solar cell
KW - ion implantation
KW - ion implanted amorphous silicon film
KW - ion implanted passivated contact
KW - n-type CZ wafer
KW - n-type contact
KW - p-type contact
KW - passivated contacts
KW - passivation quality improvement
KW - post-implant anneal
KW - recombination parameter
KW - tunneling SiO2
KW - Annealing
KW - Films
KW - Implants
KW - Passivation
KW - Silicon
KW - Temperature measurement
KW - Transmission line measurements
KW - Contacts
KW - ion implantation
KW - photovoltaic cells
KW - silicon
DO - 10.1109/PVSC.2015.7356141
JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Y1 - 14-19 June 2015
ER -
TY - CONF
TI - Cross-Sectional Conductive Atomic Force Microscopy of CdTe/CdS Solar Cells: Effects of Etching and Back-Contact Processes
T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
SP - 404
EP - 407
AU - H. R. Moutinho
AU - R. G. Dhere
AU - C. s. Jiang
AU - T. Gessert
AU - A. Duda
AU - M. Young
AU - W. K. Metzger
AU - X. Li
AU - M. m. Al-Jassim
PY - 2006
KW - II-VI semiconductors
KW - atomic force microscopy
KW - cadmium compounds
KW - copper
KW - diffusion
KW - electrical conductivity
KW - etching
KW - grain boundaries
KW - ohmic contacts
KW - semiconductor thin films
KW - solar cells
KW - AFM
KW - CdTe surface
KW - CdTe-CdS
KW - Cu
KW - Cu diffusion
KW - Cu thin layer
KW - back-contact process
KW - bromine solutions
KW - bulk electrical conductivity
KW - cross-sectional conductive atomic force microscopy
KW - current transport
KW - etching process
KW - grain boundaries
KW - inhomogeneous conductive layer
KW - nitric-phosphoric acid solutions
KW - solar cells
KW - Atomic force microscopy
KW - Chemicals
KW - Conductive films
KW - Conductivity
KW - Copper
KW - Etching
KW - Grain boundaries
KW - Photovoltaic cells
KW - Surface topography
KW - Voltage
DO - 10.1109/WCPEC.2006.279475
JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
IS -
SN - 0160-8371
VO - 1
VL - 1
JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
Y1 - May 2006
ER -
TY - JOUR
TI - Device Physics of Heteroepitaxial Film c-Si Heterojunction Solar Cells
T2 - IEEE Journal of Photovoltaics
SP - 230
EP - 235
AU - S. Grover
AU - C. W. Teplin
AU - J. V. Li
AU - D. C. Bobela
AU - J. Bornstein
AU - P. Schroeter
AU - S. Johnston
AU - H. Guthrey
AU - P. Stradins
AU - H. M. Branz
AU - D. L. Young
PY - 2013
KW - chemical vapour deposition
KW - dislocations
KW - passivation
KW - semiconductor thin films
KW - silicon
KW - solar cells
KW - Si
KW - device physics
KW - heteroepitaxial absorber
KW - heteroepitaxial film
KW - heteroepitaxy induced dislocation
KW - heterojunction solar cell
KW - homoepitaxial absorber
KW - hot wire chemical vapor deposition
KW - hydrogen passivation
KW - ideality factor
KW - inversion layer
KW - recombination
KW - single crystal silicon film
KW - Heterojunctions
KW - Passivation
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Radiative recombination
KW - Silicon
KW - Charge recombination
KW - diode ideality factor
KW - heteroepitaxial silicon
KW - open-circuit voltage
KW - photovoltaic (PV) cells
KW - quantum efficiency (QE)
DO - 10.1109/JPHOTOV.2012.2223455
JO - IEEE Journal of Photovoltaics
IS - 1
SN - 2156-3381
VO - 3
VL - 3
JA - IEEE Journal of Photovoltaics
Y1 - Jan. 2013
ER -
TY - JOUR
TI - Interface Characterization of Single-Crystal CdTe Solar Cells With VOC > 950 mV
T2 - IEEE Journal of Photovoltaics
SP - 1650
EP - 1653
AU - J. M. Burst
AU - J. N. Duenow
AU - A. Kanevce
AU - H. R. Moutinho
AU - C. S. Jiang
AU - M. M. Al-Jassim
AU - M. O. Reese
AU - D. S. Albin
AU - J. A. Aguiar
AU - E. Colegrove
AU - T. Ablekim
AU - S. K. Swain
AU - K. G. Lynn
AU - D. Kuciauskas
AU - T. M. Barnes
AU - W. K. Metzger
PY - 2016
KW - II-VI semiconductors
KW - cadmium compounds
KW - carrier lifetime
KW - hole density
KW - solar cells
KW - CdTe
KW - carrier lifetime
KW - hole density
KW - interface characterization
KW - interface recombination velocity
KW - open circuit voltage
KW - single crystal solar cells
KW - solar cell efficiency
KW - voltage 950 mV
KW - Cadmium compounds
KW - Copper compounds
KW - Microstructure
KW - Photovoltaic cells
KW - CIGS and CdTe thin-film solar cells
KW - Characterization of defects in photovoltaic (PV)
KW - microstructure
DO - 10.1109/JPHOTOV.2016.2598274
JO - IEEE Journal of Photovoltaics
IS - 6
SN - 2156-3381
VO - 6
VL - 6
JA - IEEE Journal of Photovoltaics
Y1 - Nov. 2016
ER -
TY - CONF
TI - A comparative study of DC and AC microgrids in commercial buildings across different climates and operating profiles
T2 - 2015 IEEE First International Conference on DC Microgrids (ICDCM)
SP - 159
EP - 164
AU - D. Fregosi
AU - S. Ravula
AU - D. Brhlik
AU - J. Saussele
AU - S. Frank
AU - E. Bonnema
AU - J. Scheib
AU - E. Wilson
PY - 2015
KW - building management systems
KW - cost reduction
KW - distributed power generation
KW - energy conservation
KW - power generation reliability
KW - redundancy
KW - solar cells
KW - AC microgrid system
KW - Bosch DC microgrid system reliability
KW - United State
KW - alternating current microgrid system
KW - commercial building
KW - cost reduction
KW - direct current microgrid system
KW - energy saving estimation
KW - photovoltaic energy efficiency maximizes
KW - redundancy
KW - Analytical models
KW - Buildings
KW - Light emitting diodes
KW - Lighting
KW - Load modeling
KW - Logic gates
KW - Mathematical model
KW - DC microgrid
KW - LED
KW - PV
KW - energy efficiency
DO - 10.1109/ICDCM.2015.7152031
JO - 2015 IEEE First International Conference on DC Microgrids (ICDCM)
IS -
SN -
VO -
VL -
JA - 2015 IEEE First International Conference on DC Microgrids (ICDCM)
Y1 - 7-10 June 2015
ER -
TY - CONF
TI - Indium zinc oxide mediated wafer bonding for III???V/Si tandem solar cells
T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
SP - 1
EP - 5
AU - A. C. Tamboli
AU - S. Essig
AU - K. A. W. Horowitz
AU - M. Woodhouse
AU - M. F. A. M. van Hest
AU - A. G. Norman
AU - M. A. Steiner
AU - P. Stradins
PY - 2015
KW - III-V semiconductors
KW - amorphous semiconductors
KW - elemental semiconductors
KW - indium
KW - silicon
KW - solar cells
KW - zinc compounds
KW - III-V tandem solar cell
KW - Si tandem solar cell
KW - ZnO:In-Si
KW - amorphous indium zinc oxide mediated wafer bonding
KW - electrical properties
KW - heavily doped III-V contact layer
KW - low concentration photovoltaics
KW - low concentration single axis tracking system
KW - low-cost III-V growth
KW - material smoothness
KW - optical properties
KW - sun
KW - Absorption
KW - Gallium arsenide
KW - Optical losses
KW - Photonic band gap
KW - Silicon
KW - Substrates
KW - Wafer bonding
KW - III???V semiconductor materials
KW - photovoltaic cells
KW - silicon
KW - wafer bonding
DO - 10.1109/PVSC.2015.7356233
JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Y1 - 14-19 June 2015
ER -
TY - CONF
TI - Partial shade evaluation of distributed power electronics for photovoltaic systems
T2 - 2012 38th IEEE Photovoltaic Specialists Conference
SP - 001627
EP - 001632
AU - C. Deline
AU - J. Meydbray
AU - M. Donovan
AU - J. Forrest
PY - 2012
KW - building integrated photovoltaics
KW - invertors
KW - power electronics
KW - solar cell arrays
KW - distributed power electronics
KW - microinverters
KW - partial shade evaluation
KW - photovoltaic installations
KW - photovoltaic systems
KW - power 8 kW
KW - shading test
KW - Histograms
KW - Inverters
KW - Loss measurement
KW - Performance evaluation
KW - Photovoltaic systems
KW - Power measurement
KW - DC-DC power converters
KW - microinverters
KW - mismatch
KW - partial shading
KW - photovoltaic systems
DO - 10.1109/PVSC.2012.6317908
JO - 2012 38th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2012 38th IEEE Photovoltaic Specialists Conference
Y1 - 3-8 June 2012
ER -
TY - CONF
TI - Cogging torque minimization in transverse flux machines
T2 - 2016 IEEE Energy Conversion Congress and Exposition (ECCE)
SP - 1
EP - 8
AU - T. Husain
AU - I. Hasan
AU - Y. Sozer
AU - I. Husain
AU - E. Muljadi
PY - 2016
KW - Taguchi methods
KW - design of experiments
KW - ferrites
KW - finite element analysis
KW - minimisation
KW - permanent magnet machines
KW - rotors
KW - stators
KW - torque
KW - PM machine
KW - Taguchi method
KW - cogging torque minimization
KW - design of experiments
KW - double stator-single rotor configuration
KW - e-core stator
KW - finite element analysis
KW - flux concentrating ferrite magnets
KW - pole windings
KW - quasiU-shaped stator cores
KW - ring winding
KW - stator back iron
KW - three-level DOE
KW - transverse flux machines
KW - Forging
KW - Magnetic flux
KW - Rotors
KW - Stator cores
KW - Stator windings
KW - Torque
KW - PM machine
KW - cogging torque reduction
KW - design of experiment
KW - optimization
KW - review
KW - transverse flux machine
DO - 10.1109/ECCE.2016.7854923
JO - 2016 IEEE Energy Conversion Congress and Exposition (ECCE)
IS -
SN -
VO -
VL -
JA - 2016 IEEE Energy Conversion Congress and Exposition (ECCE)
Y1 - 18-22 Sept. 2016
ER -
TY - CONF
TI - Nanometer-scale study of resistance on CdTe solar cell devices
T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
SP - 0090
EP - 0094
AU - H. Li
AU - C. S. Jiang
AU - W. Metzger
AU - C. K. Shih
AU - M. Al-Jassim
PY - 2014
KW - atomic force microscopy
KW - cadmium compounds
KW - electric resistance measurement
KW - semiconductor doping
KW - solar cells
KW - thermal analysis
KW - CdS-CdTe
KW - atomic force microscope laser illumination
KW - carrier depletion
KW - carrier injection
KW - deep depletion region
KW - doping
KW - forward bias voltage
KW - nanometer-resolution resistance mapping
KW - photo-excited carriers
KW - scanning spreading resistance microscopy
KW - solar cell devices
KW - thermoequilibrium state
KW - Electrical resistance measurement
KW - Force
KW - Junctions
KW - Measurement by laser beam
