TY - CONF TI - Locational marginal pricing in the campus power system at the power distribution level T2 - 2016 IEEE Power and Energy Society General Meeting (PESGM) SP - 1 EP - 5 AU - Jun Hao AU - Yi Gu AU - Yingchen Zhang AU - Jun Jason Zhang AU - David Wenzhong Gao PY - 2016 KW - load flow KW - power distribution economics KW - pricing KW - smart power grids KW - University of Denver KW - alternate current optimal power flow KW - campus power system KW - direct current optimal power flow KW - distributional nodal prices KW - locational marginal pricing KW - optimal power flow KW - power distribution system KW - power grid KW - real-time nodal pricing KW - smart grid KW - Buildings KW - Load modeling KW - Power grids KW - Pricing KW - Real-time systems KW - Renewable energy sources KW - Distribution locational marginal price KW - campus power system KW - distribution power system KW - load shedding KW - optimal power flow DO - 10.1109/PESGM.2016.7741569 JO - 2016 IEEE Power and Energy Society General Meeting (PESGM) IS - SN - VO - VL - JA - 2016 IEEE Power and Energy Society General Meeting (PESGM) Y1 - 17-21 July 2016 ER - TY - CONF TI - Optical absorption and electrical conductivity in amorphous In-Zn-O: A new TCO for CIGS PV T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) SP - 001141 EP - 001143 AU - J. D. Perkins AU - T. Gennett AU - M. F. A. M. van Hest AU - L. M. Gedvilas AU - D. S. Ginley PY - 2009 KW - amorphous semiconductors KW - carrier density KW - electrical conductivity KW - electron mobility KW - indium compounds KW - semiconductor thin films KW - sputtered coatings KW - transparency KW - wide band gap semiconductors KW - InZnO KW - amorphous films KW - carrier concentration KW - electrical conductivity KW - electron mobility KW - metal compositions KW - optical absorption KW - optimal oxygen level KW - oxygen deficient KW - sputter gas mixture KW - transparent conducting oxide KW - wavelength 400 nm to 1000 nm KW - Absorption KW - Amorphous materials KW - Argon KW - Conductive films KW - Conductivity KW - Electron mobility KW - Electron optics KW - Indium KW - Optical coupling KW - Optical films DO - 10.1109/PVSC.2009.5411220 JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Y1 - 7-12 June 2009 ER - TY - CONF TI - Imaging of shunts and junction breakdown in multicrystalline silicon solar cells T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) SP - 001184 EP - 001189 AU - N. J. Call AU - S. W. Johnston AU - R. K. Ahrenkiel AU - M. J. Romero AU - B. Yang PY - 2009 KW - crystal defects KW - electroluminescence KW - elemental semiconductors KW - impurities KW - infrared imaging KW - photoluminescence KW - semiconductor device breakdown KW - silicon KW - solar cells KW - Si KW - crystallographic defect KW - dark lock-in thermography KW - electroluminescence KW - emission spectra KW - impurity KW - junction breakdown KW - multicrystalline silicon solar cells KW - photoluminescence KW - photonic emission KW - radiative recombination KW - shunting behavior KW - visible breakdown emission KW - Avalanche breakdown KW - Charge coupled devices KW - Charge-coupled image sensors KW - Crystalline materials KW - Electric breakdown KW - Laboratories KW - Photovoltaic cells KW - Renewable energy resources KW - Shunt (electrical) KW - Silicon DO - 10.1109/PVSC.2009.5411230 JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Y1 - 7-12 June 2009 ER - TY - CONF TI - All-laser scribing for thin-film CuInGaSe2 solar cells T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 003479 EP - 003484 AU - F. J. Pern AU - L. Mansfield AU - S. Glynn AU - B. To AU - C. DeHart AU - S. Nikumb AU - C. Dinkel AU - M. Rekow AU - R. Murison AU - T. Panarello AU - C. Dunsky PY - 2010 KW - copper compounds KW - electroluminescence KW - gallium compounds KW - indium compounds KW - laser beam applications KW - photoluminescence KW - solar cells KW - thin film devices KW - CuInGaSe2 KW - NREL KW - Performance degrading factors KW - all-laser-scribing technology KW - electroluminescence KW - fiber laser system KW - fill factor KW - monolithically integrated minimodules fabrication KW - photoluminescence KW - programmable pulse shape KW - pulse train KW - scribe lines KW - series resistance KW - shunt resistance KW - small-beam localized quantum efficiency analysis KW - thin film solar cells KW - three specific samples fabrication KW - wavelength 1064 nm KW - Atmospheric measurements KW - Image edge detection KW - Integrated optics KW - Optical fibers KW - Optical imaging KW - Photonic band gap DO - 10.1109/PVSC.2010.5614717 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - Compositional and structural characterization by TEM of lattice-mismatched III-V epilayers T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 000449 EP - 000451 AU - S. P. Ahrenkiel AU - M. Rathi AU - R. Nesheim AU - N. Zheng AU - S. Vunnam AU - J. J. Carapella AU - M. W. Wanlass PY - 2011 KW - III-V semiconductors KW - X-ray chemical analysis KW - chemical vapour deposition KW - electron diffraction KW - gallium arsenide KW - photovoltaic cells KW - principal component analysis KW - solar cells KW - transmission electron microscopy KW - CBED KW - EDX KW - GaAs KW - HOLZ lines KW - LMM KW - MOCVD KW - NREL KW - PCA KW - SDSM&T development KW - TEM imaging KW - bright-field disks KW - compositional transmission electron microscopy characterization KW - convergent-beam electron diffraction KW - defect morphology KW - embedded epilayers KW - energy-dispersive X-ray spectrometry KW - extracting compositions KW - high-efficiency multijunction solar cells KW - high-order Laue zone KW - home-built system KW - lattice-mismatched KW - lattice-mismatched lll-V epilayers KW - lattice-mismatched structures KW - metalorganic chemical vapor deposition KW - photovoltaic technology KW - principal-component analysis KW - standards-based method KW - strain parameters KW - structural transmission electron microscopy characterization KW - thicknesses morphology KW - zeta-factor approach KW - Diffraction KW - Gallium arsenide KW - Lattices KW - MOCVD KW - Metals KW - Principal component analysis KW - Substrates DO - 10.1109/PVSC.2011.6185990 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - CONF TI - Rapid, enhanced IV characterization of multi-junction PV devices under one sun at NREL T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) SP - 1 EP - 3 AU - T. Moriarty AU - R. France AU - M. Steiner PY - 2015 KW - iterative methods KW - optimisation KW - solar cells KW - IV characterization resources KW - NREL KW - device optimization KW - enhanced IV characterization KW - multijunction PV devices KW - multijunction technology KW - Buildings KW - Junctions KW - Shape measurement KW - Spectral shape KW - Sun KW - Temperature distribution KW - Temperature measurement DO - 10.1109/PVSC.2015.7355845 JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) IS - SN - VO - VL - JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Y1 - 14-19 June 2015 ER - TY - CONF TI - Visualization of wide area measurement information from the FNET system T2 - 2011 IEEE Power and Energy Society General Meeting SP - 1 EP - 8 AU - Y. Zhang AU - L. Chen AU - Y. Ye AU - P. Markham AU - J. Bank AU - J. Dong AU - Z. Yuan AU - Z. Lin AU - Y. Liu PY - 2011 KW - angular measurement KW - data visualisation KW - frequency measurement KW - phase measurement KW - power engineering computing KW - power system faults KW - power system measurement KW - voltage measurement KW - FDR measurements KW - FNET system KW - advanced visualization tools KW - animated event replay KW - combined matrices KW - computer techniques KW - frequency information KW - geographical information KW - graphic formats KW - modal oscillations KW - oscillation mode analysis visualization KW - phase angle information KW - post-event analysis KW - power system dynamic monitoring KW - power system operation KW - programming languages KW - propagation effect visualization KW