KW - Photovoltaic cells
KW - Probes
KW - Resistance
KW - characterization
KW - micro-electrical property
KW - scanning probe microscopy
KW - thin-film PV
DO - 10.1109/PVSC.2014.6925267
JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Y1 - 8-13 June 2014
ER -
TY - CONF
TI - Polycrystalline CdTe solar cells on buffered commercial TCO-coated glass with efficiencies above 15%
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 003410
EP - 003414
AU - R. Banai
AU - C. Blissett
AU - C. Buurma
AU - E. Colegrove
AU - P. Bechmann
AU - J. Ellsworth
AU - M. Morley
AU - S. Barnes
AU - C. Lennon
AU - C. Gilmore
AU - R. Dhere
AU - J. Bergeson
AU - M. Scott
AU - T. Gessert
PY - 2011
KW - buffer layers
KW - cadmium compounds
KW - current density
KW - electrical resistivity
KW - high-temperature techniques
KW - optimisation
KW - power semiconductor devices
KW - semiconductor thin films
KW - short-circuit currents
KW - solar cells
KW - thin film devices
KW - CdTe
KW - EPIR cells
KW - NREL
KW - National Renewable Energy Laboratory-verified efficiencies
KW - SnO2-CdS
KW - buffered commercial TCO-coated glass
KW - commercially-available conductive glass
KW - high resistivity buffer layer
KW - high-efficiency polycrystalline CdTe solar cells
KW - high-temperature technical glass
KW - robust process
KW - short-circuit current densities
KW - thin film polycrystalline CdTe devices
KW - transparent conducting oxide-coated glass
KW - window layer thickness optimization
KW - Absorption
KW - Buffer layers
KW - Glass
KW - Junctions
KW - Performance evaluation
KW - Photovoltaic cells
KW - Production
DO - 10.1109/PVSC.2011.6186679
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - CONF
TI - Plasma immersion ion implantation for interdigitated back passivated contact (IBPC) solar cells
T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
SP - 0225
EP - 0229
AU - D. L. Young
AU - W. Nemeth
AU - V. LaSalvia
AU - M. R. Page
AU - S. Theingi
AU - M. Young
AU - J. Aguiar
AU - B. G. Lee
AU - P. Stradins
PY - 2016
KW - passivation
KW - plasma immersion ion implantation
KW - semiconductor doping
KW - solar cells
KW - PH3 PIII doping
KW - high-dose low-energy implantation
KW - interdigitated back passivated contact solar cell
KW - low-cost IBPC solar cell
KW - low-cost interdigitated back contact solar cell
KW - plasma immersion ion implantation
KW - Annealing
KW - Doping
KW - Implants
KW - Ions
KW - Particle beams
KW - Photovoltaic cells
KW - Plasmas
KW - Silicon
KW - ion implantation
KW - passivated contacts
KW - photovoltaic cells
KW - plasma
DO - 10.1109/PVSC.2016.7749583
JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Y1 - 5-10 June 2016
ER -
TY - CONF
TI - Direct-write contacts: Metallization and contact formation
T2 - 2008 33rd IEEE Photovoltaic Specialists Conference
SP - 1
EP - 3
AU - M. F. A. M. van Hest
AU - C. J. Curtis
AU - A. Miedaner
AU - R. M. Pasquarelli
AU - T. Kaydanova
AU - P. Hersh
AU - D. S. Ginley
PY - 2008
KW - Conducting materials
KW - Conductive films
KW - Conductivity
KW - Costs
KW - Ink
KW - Inorganic materials
KW - Metallization
KW - Photovoltaic cells
KW - Printing
KW - Spraying
DO - 10.1109/PVSC.2008.4922798
JO - 2008 33rd IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2008 33rd IEEE Photovoltaic Specialists Conference
Y1 - 11-16 May 2008
ER -
TY - CONF
TI - Imaging interfacial layers and internal fields in nanocrystalline junctions
T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
SP - 3498
EP - 3501
AU - R. Ihly
AU - S. U. Nanayakkara
AU - J. Gao
AU - Jianbing Zhang
AU - M. Law
AU - J. M. Luther
PY - 2014
KW - II-VI semiconductors
KW - IV-VI semiconductors
KW - aluminium
KW - atomic force microscopy
KW - colloidal crystals
KW - contact potential
KW - lead compounds
KW - nanostructured materials
KW - semiconductor heterojunctions
KW - semiconductor quantum dots
KW - solar cells
KW - wide band gap semiconductors
KW - zinc compounds
KW - Al-PbS-ZnO
KW - SKPM
KW - atomic force microscopy
KW - colloidal quantum dot solar cell
KW - conductive AFM tip
KW - contact potential
KW - electron-hole pairs
KW - external quantum efficiencies
KW - interfacial layers
KW - internal fields
KW - isolated nanostructures
KW - localized band bending
KW - multiple exciton generation
KW - nanocrystalline junctions
KW - p-n heterojunction
KW - photovoltaic devices
KW - power conversion efficiency
KW - scanning Kelvin probe microscopy
KW - solar spectrum
KW - space charge
KW - Electric potential
KW - Films
KW - Microscopy
KW - Nanocrystals
KW - Photovoltaic cells
KW - Quantum dots
KW - Spatial resolution
KW - Kelvin probe
KW - PbS
KW - PbSe
KW - atomic force microscopy
KW - carrier multiplication
KW - heterostructures
KW - multiple exciton generation
KW - quantum dot solar cells
DO - 10.1109/PVSC.2014.6925686
JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Y1 - 8-13 June 2014
ER -
TY - CONF
TI - Testing and analysis for lifetime prediction of crystalline silicon PV modules undergoing degradation by system voltage stress
T2 - 2012 38th IEEE Photovoltaic Specialists Conference
SP - 001750
EP - 001755
AU - P. Hacke
AU - R. Smith
AU - K. Terwilliger
AU - S. Glick
AU - D. Jordan
AU - S. Johnston
AU - M. Kempe
AU - S. Kurtz
PY - 2012
KW - elemental semiconductors
KW - failure analysis
KW - life testing
KW - silicon
KW - solar cells
KW - statistical analysis
KW - Si
KW - accelerated lifetime test data
KW - accelerated testing
KW - acceleration factors
KW - crystalline silicon photovoltaic modules
KW - lifetime prediction
KW - lognormal analysis
KW - potential-induced degradation
KW - recombination current
KW - statistical data
KW - system voltage stress degradation
KW - two-diode model analysis
KW - Acceleration
KW - Degradation
KW - Life estimation
KW - Resistance
KW - Stress
KW - Temperature measurement
KW - Testing
KW - Current-voltage characteristics
KW - Degradation
KW - High-voltage techniques
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Reliability
DO - 10.1109/PVSC.2012.6317933
JO - 2012 38th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2012 38th IEEE Photovoltaic Specialists Conference
Y1 - 3-8 June 2012
ER -
TY - CONF
TI - Impact of buffer and absorber properties in the vicinity of the interface on wide-gap Cu(In,Ga)Se2 solar cell performance
T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
SP - 0382
EP - 0386
AU - A. Kanevce
AU - K. Ramanathan
AU - M. Contreras
PY - 2014
KW - copper compounds
KW - indium compounds
KW - inversion layers
KW - solar cells
KW - ternary semiconductors
KW - CIGS
KW - Cu(In-Ga)Se2
KW - absorber material property
KW - absorber-buffer interface
KW - defective heterointerface
KW - doping
KW - electron volt energy 1.15 eV
KW - interface recombination
KW - nonideal band alignment
KW - recombination loss
KW - solar cell
KW - Buffer layers
KW - Charge carrier density
KW - Doping
KW - Performance evaluation
KW - Photonic band gap
KW - Photovoltaic cells
KW - Standards
KW - CIGS
KW - interface recombination
KW - numerical modeling
DO - 10.1109/PVSC.2014.6924938
JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Y1 - 8-13 June 2014
ER -
TY - CONF
TI - A kinetic model for GaAs growth by hydride vapor phase epitaxy
T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
SP - 1930
EP - 1933
AU - K. L. Schulte
AU - J. Simon
AU - N. Jain
AU - D. L. Young
AU - A. J. Ptak
PY - 2016
KW - III-V semiconductors
KW - gallium arsenide
KW - semiconductor epitaxial layers
KW - semiconductor growth
KW - thermodynamics
KW - vapour phase epitaxial growth
KW - GaAs
KW - HVPE reactor
KW - Langmuir-Hinshelwood analysis
KW - TTT-V materials
KW - growth rate law
KW - hydride vapor phase epitaxy
KW - kinetic model
KW - kinetic phenomena
KW - thermodynamic phenomena
KW - Boats
KW - Epitaxial growth
KW - Gallium
KW - Gallium arsenide
KW - Inductors
KW - Kinetic theory
KW - Surface treatment
DO - 10.1109/PVSC.2016.7749961
JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Y1 - 5-10 June 2016
ER -
TY - JOUR
TI - Simultaneous Measurement of Minority-Carrier Lifetime in Single-Crystal CdTe Using Three Transient Decay Techniques
T2 - IEEE Journal of Photovoltaics
SP - 1295
EP - 1300
AU - S. Johnston
AU - K. Zaunbrecher
AU - R. Ahrenkiel
AU - D. Kuciauskas
AU - D. Albin
AU - W. Metzger
PY - 2014
KW - II-VI semiconductors
KW - cadmium compounds
KW - carrier lifetime
KW - minority carriers
KW - photoluminescence
KW - surface recombination
KW - μ-PCD
KW - CdTe
KW - Nd:YAG laser
KW - TFCA
KW - bulk-dominated recombination
KW - hole concentration
KW - microwave-reflection photoconductive decay
KW - minority-carrier lifetime
KW - simultaneous measurement
KW - simultaneous measurements
KW - single-crystal sample
KW - single-exponential decays
KW - size 0.8 mm
KW - surface recombination
KW - surface-limited initial decay
KW - temperature 293 K to 298 K
KW - time-resolved photoluminescence
KW - transient decay techniques
KW - transient free-carrier absorption
KW - two-photon excitation
KW - unpassivated front surface
KW - wavelength 532 nm
KW - Absorption
KW - Laser excitation
KW - Measurement by laser beam
KW - Power lasers
KW - Semiconductor device measurement
KW - Semiconductor lasers
KW - Surface waves
KW - Cadmium compounds
KW - charge carrier lifetime
KW - infrared detectors
KW - microwave bands
KW - photoconductivity
KW - photoluminescence
KW - photovoltaic cells
KW - tellurium
DO - 10.1109/JPHOTOV.2014.2339491
JO - IEEE Journal of Photovoltaics
IS - 5
SN - 2156-3381
VO - 4
VL - 4
JA - IEEE Journal of Photovoltaics
Y1 - Sept. 2014
ER -
TY - CONF
TI - Solar cell/module degradation and failure diagnostics
T2 - 2008 IEEE International Reliability Physics Symposium
SP - 172
EP - 177
AU - T. J. McMahon
PY - 2008
KW - failure analysis
KW - solar cells
KW - damage mechanisms
KW - failure diagnostics
KW - large-area module
KW - packaging failure
KW - photovoltaics
KW - solar cell
KW - solar module
KW - Acceleration
KW - Moisture
KW - Packaging
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Solar power generation
KW - Temperature
KW - Thermal degradation
KW - Thermal stresses
KW - Voltage
KW - PV modules
KW - photovoltaics
KW - reliability
KW - stress
KW - testing
DO - 10.1109/RELPHY.2008.4558880
JO - 2008 IEEE International Reliability Physics Symposium
IS -
SN - 1541-7026
VO -
VL -
JA - 2008 IEEE International Reliability Physics Symposium
Y1 - April 27 2008-May 1 2008
ER -
TY - CONF
TI - PV Manufacturing R&D Project Status and Accomplishments Under "in-Line Diagnostics and Intelligent Processing" and "Yield, Durability and Reliability"
T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
SP - 2502
EP - 2505
AU - D. J. Friedman
AU - R. L. Mitchell
AU - B. M. Keyes
AU - W. I. Bower
AU - R. King
AU - J. A. Mazer
PY - 2006
KW - costing
KW - durability
KW - intelligent control
KW - process control
KW - reliability
KW - solar cells
KW - PV manufacturing R&D project
KW - PV module fabrication
KW - PV system component
KW - cost-shared research-and-development programs
KW - durability
KW - experience curve analysis
KW - in-line diagnostics
KW - intelligent processing
KW - module production cost-capacity metrics
KW - optimal process control
KW - reliability
KW - silicon module production
KW - thin-film module production
KW - yield
KW - Electrical equipment industry
KW - Fabrication
KW - Feedback
KW - Manufacturing industries
KW - Manufacturing processes
KW - Monitoring
KW - Process control
KW - Production
KW - Real time systems
KW - Research and development
DO - 10.1109/WCPEC.2006.279736
JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
IS -
SN - 0160-8371
VO - 2
VL - 2
JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
Y1 - May 2006
ER -
TY - CONF
TI - Comparison of pyranometers vs. PV reference cells for evaluation of PV array performance
T2 - 2012 38th IEEE Photovoltaic Specialists Conference
SP - 002899
EP - 002904
AU - L. Dunn
AU - M. Gostein
AU - K. Emery
PY - 2012
KW - atmospheric measuring apparatus
KW - power system measurement
KW - solar cell arrays
KW - solar power stations
KW - thermopiles
KW - IEC 60904-3 reference solar spectrum
KW - PV array performance evaluation
KW - PV industry
KW - PV power plant monitoring
KW - PV power plants
KW - PV reference cells
KW - PV reference devices
KW - historical irradiance data
KW - incident solar radiation
KW - irradiance measurements
KW - photovoltaic industry
KW - solar resource monitoring
KW - thermopile pyranometers
KW - Calibration
KW - Measurement uncertainty
KW - Monitoring
KW - Power measurement
KW - Surface waves
KW - Temperature distribution
KW - Temperature measurement
KW - calibration
KW - energy resources
KW - instrumentation and measurement
KW - measurement uncertainty
KW - photovoltaic cells
DO - 10.1109/PVSC.2012.6318193
JO - 2012 38th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2012 38th IEEE Photovoltaic Specialists Conference
Y1 - 3-8 June 2012
ER -
TY - CONF
TI - A liquid-phase quartz crystal microbalance for photovoltaics research
T2 - 2008 33rd IEEE Photovoltaic Specialists Conference
SP - 1
EP - 5
AU - C. L. Perkins
AU - X. Li
PY - 2008
KW - Buffer layers
KW - Chemical processes
KW - Control systems
KW - Electronics industry
KW - Etching
KW - Photovoltaic cells
KW - Quantum dots
KW - Silicon
KW - Solids
KW - Surface contamination
DO - 10.1109/PVSC.2008.4922627
JO - 2008 33rd IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2008 33rd IEEE Photovoltaic Specialists Conference
Y1 - 11-16 May 2008
ER -
TY - CONF
TI - Using diffusion-reaction simulation to study the formation and self-compensation mechanism of Cu doping in CdTe
T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
SP - 1964
EP - 1967
AU - D. Guo
AU - R. Akis
AU - D. Brinkman
AU - A. Moore
AU - J. H. Yang
AU - D. Krasikov
AU - I. Sankin
AU - C. Ringhofer
AU - D. Vasileska
PY - 2016
KW - II-VI semiconductors
KW - cadmium compounds
KW - copper compounds
KW - discrete Fourier transforms
KW - photovoltaic cells
KW - semiconductor device models
KW - semiconductor doping
KW - solar absorber-convertors
KW - solar cells
KW - Cu-CdTe
KW - DFT calculated
KW - PV devices
KW - diffusion-reaction simulation
KW - fitted diffusion parameters
KW - Cadmium compounds
KW - Doping
KW - II-VI semiconductor materials
KW - Mathematical model
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Semiconductor process modeling
KW - CdTe
KW - Photovoltaic cells
KW - copper
KW - diffusion
KW - numerical simulations
KW - semiconductor device doping
DO - 10.1109/PVSC.2016.7749970
JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Y1 - 5-10 June 2016
ER -
TY - CONF
TI - Understanding of defect physics in polycrystalline photovoltaic materials
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 001218
EP - 001222
AU - Y. Yan
PY - 2011
KW - cadmium compounds
KW - copper compounds
KW - electron microscopy
KW - gallium compounds
KW - indium compounds
KW - semiconductor thin films
KW - silicon
KW - solar cells
KW - stacking faults
KW - tin compounds
KW - twin boundaries
KW - zinc compounds
KW - CIGS
KW - CIS
KW - CZTS
KW - CZTSe
KW - CdTe
KW - Cu(InGa)Se2
KW - Cu2ZnSnS2
KW - Cu2ZnSnSe2
KW - DFT
KW - Si
KW - defect physics understanding
KW - defects formation
KW - density-functional theory
KW - dislocations
KW - electronic properties
KW - grain boundaries
KW - harmful defects formation
KW - nanoscale electron microscopy characterization
KW - point defects
KW - polycrystalline photovoltaic materials
KW - stacking faults
KW - thin-film PV materials
KW - thin-film materials
KW - thin-film photovoltaic
KW - thin-film solar cells performance
KW - twins
KW - Grain boundaries
KW - P-n junctions
KW - Photovoltaic cells
KW - Silicon
KW - Stacking
DO - 10.1109/PVSC.2011.6186177
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - CONF
TI - Applications of imaging techniques to Si, Cu(In,Ga)Se2, and CdTe and correlation to solar cell parameters
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 001727
EP - 001732
AU - S. Johnston
AU - I. Repins
AU - N. Call
AU - R. Sundaramoorthy
AU - K. M. Jones
AU - B. To
PY - 2010
KW - II-VI semiconductors
KW - cadmium compounds
KW - carrier lifetime
KW - copper compounds
KW - electroluminescence
KW - gallium compounds
KW - indium compounds
KW - infrared imaging
KW - minority carriers
KW - photoluminescence
KW - scanning electron microscopy
KW - silicon
KW - solar cells
KW - wide band gap semiconductors
KW - CdS
KW - CdTe
KW - Cu(InGa)Se2
KW - Si
KW - carrier recombination
KW - dark lock-in thermography
KW - detrimental weak diodes
KW - electroluminescence imaging
KW - illuminated lock-in thermography
KW - image intensity
KW - imaging techniques
KW - minority-carrier lifetime
KW - open circuit voltage
KW - photoluminescence imaging
KW - scanning electron microscopy
KW - solar cell parameters
DO - 10.1109/PVSC.2010.5616123
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - Transient stability of the US Western Interconnection with high wind and solar generation
T2 - 2015 IEEE Power & Energy Society General Meeting
SP - 1
EP - 5
AU - K. Clark
AU - N. W. Miller
AU - M. Shao
AU - S. Pajic
AU - R. D'Aquila
PY - 2015
KW - power system interconnection
KW - power system transient stability
KW - solar power stations
KW - wind power plants
KW - US Western interconnection transient stability
KW - WI
KW - solar generation
KW - wind generation
KW - Load modeling
KW - Power system stability
KW - Springs
KW - Stability criteria
KW - Thermal stability
KW - Transient analysis
KW - Solar generation
KW - transient stability
KW - wind generation
DO - 10.1109/PESGM.2015.7285987
JO - 2015 IEEE Power & Energy Society General Meeting
IS -
SN - 1932-5517
VO -
VL -
JA - 2015 IEEE Power & Energy Society General Meeting
Y1 - 26-30 July 2015
ER -
TY - CONF
TI - Defect-related trapping and recombination in metamorphic GaAs0.72P0.28 grown on GaAs
T2 - 2008 33rd IEEE Photovoltaic Specialists Conference
SP - 1
EP - 4
AU - T. H. Gfroerer
AU - P. R. Simov
AU - B. A. West
AU - M. W. Wanlass
PY - 2008
KW - Energy states
KW - Gallium arsenide
KW - Photoluminescence
KW - Photonic band gap
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Solar power generation
KW - Spectroscopy
KW - Temperature
KW - Testing
DO - 10.1109/PVSC.2008.4922904
JO - 2008 33rd IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2008 33rd IEEE Photovoltaic Specialists Conference
Y1 - 11-16 May 2008
ER -
TY - CONF
TI - Printed module interconnects
T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
SP - 1
EP - 4
AU - T. R. Stockert
AU - J. D. Fields
AU - G. F. Pach
AU - S. A. Mauger
AU - M. F. A. M. van Hest
PY - 2015
KW - copper compounds
KW - gallium compounds
KW - indium compounds
KW - interconnections
KW - solar cell arrays
KW - thin films
KW - 2-scribe printed interconnect approach
KW - CIGS solar cells
KW - Cu(InGa)Se2
KW - copper-indium-gallium-diselenide
KW - interconnect widths
KW - interconnected solar panel
KW - interconnection method
KW - monolithic interconnects
KW - photovoltaic stack
KW - power generation
KW - printed module interconnects
KW - scribe alignment
KW - size 10 mm
KW - size 250 mum
KW - size 500 mum
KW - thin film photovoltaic modules
KW - Dielectrics
KW - Electrodes
KW - Integrated circuit interconnections
KW - Metals
KW - Photovoltaic systems
KW - Printing
KW - atmospheric processing
KW - interconnects
KW - photovoltaics
DO - 10.1109/PVSC.2015.7356284
JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC)
Y1 - 14-19 June 2015
ER -
TY - JOUR
TI - GaAs Solar Cells Grown by Hydride Vapor-Phase Epitaxy and the Development of GaInP Cladding Layers
T2 - IEEE Journal of Photovoltaics
SP - 191
EP - 195
AU - J. Simon
AU - K. L. Schulte
AU - D. L. Young
AU - N. M. Haegel
AU - A. J. Ptak
PY - 2016
KW - III-V semiconductors
KW - claddings
KW - gallium arsenide
KW - gallium compounds
KW - p-n junctions
KW - passivation
KW - semiconductor growth
KW - solar cells
KW - vapour phase epitaxial growth
KW - GaAs p-n junctions
KW - GaAs solar cells
KW - GaAs-GaInP
KW - GaInP cladding layers
KW - GaInP window layers
KW - high-efficiency III-V photovoltaic devices
KW - high-quality surface passivation layer
KW - hydride vapor-phase epitaxy
KW - open-circuit voltage
KW - quantum efficiency
KW - short-circuit current
KW - Epitaxial growth
KW - Gain measurement
KW - Gallium arsenide
KW - Metals
KW - Photovoltaic cells
KW - Substrates
KW - Temperature measurement
KW - Gallium arsenide
KW - hydride vapor-phase epitaxy (HVPE)
KW - photovoltaics
DO - 10.1109/JPHOTOV.2015.2501723
JO - IEEE Journal of Photovoltaics
IS - 1
SN - 2156-3381
VO - 6
VL - 6
JA - IEEE Journal of Photovoltaics
Y1 - Jan. 2016
ER -
TY - CONF
TI - Two-dimensional measurement of n+-p asymmetrical junctions in multicrystalline silicon solar cells using AFM-based electrical techniques with nanometer resolution
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 001972
EP - 001977
AU - C. S. Jiang
AU - J. T. Heath
AU - H. R. Moutinho
AU - J. V. Li
AU - M. M. Al-Jassim
PY - 2011
KW - atomic force microscopy
KW - bending
KW - elemental semiconductors
KW - image resolution
KW - p-n junctions
KW - probes
KW - silicon
KW - solar cells
KW - AFM-based electrical technique
KW - SCM-SCS
KW - SKPFM
KW - Si
KW - atomic force microscopy-based electrical technique
KW - direct electrical imaging
KW - direct electrical measurement
KW - electric field
KW - junction distribution
KW - metallurgical junction location deduce
KW - multicrystalline solar cell
KW - n+-p asymmetrical electrical junction
KW - nanometer resolution
KW - scanning Kelvin probe force microscopy
KW - scanning capacitance microscopy-spectroscopy
KW - solar cell lateral inhomogeneity
KW - surface band bending
KW - two-dimensional determination junction locations
KW - two-dimensional measurement
KW - Capacitance-voltage characteristics
KW - Doping profiles
KW - Electric fields
KW - Electric potential
KW - Junctions
KW - Silicon
KW - Surface topography
DO - 10.1109/PVSC.2011.6186340
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - CONF
TI - Transparent conducting oxide development for electronics applications
T2 - 2008 17th IEEE International Symposium on the Applications of Ferroelectrics
SP - 1
EP - 2
PY - 2008
KW - Amorphous materials
KW - Conductive films
KW - Conductivity
KW - Electrical resistance measurement
KW - Electromagnetic wave absorption
KW - Indium
KW - Optical reflection
KW - Sputtering
KW - Substrates
KW - Zinc oxide
DO - 10.1109/ISAF.2008.4688157
JO - 2008 17th IEEE International Symposium on the Applications of Ferroelectrics
IS -
SN - 1099-4734
VO -
VL -
JA - 2008 17th IEEE International Symposium on the Applications of Ferroelectrics
Y1 - 23-28 Feb. 2008
ER -
TY - CONF
TI - High penetration PV deployment in the Arizona Public Service system
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 002402
EP - 002405
AU - D. Narang
AU - J. Hambrick
PY - 2011
KW - data acquisition
KW - photovoltaic power systems
KW - power distribution protection
KW - power generation reliability
KW - power meters
KW - APS community power project
KW - Arizona public service system
KW - Flagstaff Pilot
KW - antiislanding
KW - digital smart meters
KW - distribution circuit protection systems
KW - electrical data acquisition systems
KW - high-penetration PV deployment
KW - high-speed weather
KW - phase balance
KW - photovoltaic generators
KW - power 1.5 MW
KW - residential-scale PV
KW - volt-var control schemes
KW - voltage regulation
KW - Analytical models
KW - Communities
KW - Data acquisition
KW - Data models
KW - Integrated circuit modeling
KW - Load modeling
KW - Renewable energy resources
DO - 10.1109/PVSC.2011.6186433
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - JOUR
TI - Synchrophasor-Based Auxiliary Controller to Enhance the Voltage Stability of a Distribution System With High Renewable Energy Penetration
T2 - IEEE Transactions on Smart Grid
SP - 2107
EP - 2115
AU - H. Jiang
AU - Y. Zhang
AU - J. J. Zhang
AU - D. W. Gao
AU - E. Muljadi
PY - 2015
KW - IEEE standards
KW - distributed power generation
KW - phasor measurement
KW - power distribution control
KW - power grids
KW - power system stability
KW - predictive control
KW - support vector machines
KW - turbogenerators
KW - wind power
KW - wind turbines
KW - IEEE 13-bus distribution system
KW - North America
KW - SVM predictor
KW - WTG
KW - auxiliary coordinated-control approach
KW - distributed wind turbine generator
KW - distribution feeder stability
KW - distribution phasor measurement
KW - grid stability
KW - linear time-invariant system
KW - linear time-variant system
KW - megawatt-scale wind turbine
KW - multiple input multiple output model predictive control
KW - renewable energy penetration
KW - support vector machine predictor
KW - synchrophasor-based auxiliary controller
KW - transmission grid
KW - voltage deviation stabilization
KW - voltage stability enhancement
KW - wind energy
KW - Phasor measurement units
KW - Power system stability
KW - Stability analysis
KW - Support vector machines
KW - Vectors
KW - Voltage control
KW - Voltage measurement
KW - Distributed phasor measurement unit
KW - linear time-variant (LTV) system
KW - model predictive control (MPC)
KW - multiple-input and multiple-output (MIMO) control
KW - support vector machine (SVM)
KW - wind turbine
DO - 10.1109/TSG.2014.2387012
JO - IEEE Transactions on Smart Grid
IS - 4
SN - 1949-3053
VO - 6
VL - 6
JA - IEEE Transactions on Smart Grid
Y1 - July 2015
ER -
TY - CONF
TI - Transient response of cadmium telluride modules to light exposure
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 003113
EP - 003118
AU - C. Deline
AU - J. del Cueto
AU - D. S. Albin
AU - C. Petersen
AU - L. Tyler
AU - G. TamizhMani
PY - 2011
KW - cadmium compounds
KW - modules
KW - solar cells
KW - thin films
KW - βVoc
KW - CdTe
KW - cadmium telluride modules
KW - indoor light-exposure
KW - light exposure
KW - outdoor light-exposure
KW - photovoltaic modules
KW - transient response
KW - Current measurement
KW - Steady-state
KW - Temperature distribution
KW - Temperature measurement
KW - Temperature sensors
KW - Transient analysis
DO - 10.1109/PVSC.2011.6186602
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - CONF
TI - How can we make PV modules safer?
T2 - 2012 38th IEEE Photovoltaic Specialists Conference
SP - 003162
EP - 003165
AU - J. H. Wohlgemuth
AU - S. R. Kurtz
PY - 2012
KW - building management systems
KW - safety systems
KW - solar cells
KW - IEC 61730
KW - PV industry
KW - PV modules
KW - UL 1703
KW - commercial buildings
KW - electrical arcing
KW - electrical shock risk
KW - exposed circuit element
KW - ground faults
KW - mechanical damage
KW - open circuits
KW - photovoltaic industry
KW - redundant connection designs
KW - residential buildings
KW - robust mounting methods
KW - safety standards
KW - shock hazard
KW - voltage 300 V to 600 V
KW - Fires
KW - IEC standards
KW - Photovoltaic systems
KW - x
KW - y
KW - z
DO - 10.1109/PVSC.2012.6318250
JO - 2012 38th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2012 38th IEEE Photovoltaic Specialists Conference
Y1 - 3-8 June 2012
ER -
TY - CONF
TI - Epitaxial growth of CZTS on Si substrates investigated with electron backscatter diffraction
T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
SP - 2379
EP - 2383
AU - H. R. Moutinho
AU - M. Young
AU - S. Harvey
AU - C. S. Jiang
AU - C. Perkins
AU - S. Wilson
AU - M. M. Al-Jassim
AU - I. L. Repins
AU - G. Teeter
PY - 2014
KW - copper compounds
KW - electron backscattering
KW - electron diffraction
KW - molecular beam epitaxial growth
KW - semiconductor epitaxial layers
KW - semiconductor growth
KW - semiconductor materials
KW - tin compounds
KW - zinc compounds
KW - Cu2ZnSnS4
KW - EBSD analysis
KW - Si
KW - Si substrates
KW - electron backscatter diffraction
KW - epitaxial [111]-oriented CZTS films
KW - epitaxial growth
KW - molecular beam epitaxy
KW - reliability
KW - Diffraction
KW - Epitaxial growth
KW - Lattices
KW - Silicon
KW - Substrates
KW - CZTS
KW - EBSD
KW - epitaxial growth
DO - 10.1109/PVSC.2014.6925405
JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Y1 - 8-13 June 2014
ER -
TY - CONF
TI - AC/DC/AC Converter Modulation Strategy With Natural Zero sequence Rejection Using Only One Six-Switch Inverter Module
T2 - 2007 IEEE International Electric Machines & Drives Conference
SP - 1226
EP - 1233
AU - A. N. Velpuri
AU - H. L. Hess
AU - J. D. Law
AU - E. J. Cegnar
AU - E. Muljadi
PY - 2007
KW - AC-DC power convertors
KW - DC-AC power convertors
KW - invertors
KW - AC/DC/AC converter modulation
KW - CPRWM inverter
KW - natural zero sequence rejection
KW - poly phase variable frequency
KW - single phase fixed frequency
KW - six switch inverter module
KW - voltage components
KW - Analog-digital conversion
KW - Bridge circuits
KW - Filters
KW - Frequency conversion
KW - Induction generators
KW - Inverters
KW - Voltage
KW - Wind energy
KW - Wind energy generation
KW - Wind power generation
KW - CRPWM
KW - DC-AC power conversion
KW - Induction generators
KW - VSI
KW - Wind energy
KW - pulse width modulation
KW - simultaneous modulation
KW - space vector modulation
KW - wind power generation
KW - zero sequence filter
KW - zigzag transformer
DO - 10.1109/IEMDC.2007.383605
JO - 2007 IEEE International Electric Machines & Drives Conference
IS -
SN -
VO - 2
VL - 2
JA - 2007 IEEE International Electric Machines & Drives Conference
Y1 - 3-5 May 2007
ER -
TY - JOUR
TI - Synchronization of Nonlinear Oscillators in an LTI Electrical Power Network
T2 - IEEE Transactions on Circuits and Systems I: Regular Papers
SP - 834
EP - 844
AU - B. B. Johnson
AU - S. V. Dhople
AU - A. O. Hamadeh
AU - P. T. Krein
PY - 2014
KW - distributed power generation
KW - invertors
KW - oscillators
KW - power distribution control
KW - power generation control
KW - synchronisation
KW - transmission networks
KW - LTI
KW - branch impedance
KW - common node
KW - electrical power network
KW - global asymptotic synchronization
KW - islanded microgrid
KW - linear time-invariant network
KW - load impedance
KW - modular design
KW - nonlinear oscillators
KW - parallel single-phase voltage source inverters
KW - system control
KW - Impedance
KW - Inverters
KW - Microgrids
KW - Oscillators
KW - Power system stability
KW - Synchronization
KW - Vectors
KW - Inverter control
KW - microgrids
KW - nonlinear oscillators
KW - synchronization
DO - 10.1109/TCSI.2013.2284180
JO - IEEE Transactions on Circuits and Systems I: Regular Papers
IS - 3
SN - 1549-8328
VO - 61
VL - 61
JA - IEEE Transactions on Circuits and Systems I: Regular Papers
Y1 - March 2014
ER -
TY - CONF
TI - Applications of admittance spectroscopy in photovoltaic devices beyond majority-carrier trapping defects
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 000075
EP - 000078
AU - J. V. Li
AU - R. S. Crandall
AU - I. L. Repins
AU - A. M. Nardes
AU - D. H. Levi
PY - 2011
KW - electric admittance measurement
KW - solar cells
KW - admittance measurement
KW - admittance spectroscopy applications
KW - admittance spectroscopy-based methods
KW - data interpretation
KW - highly conductive absorbers
KW - majority-carrier mobility
KW - majority-carrier trapping defects
KW - minority-carrier inversion
KW - minority-carrier lifetime
KW - nonohmic contact potential barrier
KW - ohmic contact
KW - organic photovoltaic materials
KW - photovoltaic devices
KW - Admittance
KW - Admittance measurement
KW - Capacitance
KW - Dielectrics
KW - Photovoltaic systems
KW - Spectroscopy
KW - Temperature measurement
DO - 10.1109/PVSC.2011.6185849
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - JOUR
TI - Thermal and Electrical Effects of Partial Shade in Monolithic Thin-Film Photovoltaic Modules
T2 - IEEE Journal of Photovoltaics
SP - 1742
EP - 1747
AU - T. J. Silverman
AU - M. G. Deceglie
AU - X. Sun
AU - R. L. Garris
AU - M. A. Alam
AU - C. Deline
AU - S. Kurtz
PY - 2015
KW - electric breakdown
KW - solar cells
KW - thin film devices
KW - electrical effects
KW - light-enhanced reverse breakdown
KW - module engineering
KW - monolithic thin-film photovoltaic modules
KW - partial shade
KW - reliability testing
KW - thermal effects
KW - Breakdown voltage
KW - Current density
KW - Electric breakdown
KW - Heat transfer
KW - Junctions
KW - Photovoltaic cells
KW - Stress
DO - 10.1109/JPHOTOV.2015.2478071
JO - IEEE Journal of Photovoltaics
IS - 6
SN - 2156-3381
VO - 5
VL - 5
JA - IEEE Journal of Photovoltaics
Y1 - Nov. 2015
ER -
TY - CONF
TI - Fabrication of two-terminal metal-interconnected multijunction III–V solar cells
T2 - 2012 38th IEEE Photovoltaic Specialists Conference
SP - 000944
EP - 000948
AU - C. T. Lin
AU - W. E. McMahon
AU - J. S. Ward
AU - J. F. Geisz
AU - M. W. Wanlass
AU - J. J. Carapella
AU - W. Olavarria
AU - M. Young
AU - M. A. Steiner
AU - R. M. Frances
AU - A. E. Kibbler
AU - A. Duda
AU - J. M. Olson
AU - E. E. Perl
AU - D. J. Friedman
AU - J. E. Bowers
PY - 2012
KW - III-V semiconductors
KW - bonds (chemical)
KW - crystal structure
KW - gallium arsenide
KW - gallium compounds
KW - indium compounds
KW - nanofabrication
KW - solar cells
KW - Au-Au bonding
KW - GaAs substrate
KW - GaInAsP-GaInAs
KW - GaInP-GaAs
KW - InP substrate
KW - conducting GaAs wafer
KW - electron volt energy 1.42 eV
KW - electron volt energy 1.85 eV
KW - filler material
KW - fully lattice-matched two-terminal solar cells
KW - inverted GaAs cell
KW - metal-interconnected multijunction III-V solar cells
KW - optical coupling layer
KW - two-junction tandem cell
KW - Annealing
KW - Bonding
KW - Gallium arsenide
KW - Metals
KW - Optical coupling
KW - Photovoltaic cells
KW - III–V multijunction solar cell
KW - device bonding
DO - 10.1109/PVSC.2012.6317758
JO - 2012 38th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2012 38th IEEE Photovoltaic Specialists Conference
Y1 - 3-8 June 2012
ER -
TY - JOUR
TI - Scalable Optimization Methods for Distribution Networks With High PV Integration
T2 - IEEE Transactions on Smart Grid
SP - 2061
EP - 2070
AU - S. S. Guggilam
AU - E. Dall’Anese
AU - Y. C. Chen
AU - S. V. Dhople
AU - G. B. Giannakis
PY - 2016
KW - algebra
KW - distribution networks
KW - invertors
KW - load flow
KW - photovoltaic power systems
KW - quadratic programming
KW - OPF problem
KW - PV-generation
KW - QCQP
KW - ac optimal power flow
KW - algebraic power-flow equations
KW - distribution feeder
KW - distribution networks
KW - distribution-system test feeders
KW - high PV integration
KW - linear approximation
KW - nonlinear power-flow constraints
KW - photovoltaic inverters
KW - quadratic constrained quadratic program
KW - reactive-power setpoints
KW - scalable optimization methods
KW - voltage regulation
KW - Inverters
KW - Linear approximation
KW - Mathematical model
KW - Optimization
KW - Reactive power
KW - Renewable energy sources
KW - Scalability
KW - Distribution networks
KW - PV systems
KW - linearization
KW - optimization
DO - 10.1109/TSG.2016.2543264
JO - IEEE Transactions on Smart Grid
IS - 4
SN - 1949-3053
VO - 7
VL - 7
JA - IEEE Transactions on Smart Grid
Y1 - July 2016
ER -
TY - CONF
TI - Superior low-light-level performance of upgraded metallurgical-grade silicon modules
T2 - 2012 38th IEEE Photovoltaic Specialists Conference
SP - 002359
EP - 002361
AU - K. Ounadjela
AU - P. Rakotoniaina
AU - O. Sidelkheir
AU - O. Laparra
AU - M. Kaes
AU - R. Smith
AU - S. Rummel
AU - M. Al-Jassim
PY - 2012
KW - metallurgy
KW - performance evaluation
KW - silicon
KW - solar cells
KW - testing
KW - Calisolar upgraded metallurgical-grade solar cell
KW - Si
KW - electronic grade solar cells
KW - standard monocrystalline solar cells
KW - superior low light level performance
KW - upgraded metallurgical-grade silicon modules
KW - Electrical resistance measurement
KW - Lighting
KW - Mathematical model
KW - Photovoltaic cells
KW - Resistance
KW - Silicon
KW - Standards
KW - emitter
KW - low light
KW - performance ratio
KW - photovoltaic cells
KW - shunt resistance
KW - silicon
KW - solar modules
DO - 10.1109/PVSC.2012.6318072
JO - 2012 38th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2012 38th IEEE Photovoltaic Specialists Conference
Y1 - 3-8 June 2012
ER -
TY - CONF
TI - Active integrated antenna based on planar dielectric resonator with tuning ferroelectric varactor
T2 - 2007 IEEE/MTT-S International Microwave Symposium
SP - 1201
EP - 1204
AU - O. Y. Buslov
AU - A. A. Golovkov
AU - V. N. Keis
AU - A. B. Kozyrev
AU - S. V. Krasilnikov
AU - T. B. Samoilova
AU - A. Y. Shimko
AU - D. Ginley
AU - T. Kaydanova
PY - 2007
KW - Gunn diodes
KW - active antennas
KW - dielectric resonator antennas
KW - ferroelectric capacitors
KW - microwave antennas
KW - phase noise
KW - tuning
KW - varactors
KW - active antenna module
KW - active integrated antenna
KW - frequency 17 GHz
KW - phase noise
KW - planar dielectric resonator
KW - radiation frequency tuning
KW - radiation pattern
KW - stabilizing resonator
KW - tunability
KW - tunable Gunn diode
KW - tuning ferroelectric varactor
KW - Antenna radiation patterns
KW - Dielectric resonator antennas
KW - Diodes
KW - Ferroelectric materials
KW - Frequency
KW - Gunn devices
KW - Phase noise
KW - Power measurement
KW - Tuning
KW - Varactors
KW - Active antenna
KW - VCO
KW - ferroelectric varactor
KW - planar dielectric resonator
KW - tunable oscillator
DO - 10.1109/MWSYM.2007.380382
JO - 2007 IEEE/MTT-S International Microwave Symposium
IS -
SN - 0149-645X
VO -
VL -
JA - 2007 IEEE/MTT-S International Microwave Symposium
Y1 - 3-8 June 2007
ER -
TY - CONF
TI - Local voltage control in distribution networks: A game-theoretic perspective
T2 - 2016 North American Power Symposium (NAPS)
SP - 1
EP - 6
AU - X. Zhou
AU - J. Tian
AU - L. Chen
AU - E. Dall'Anese
PY - 2016
KW - game theory
KW - load flow control
KW - nonlinear control systems
KW - photovoltaic power systems
KW - power distribution control
KW - power system stability
KW - reactive power control
KW - voltage control
KW - PV system penetration
KW - distribution network
KW - fixed-point theorem
KW - game theory
KW - inverter-based voltage regulation
KW - linear surrogate approximation
KW - local Volt-VAr controller stability
KW - local voltage control
KW - nonlinear AC power flow model
KW - nonlinear dynamical system
KW - pertinent contraction mapping
KW - photovoltaic system penetration
KW - power system reliability
KW - power-quality
KW - reactive power compensation domain
KW - Games
KW - Mathematical model
KW - Nonlinear dynamical systems
KW - Numerical models
KW - Optimization
KW - Reactive power
KW - Voltage control
KW - Distribution systems
KW - Volt/VAr control
KW - game theory
KW - photovoltaic systems
KW - stability
KW - voltage regulation
DO - 10.1109/NAPS.2016.7747940
JO - 2016 North American Power Symposium (NAPS)
IS -
SN -
VO -
VL -
JA - 2016 North American Power Symposium (NAPS)
Y1 - 18-20 Sept. 2016
ER -
TY - CONF
TI - Development of Cu(In, Ga)Se2 test coupons for potential induced degradation studies
T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
SP - 0857
EP - 0862
AU - M. A. Contreras
AU - P. Hacke
AU - I. Repins
PY - 2016
KW - copper compounds
KW - encapsulation
KW - gallium compounds
KW - indium compounds
KW - life testing
KW - organic compounds
KW - solar cells
KW - ternary semiconductors
KW - CuInGaSe2
KW - accelerated testing
KW - edge seal encapsulation materials
KW - encapsulated small area coupons
KW - ethylene vinyl acetate
KW - framed modules
KW - frameless modules
KW - glass covers
KW - induced degradation
KW - monolithically interconnected modules
KW - photovoltaic module manufacturing
KW - plastic-based top covers
KW - solar cells
KW - temperature 85 degC
KW - test coupons
KW - time 1000 hour
KW - Degradation
KW - Encapsulation
KW - Fabrication
KW - Glass
KW - Nickel
KW - Seals
KW - Testing
KW - CIGS
KW - PID
KW - photovoltaic cells
KW - thin-film
DO - 10.1109/PVSC.2016.7749730
JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
IS -
SN -
VO -
VL -
JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
Y1 - 5-10 June 2016
ER -
TY - CONF
TI - Formation of a back contact by fire-through process of screen-printed silicon solar cells
T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
SP - 001963
EP - 001968
AU - B. Sopori
AU - V. Mehta
AU - D. Guhabiswas
AU - R. Reedy
AU - H. Moutinho
AU - B. To
AU - A. Shaikh
AU - A. Rangappan
PY - 2009
KW - aluminium
KW - diffusion
KW - electrical contacts
KW - elemental semiconductors
KW - liquid metals
KW - semiconductor-metal boundaries
KW - silicon
KW - solar cells
KW - thick films
KW - Si-Al
KW - back contact
KW - diffusion
KW - dimple-free melt
KW - eutectic composition
KW - eutectic particles
KW - fire-through process
KW - incident light flux
KW - molten particles
KW - screen-printed multi-crystalline solar cells
KW - stratification kinetics
KW - temperature ramp-down profile
KW - Artificial intelligence
KW - Contact resistance
KW - Gettering
KW - Impurities
KW - Ohmic contacts
KW - Optical reflection
KW - Photovoltaic cells
KW - Silicon
KW - Surface resistance
KW - Temperature
DO - 10.1109/PVSC.2009.5411536
JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Y1 - 7-12 June 2009
ER -
TY - JOUR
TI - Unlocking Flexibility: Integrated Optimization and Control of Multienergy Systems
T2 - IEEE Power and Energy Magazine
SP - 43
EP - 52
AU - E. Dall'Anese
AU - P. Mancarella
AU - A. Monti
PY - 2017
KW - power system control
KW - quality of service
KW - district heating-cooling systems
KW - environmental benefits
KW - integrated optimization
KW - multienergy systems control
KW - operational efficiency
KW - optimization
KW - quality-of-service
KW - Cooling
KW - Electricity supply industry
KW - Heat pumps
KW - Hydrogen
KW - Natural gas
KW - Optimization
KW - Power system planning
KW - Resistance heating
KW - Water heating
DO - 10.1109/MPE.2016.2625218
JO - IEEE Power and Energy Magazine
IS - 1
SN - 1540-7977
VO - 15
VL - 15
JA - IEEE Power and Energy Magazine
Y1 - Jan.-Feb. 2017
ER -
TY - CONF
TI - Nanoscale measurements of the surface photovoltage in Cu(In, Ga)Se2, Cu2ZnSnS4, and Cu2ZnSnSe4 thin films: The role of the surface electronics on the efficiency of solar cells
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 001983
EP - 001986
AU - H. Du
AU - M. J. Romero
AU - I. Repins
AU - G. Teeter
AU - R. Noufi
AU - M. M. Al-Jassim
PY - 2011
KW - copper compounds
KW - gallium compounds
KW - indium compounds
KW - scanning tunnelling spectroscopy
KW - solar cells
KW - space charge
KW - stoichiometry
KW - surface charging
KW - thin films
KW - tin compounds
KW - voltage measurement
KW - zinc compounds
KW - Cu(InGa)Se2
KW - Cu2ZnSnS4
KW - Cu2ZnSnSe4
KW - SPV nanoscale measurement
KW - STM
KW - first-principle calculation prediction
KW - inversion region
KW - kesterite compound
KW - scanning tunneling microscopy
KW - solar cell efficiency
KW - surface electronic
KW - surface photovoltage nanoscale measurement
KW - surface space charge region
KW - surface stoichiometry deviation
KW - thin film
KW - Copper
KW - Films
KW - Photoconductivity
KW - Photovoltaic cells
KW - Semiconductor device measurement
KW - Tunneling
KW - Voltage measurement
DO - 10.1109/PVSC.2011.6186342
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - CONF
TI - Investigation of effects of processing and impurities on the properties of CdTe using microscopic two-dimensional photoluminescence imaging technique
T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
SP - 001443
EP - 001447
AU - R. Dhere
AU - B. Fluegel
AU - A. Mascarenhas
AU - J. Duenow
AU - T. Gessert
PY - 2009
KW - II-VI semiconductors
KW - cadmium compounds
KW - chemical vapour deposition
KW - glass
KW - grain boundaries
KW - heat treatment
KW - impurities
KW - liquid phase deposition
KW - multilayers
KW - photoluminescence
KW - semiconductor growth
KW - tin compounds
KW - wide band gap semiconductors
KW - SiO2-SnO2-CdS-CdTe
KW - alloying degree
KW - chemical bath deposition
KW - chemical vapor deposition
KW - close-spaced sublimation
KW - direct-imaging technique
KW - electron-multiplying-CCD camera
KW - grain boundary region
KW - heat treatment
KW - impurities
KW - microscopic two-dimensional photoluminescence imaging
KW - nonradiative recombination
KW - photoluminescence mapping
KW - size 100 nm
KW - temperature 400 degC
KW - time 5 min
KW - wavelength 740 nm
KW - wavelength 850 nm
KW - wavelength 900 nm
KW - Cameras
KW - Chemicals
KW - Glass
KW - Grain boundaries
KW - Heat treatment
KW - Impurities
KW - Microscopy
KW - Photoluminescence
KW - Surface treatment
KW - Tellurium
DO - 10.1109/PVSC.2009.5411317
JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Y1 - 7-12 June 2009
ER -
TY - JOUR
TI - Measurements and Modeling of III-V Solar Cells at High Temperatures up to 400 ${}^{circ}$C
T2 - IEEE Journal of Photovoltaics
SP - 1345
EP - 1352
AU - E. E. Perl
AU - J. Simon
AU - J. F. Geisz
AU - M. L. Lee
AU - D. J. Friedman
AU - M. A. Steiner
PY - 2016
KW - III-V semiconductors
KW - aluminium compounds
KW - carrier density
KW - current density
KW - energy gap
KW - gallium arsenide
KW - gallium compounds
KW - indium compounds
KW - ion recombination
KW - photoemission
KW - short-circuit currents
KW - solar cells
KW - Al0.12Ga0.39In0.49P
KW - GaAs
KW - III-V solar cell measurement
KW - III-V solar cell model
KW - bandgap reduction
KW - cell efficiency
KW - dark currents
KW - electron volt energy 1.4 eV
KW - electron volt energy 2 eV
KW - fitting current-voltage measurement
KW - high-temperature solar cell operation
KW - illuminated current-voltage characteristics
KW - intrinsic carrier concentration
KW - open-circuit voltage
KW - photocurrent
KW - quantum efficiency
KW - recombination characteristics
KW - short-circuit current density
KW - temperature 25 degC to 400 degC
KW - temperature-dependent dark current extraction
KW - two-diode model
KW - Gallium arsenide
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Temperature
KW - Temperature measurement
KW - Temperature sensors
KW - III–V and concentrator photovoltaics (PV)
KW - PV cells
KW - semiconductor materials
KW - solar energy
KW - temperature dependence
DO - 10.1109/JPHOTOV.2016.2582398
JO - IEEE Journal of Photovoltaics
IS - 5
SN - 2156-3381
VO - 6
VL - 6
JA - IEEE Journal of Photovoltaics
Y1 - Sept. 2016
ER -
TY - CONF
TI - Relative lifetime prediction for CPV die-attach layers
T2 - 2012 IEEE International Reliability Physics Symposium (IRPS)
SP - 4A.2.1
EP - 4A.2.8
AU - T. J. Silverman
AU - N. Bosco
AU - S. Kurtz
PY - 2012
KW - cracks
KW - failure analysis
KW - microassembling
KW - photovoltaic power systems
KW - solar cells
KW - solders
KW - CPV cell assemblies
KW - CPV cell eventual failure
KW - CPV die-attach layers
KW - Colorado
KW - Oak Ridge
KW - Tennessee
KW - accelerated-test thermal cycles
KW - arbitrary transient temperature conditions
KW - concentrating photovoltaics cell assemblies
KW - damage metric representation
KW - geographic locations
KW - higher ramp rates
KW - large-area die-attach layer
KW - lumped progress
KW - numerical model
KW - relative lifetime prediction
KW - solder die-attach layer
KW - thermal cycles
KW - thermal runaway
KW - thermomechanical fatigue
KW - Assembly
KW - Failure analysis
KW - Life estimation
KW - Materials
KW - Standards
KW - Strain
KW - Stress
DO - 10.1109/IRPS.2012.6241826
JO - 2012 IEEE International Reliability Physics Symposium (IRPS)
IS -
SN - 1541-7026
VO -
VL -
JA - 2012 IEEE International Reliability Physics Symposium (IRPS)
Y1 - 15-19 April 2012
ER -
TY - JOUR
TI - The Influence of PV Module Materials and Design on Solder Joint Thermal Fatigue Durability
T2 - IEEE Journal of Photovoltaics
SP - 1407
EP - 1412
AU - N. Bosco
AU - T. J. Silverman
AU - S. Kurtz
PY - 2016
KW - durability
KW - elemental semiconductors
KW - finite element analysis
KW - laminates
KW - silicon
KW - solar cells
KW - solders
KW - statistical analysis
KW - thermal stress cracking
KW - ATC
KW - FEM simulation
KW - Latin Hypercube sampling statistical method
KW - PV cell temperature history
KW - PV module material
KW - PbSn eutectic solder joint thermal fatigue durability
KW - accelerated thermal cycle
KW - acceleration factor
KW - copper ribbon
KW - finite element model simulation
KW - flat plate photovoltaic module material
KW - laminate material property variable
KW - silicon thickness
KW - solder layer thickness
KW - Computational modeling
KW - Fatigue
KW - Finite element analysis
KW - Photovoltaic systems
KW - Silicon
KW - Soldering
KW - Acceleration factor
KW - photovoltaic (PV) reliability
KW - solder fatigue
KW - thermal cycling
DO - 10.1109/JPHOTOV.2016.2598255
JO - IEEE Journal of Photovoltaics
IS - 6
SN - 2156-3381
VO - 6
VL - 6
JA - IEEE Journal of Photovoltaics
Y1 - Nov. 2016
ER -
TY - CONF
TI - Growth of Biaxially Textured CeO2 Layers on Glass by Magnetron Sputtering
T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
SP - 1368
EP - 1371
AU - M. f. a. m. V. Hest
AU - A. J. Leenheer
AU - J. D. Perkins
AU - C. W. Teplin
AU - D. S. Ginley
PY - 2006
KW - cerium compounds
KW - ion beam assisted deposition
KW - sputter deposition
KW - texture
KW - thin films
KW - CeO2
KW - IBAD
KW - RF sputtering
KW - biaxially textured layers
KW - crystalline silicon
KW - glass substrate
KW - inclined substrate deposition
KW - ion beam assisted deposition
KW - magnetron sputtering
KW - texture orientation
KW - Crystalline materials
KW - Crystallization
KW - Glass
KW - Grain boundaries
KW - Ion beams
KW - Ion sources
KW - Radio frequency
KW - Silicon
KW - Sputtering
KW - Substrates
DO - 10.1109/WCPEC.2006.279686
JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
IS -
SN - 0160-8371
VO - 2
VL - 2
JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
Y1 - May 2006
ER -
TY - CONF
TI - Comparative study of the performance of field-aged photovoltaic modules located in a hot and humid environment
T2 - 2012 38th IEEE Photovoltaic Specialists Conference
SP - 002376
EP - 002381
AU - N. Sorloaica-Hickman
AU - K. Davis
AU - A. Leyte-Vidal
AU - S. Kurtz
AU - D. Jordan
PY - 2012
KW - failure analysis
KW - insulation
KW - real-time systems
KW - regression analysis
KW - reliability
KW - solar cells
KW - DC-AC current
KW - DC-AC voltage
KW - Florida state
KW - IR inspections
KW - PVUSA regression analysis
KW - electrical insulation inspections
KW - energy production
KW - failure mechanism
KW - failure mechanisms
KW - field-aged photovoltaic modules performance
KW - hot environment
KW - humid environment
KW - long term module reliability
KW - long-term outdoor exposure
KW - long-term systems monitoring
KW - multiple analytical methods
KW - nameplate performance values
KW - performance measurements
KW - performance ratio analysis
KW - photovoltaic components
KW - photovoltaic modules
KW - power degradation
KW - real-time climate
KW - real-time field measurements
KW - time constrained accelerated tests
KW - visual inspections
KW - Instruments
KW - Internet
KW - Lighting
KW - MATLAB
KW - Sensors
KW - Time measurement
KW - Transducers
KW - PVUSA regression
KW - Performance Rati
KW - Photovoltaic
KW - degradation rate
KW - reliability
DO - 10.1109/PVSC.2012.6318076
JO - 2012 38th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2012 38th IEEE Photovoltaic Specialists Conference
Y1 - 3-8 June 2012
ER -
TY - CONF
TI - Defect characterization by admittance spectroscopy techniques based on temperature-rate duality
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 000239
EP - 000243
AU - J. V. Li
AU - Y. Yan
AU - A. J. Ptak
AU - I. L. Repins
AU - D. H. Levi
PY - 2010
KW - III-V semiconductors
KW - copper compounds
KW - crystal defects
KW - electron traps
KW - gallium arsenide
KW - hole traps
KW - indium compounds
KW - solar cells
KW - Arrhenius plot
KW - CuInGaSe2
KW - GaAsN
KW - Meyer-Neldel rule
KW - admittance spectroscopy technique
KW - charge trapping
KW - defect characterization
KW - temperature derivative method
KW - temperature rate duality
KW - Admittance
KW - Capacitance
KW - Photovoltaic cells
KW - Spectroscopy
KW - Temperature
KW - Temperature measurement
DO - 10.1109/PVSC.2010.5614469
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - Comparison of minority carrier lifetime measurements in superstrate and substrate CdTe PV devices
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 001271
EP - 001274
AU - T. A. Gessert
AU - R. G. Dhere
AU - J. N. Duenow
AU - D. Kuciauskas
AU - A. Kanevce
AU - J. D. Bergeson
PY - 2011
KW - II-VI semiconductors
KW - cadmium compounds
KW - carrier lifetime
KW - electron-hole recombination
KW - minority carriers
KW - photoluminescence
KW - solar cells
KW - wide band gap semiconductors
KW - CdS-CdTe
KW - TRPL decay analysis
KW - TRPL measurements
KW - bulk MCL and interface recombination
KW - depletion region
KW - drift field
KW - fast recombination rate
KW - minority carrier lifetime measurements
KW - numerical modeling
KW - photovoltaic device functionality analysis
KW - substrate PV devices
KW - superstrate PV devices
KW - time-resolved photoluminescence measurements
KW - Copper
KW - Correlation
KW - Glass
KW - Junctions
KW - Luminescence
KW - Performance evaluation
KW - Substrates
DO - 10.1109/PVSC.2011.6186189
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - CONF
TI - Evaluation and modeling of edge-seal materials for photovoltaic applications
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 000256
EP - 000261
AU - M. D. Kempe
AU - A. A. Dameron
AU - T. J. Moricone
AU - M. O. Reese
PY - 2010
KW - corrosion
KW - glass
KW - moisture
KW - polymer films
KW - sealing materials
KW - solar cells
KW - substrates
KW - edge seal materials
KW - encapsulant materials
KW - glass substrate
KW - moisture ingress
KW - moisture permeation data
KW - moisture-induced corrosion
KW - nonFickian behavior
KW - photovoltaic applications
KW - photovoltaic devices
KW - polyisobutylene materials
KW - polymer films
KW - water vapor transport
KW - Glass
DO - 10.1109/PVSC.2010.5614463
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - Direct analysis of the current-voltage curves of outdoor-degrading modules
T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
SP - 2856
EP - 2861
AU - C. Ulbrich
AU - S. Kurtz
AU - D. Jordan
AU - M. Görig
AU - A. Gerber
AU - U. Rau
PY - 2014
KW - II-VI semiconductors
KW - cadmium compounds
KW - short-circuit currents
KW - solar cells
KW - CdTe
KW - current-voltage curve direct analysis
KW - double-exponential diode behavior
KW - fill factor FF degradation
KW - measured current density-voltage J-V curves
KW - open-circuit voltage
KW - outdoor-degrading modules
KW - phenomenological four-parameter equation
KW - short-circuit current density
KW - time 2.5 year
KW - voltage-dependent charge-carrier collection
KW - Current density
KW - Degradation
KW - Equations
KW - Mathematical model
KW - Resistance
KW - Short-circuit currents
KW - Temperature measurement
KW - CdTe
KW - IV curve
KW - degradation
KW - diode ideality
KW - monitoring
KW - photovoltaic modules
DO - 10.1109/PVSC.2014.6925527
JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Y1 - 8-13 June 2014
ER -
TY - JOUR
TI - Change in Brooklyn and Queens: How New York?s Reforming the Energy Vision Program and Con Edison Are Reshaping Electric Distribution Planning
T2 - IEEE Power and Energy Magazine
SP - 40
EP - 47
AU - M. Coddington
AU - D. Sciano
AU - J. Fuller
PY - 2017
KW - power distribution planning
KW - Brooklyn
KW - New York City
KW - Queens
KW - electric distribution planning
KW - gentrification
KW - infrastructure rebuilding
KW - load growth
KW - new construction
KW - Batteries
KW - Distributed processing
KW - Electricity supply industry
KW - Power grids
KW - Power system planing
KW - Power system reliability
KW - Substations
KW - Urban areas
DO - 10.1109/MPE.2016.2639179
JO - IEEE Power and Energy Magazine
IS - 2
SN - 1540-7977
VO - 15
VL - 15
JA - IEEE Power and Energy Magazine
Y1 - March-April 2017
ER -
TY - JOUR
TI - Energy Comes Together: The Integration of All Systems [Guest Editorial]
T2 - IEEE Power and Energy Magazine
SP - 18
EP - 23
AU - M. OMalley
AU - B. Kroposki
PY - 2013
KW - Electricity supply industry
KW - Energy efficiency
KW - Energy management
KW - Power system economics
KW - Power system planning
KW - Renewable energy resources
KW - Special issues and sections
DO - 10.1109/MPE.2013.2266594
JO - IEEE Power and Energy Magazine
IS - 5
SN - 1540-7977
VO - 11
VL - 11
JA - IEEE Power and Energy Magazine
Y1 - Sept.-Oct. 2013
ER -
TY - CONF
TI - Characterization of in-use medium duty electric vehicle driving and charging behavior
T2 - 2014 IEEE International Electric Vehicle Conference (IEVC)
SP - 1
EP - 8
AU - A. Duran
AU - A. Ragatz
AU - R. Prohaska
AU - K. Kelly
AU - K. Walkowicz
PY - 2014
KW - battery powered vehicles
KW - data analysis
KW - energy storage
KW - average daily driving distance
KW - charging frequency
KW - data analysis
KW - data collection
KW - early deployment behavior
KW - fuel consumption
KW - medium duty EV charging behavior
KW - medium duty electric vehicle driving
KW - route aggressiveness
KW - Batteries
KW - Data collection
KW - Energy consumption
KW - Kinetic theory
KW - Market research
KW - Standards
KW - Vehicles
KW - Charging Behavior
KW - Commercial Vehicle
KW - Driving Behavior
KW - Electric Vehicle (EV)
KW - Medium Duty (MD)
KW - Navistar
KW - Smith
DO - 10.1109/IEVC.2014.7056213
JO - 2014 IEEE International Electric Vehicle Conference (IEVC)
IS -
SN -
VO -
VL -
JA - 2014 IEEE International Electric Vehicle Conference (IEVC)
Y1 - 17-19 Dec. 2014
ER -
TY - CONF
TI - Comparison of transparent back contacts for CdTe top cells in tandem thin-film photovoltaic devices
T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
SP - 002443
EP - 002447
AU - J. N. Duenow
AU - T. M. Barnes
AU - R. G. Dhere
AU - J. D. Bergeson
AU - B. A. Larson
AU - J. L. Blackburn
AU - A. Duda
AU - G. Teeter
AU - T. A. Gessert
PY - 2009
KW - II-VI semiconductors
KW - aluminium
KW - cadmium compounds
KW - carbon nanotubes
KW - copper
KW - indium compounds
KW - ohmic contacts
KW - photovoltaic cells
KW - semiconductor thin films
KW - tin compounds
KW - wide band gap semiconductors
KW - zinc compounds
KW - CdTe-C
KW - CdTe-ITO
KW - CdTe-ZnO:Al
KW - CdTe-ZnTe:Cu
KW - device efficiency
KW - metallization
KW - narrower bandgap bottom cell
KW - ohmic contact
KW - single-wall carbon nanotube
KW - tandem thin film photovoltaic devices
KW - top cells
KW - transparent back contacts
KW - transparent conductor
KW - two-junction cells
KW - wide bandgap top cell
KW - Indium tin oxide
KW - Ohmic contacts
KW - Photonic band gap
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Solar power generation
KW - Thin film devices
KW - Transistors
KW - Zinc compounds
KW - Zinc oxide
DO - 10.1109/PVSC.2009.5411282
JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Y1 - 7-12 June 2009
ER -
TY - JOUR
TI - The Tianjin 2014 Symposium on Microgrids: A meeting of the minds for international microgrid experts.
T2 - IEEE Electrification Magazine
SP - 79
EP - 85
AU - C. Marnay
AU - B. Kroposki
AU - M. Mao
AU - H. Xu
AU - A. Chong
AU - S. K. Chung
AU - R. Hara
AU - T. Ise
AU - R. Iravani
AU - F. Katiraei
AU - M. Albu
AU - N. Hatziargyriou
AU - T. Funabashi
AU - J. Reilly
AU - J. Driesen
AU - G. Jimenez
AU - X. Vallve
PY - 2015
KW - Asia
KW - Electricity supply industry
KW - Microgrids
KW - Power distribution
KW - Power system economics
KW - Power system planning
KW - Research and development
DO - 10.1109/MELE.2014.2381605
JO - IEEE Electrification Magazine
IS - 1
SN - 2325-5897
VO - 3
VL - 3
JA - IEEE Electrification Magazine
Y1 - March 2015
ER -
TY - CONF
TI - Procedure for applying IEC-61853 test data to a single diode model
T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
SP - 2846
EP - 2849
AU - A. P. Dobos
AU - S. M. MacAlpine
PY - 2014
KW - IEC standards
KW - photovoltaic cells
KW - photovoltaic power systems
KW - power semiconductor diodes
KW - IEC-61853 test data standard
KW - average maximum power point prediction error reduction
KW - modified auxiliary diode model equations
KW - photovoltaic module current-voltage characteristic
KW - photovoltaic systems
KW - single diode model
KW - Complexity theory
KW - Predictive models
KW - IEC-61853
KW - performance modeling
KW - photovoltaic module model
KW - single diode model
KW - thin film model
DO - 10.1109/PVSC.2014.6925525
JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Y1 - 8-13 June 2014
ER -
TY - CONF
TI - Carrier density and compensation in semiconductors with multi dopants and multi transition energy levels: The case of Cu impurity in CdTe
T2 - 2011 37th IEEE Photovoltaic Specialists Conference
SP - 002833
EP - 002836
AU - S. H. Wei
AU - J. Ma
AU - T. A. Gessert
AU - K. K. Chin
PY - 2011
KW - cadmium compounds
KW - carrier density
KW - copper
KW - semiconductor doping
KW - solar cells
KW - Cu:CdTe
KW - cadmium telluride
KW - carrier density
KW - charge carrier
KW - copper concentration
KW - detailed balance theory
KW - first-principle-calculated defect formation energies
KW - multdopant energy level
KW - multitransition energy level
KW - optoelectronic device applications
KW - semiconductor physics
KW - semiconductor properties
KW - solar cells
KW - Charge carrier processes
KW - Copper
KW - Doping
KW - Energy states
KW - Impurities
KW - Photovoltaic cells
KW - Temperature measurement
DO - 10.1109/PVSC.2011.6186535
JO - 2011 37th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2011 37th IEEE Photovoltaic Specialists Conference
Y1 - 19-24 June 2011
ER -
TY - CONF
TI - Impact of Zn1−XMnXO on Cu(In,Ga)Se2 thin-film solar cells
T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
SP - 000305
EP - 000308
AU - X. Li
AU - A. Kanevce
AU - J. V. Li
AU - I. Repins
AU - B. Egaas
AU - R. Noufi
PY - 2009
KW - copper compounds
KW - gallium compounds
KW - indium compounds
KW - magnesium
KW - semiconductor thin films
KW - solar cells
KW - thin film devices
KW - zinc compounds
KW - Zn1-xMnxO-CuInGaSe2
KW - cell properties
KW - front-window layer
KW - layer thickness
KW - thin-film solar cells
KW - Absorption
KW - Numerical simulation
KW - Optical buffering
KW - Optical films
KW - Optical sensors
KW - Photonic band gap
KW - Photovoltaic cells
KW - Radio frequency
KW - Sputtering
KW - Zinc oxide
KW - CIGS solar cell
KW - ZnMgO
KW - conduction-band offset
DO - 10.1109/PVSC.2009.5411675
JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Y1 - 7-12 June 2009
ER -
TY - CONF
TI - Analytical improvements in PV degradation rate determination
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 002688
EP - 002693
AU - D. C. Jordan
AU - S. R. Kurtz
PY - 2010
KW - photovoltaic power systems
KW - power grids
KW - PV degradation rate determination
KW - data analysis
KW - data shifts
KW - measurement time periods
KW - outliers
KW - power grid
KW - Data models
KW - Degradation
KW - Mathematical model
KW - Photovoltaic systems
KW - Robustness
KW - Silicon
KW - Uncertainty
DO - 10.1109/PVSC.2010.5617074
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - Variable-speed wind power plant operating with reserve power capability
T2 - 2013 IEEE Energy Conversion Congress and Exposition
SP - 3305
EP - 3310
AU - M. Singh
AU - V. Gevorgian
AU - E. Muljadi
AU - E. Ela
PY - 2013
KW - asynchronous generators
KW - wind power plants
KW - wind turbines
KW - doubly-fed induction generator
KW - reserve power capability
KW - reserve-holding capability
KW - variable-speed wind power plant
KW - wind turbine control
KW - wind turbine generators
KW - Aerodynamics
KW - Generators
KW - Power systems
KW - Spinning
KW - Wind power generation
KW - Wind speed
KW - Wind turbines
KW - governor response
KW - induction generator
KW - inertial response
KW - renewable energy
KW - variable speed
KW - wind turbine generator
DO - 10.1109/ECCE.2013.6647134
JO - 2013 IEEE Energy Conversion Congress and Exposition
IS -
SN - 2329-3721
VO -
VL -
JA - 2013 IEEE Energy Conversion Congress and Exposition
Y1 - 15-19 Sept. 2013
ER -
TY - CONF
TI - High-Efficiency CdTe and CIGS Thin-Film Solar Cells: Highlights and Challenges
T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
SP - 317
EP - 320
AU - R. Noufi
AU - K. Zweibel
PY - 2006
KW - II-VI semiconductors
KW - cadmium compounds
KW - copper compounds
KW - indium compounds
KW - semiconductor device manufacture
KW - semiconductor thin films
KW - solar cells
KW - ternary semiconductors
KW - thin film devices
KW - 10.2 percent
KW - 13 percent
KW - 16.5 percent
KW - 19.5 percent
KW - CIGS thin-film solar cells
KW - CdTe
KW - CuInGaSe2
KW - absorption
KW - deposition process
KW - device-module structure
KW - diagnostics
KW - durability
KW - encapsulation
KW - high-speed processing
KW - in-situ process control
KW - junction layer
KW - monolithic integration
KW - thin-film photovoltaic modules
KW - thin-film technologies
KW - top electrode
KW - water vapor
KW - Costs
KW - Degradation
KW - Electrodes
KW - Laboratories
KW - Manufacturing
KW - Monolithic integrated circuits
KW - Photovoltaic cells
KW - Photovoltaic systems
KW - Solar power generation
KW - Transistors
DO - 10.1109/WCPEC.2006.279455
JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
IS -
SN - 0160-8371
VO - 1
VL - 1
JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
Y1 - May 2006
ER -
TY - CONF
TI - Rapid fabrication of Cu(In,Ga)Se2 thin films by the two-step selenization process
T2 - 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2
SP - 1
EP - 7
AU - S. Ishizuka
AU - L. M. Mansfield
AU - C. DeHart
AU - M. Scott
AU - B. To
AU - M. R. Young
AU - B. Egaas
AU - R. Noufi
PY - 2012
KW - Grain size
KW - Metals
KW - Photovoltaic cells
KW - Stacking
KW - Surface morphology
KW - Surface treatment
KW - X-ray scattering
KW - Copper indium gallium diselenide
KW - Cu(In, Ga)Se2 (CIGS)
KW - photovoltaic cells
KW - selenization
KW - thin films
DO - 10.1109/PVSC-Vol2.2012.6656749
JO - 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2
IS -
SN -
VO -
VL -
JA - 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2
Y1 - 3-8 June 2012
ER -
TY - CONF
TI - Creep in photovoltaic modules: Examining the stability of polymeric materials and components
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 000262
EP - 000268
AU - D. C. Miller
AU - M. D. Kempe
AU - S. H. Glick
AU - S. R. Kurtz
PY - 2010
KW - creep
KW - differential scanning calorimetry
KW - non-Newtonian flow
KW - photovoltaic cells
KW - polymers
KW - renewable energy sources
KW - creep
KW - differential scanning calorimetry
KW - encapsulation materials
KW - installation location
KW - module configuration
KW - module service life
KW - mounting configuration
KW - mounting-adhesive technologies
KW - noncross-linked thermoplastics
KW - phase transformation
KW - photovoltaic modules
KW - polymeric components
KW - polymeric materials
KW - renewable energy
KW - rheometry data
KW - site-specific time-temperature information
KW - unacceptable physical displacement
KW - viscoelastic flow
DO - 10.1109/PVSC.2010.5615832
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - New Qualification Test Procedures for Concentrator Photovoltaic Modules and Assemblies
T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
SP - 721
EP - 724
AU - L. Ji
AU - R. McConnell
PY - 2006
KW - plastics
KW - solar cells
KW - solar energy concentrators
KW - testing
KW - IEC 62108.8d
KW - concentrator photovoltaic modules
KW - electric-current cycle
KW - in-lab testing
KW - on-site testing
KW - photovoltaic assemblies
KW - plastic materials
KW - solar cell design
KW - test procedures
KW - test-sequence charts
KW - thermal-cycling tests
KW - type passing criterion selection
KW - Assembly
KW - IEC standards
KW - Life testing
KW - Materials testing
KW - Photovoltaic systems
KW - Qualifications
KW - Solar power generation
KW - Temperature distribution
KW - Thermal conductivity
KW - Thermal stresses
DO - 10.1109/WCPEC.2006.279557
JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
IS -
SN - 0160-8371
VO - 1
VL - 1
JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference
Y1 - May 2006
ER -
TY - CONF
TI - The direct correlation of CDTE solar cell stability with mobile ion charge generation during accelerated lifetime testing
T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
SP - 001903
EP - 001908
AU - D. S. Albin
AU - R. G. Dhere
AU - S. C. Glynn
AU - W. K. Metzger
PY - 2009
KW - II-VI semiconductors
KW - cadmium compounds
KW - solar cells
KW - substrates
KW - wide band gap semiconductors
KW - CdS-CdTe
KW - SnO2
KW - Zn2SO4
KW - accelerated lifetime testing
KW - cadmium stannate
KW - capacitance-voltage method
KW - direct correlation
KW - mobile ion charge generation
KW - mobile ion concentration
KW - solar cell stability
KW - transparent conducting oxide substrates
KW - zinc stannate
KW - Cadmium compounds
KW - Degradation
KW - Hysteresis
KW - Life estimation
KW - Life testing
KW - Photovoltaic cells
KW - Solar power generation
KW - Stability
KW - Stress
KW - Zinc
DO - 10.1109/PVSC.2009.5411121
JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC)
Y1 - 7-12 June 2009
ER -
TY - CONF
TI - Evaluating future standards and codes with a focus on high penetration photovoltaic (HPPV) system deployment
T2 - 2010 35th IEEE Photovoltaic Specialists Conference
SP - 000544
EP - 000549
AU - M. H. Coddington
AU - B. D. Kroposki
AU - T. S. Basso
PY - 2010
KW - photovoltaic power systems
KW - power system security
KW - electric utility rates
KW - energy security
KW - high penetration photovoltaic system deployment
KW - penetration levels
KW - power 792 MW
KW - renewable capacity
KW - societal deliberations
DO - 10.1109/PVSC.2010.5616833
JO - 2010 35th IEEE Photovoltaic Specialists Conference
IS -
SN - 0160-8371
VO -
VL -
JA - 2010 35th IEEE Photovoltaic Specialists Conference
Y1 - 20-25 June 2010
ER -
TY - CONF
TI - Performance characterization of cadmium telluride modules validated by utility-scale and test systems
T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
SP - 1957
EP - 1962
AU - L. Ngan
AU - N. Strevel
AU - K. Passow
AU - A. F. Panchula
AU - D. Jordan
PY - 2014
KW - cadmium compounds
KW - photovoltaic power systems
KW - power engineering computing
KW - power system measurement
KW - solar cell arrays
KW - statistical analysis
KW - Isis
KW - NREL test array
KW - PV energy modeling
KW - cadmium telluride modules
KW - energy prediction guidance
KW - first solar CdTe modules
KW - internal prediction software
KW - lifetime energy generation models
KW - module temperature accuracy
KW - performance characterization
KW - plane-of-array irradiance
KW - power 1.2 kW
KW - power 600 W
KW - statistical analysis
KW - test systems
KW - utility-scale installation
KW - Accuracy
KW - Current measurement
KW - Energy measurement
KW - Inverters
KW - Power measurement
KW - Temperature measurement
KW - Voltage measurement
KW - CdTe
KW - PV energy modeling
KW - PV system performance
KW - degradation rate
KW - photovoltaic cells
KW - thin-film PV
DO - 10.1109/PVSC.2014.6925309
JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
IS -
SN - 0160-8371
VO -
VL -
JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)
Y1 - 8-13 June 2014
ER -
TY - JOUR
TI - Highly Transparent Compositionally Graded Buffers for New Metamorphic Multijunction Solar Cell Designs
T2 - IEEE Journal of Photovoltaics
SP - 347
EP - 353
AU - K. L. Schulte
AU - R. M. France
AU - J. F. Geisz
PY - 2017
KW - aluminium compounds
KW - doping
KW - energy gap
KW - gallium arsenide
KW - gallium compounds
KW - indium compounds
KW - lattice constants
KW - selenium
KW - semiconductor junctions
KW - solar cells
KW - A-miscut substrate
KW - AlxGayIn1-x-yAs-GaxIn1-xP:Se-GaInAs-GaAs
KW - B-miscut substrate
KW - GaAs
KW - electron volt energy 0.74 eV
KW - four-junction-inverted metamorphic multijunction cell
KW - highly transparent compositionally graded buffer
KW - lattice constant
KW - metamorphic multijunction solar cell design
KW - multijunction device structure
KW - quantum efficiency measurement
KW - single-graded buffer
KW - tandem cell
KW - two-junction band gap combination
KW - voltage 0.41 V
KW - wavelength 810 nm to 890 nm
KW - Doping
KW - Gallium arsenide
KW - III-V semiconductor materials
KW - Indium phosphide
KW - Junctions
KW - Photonic band gap
KW - Substrates
KW - III-V semiconductor materials
KW - Photovoltaic cells
KW - semiconductor device doping
KW - semiconductor epitaxial layers
DO - 10.1109/JPHOTOV.2016.2619183
JO - IEEE Journal of Photovoltaics
IS - 1
SN - 2156-3381
VO - 7
VL - 7
JA - IEEE Journal of Photovoltaics
Y1 - Jan. 2017
ER -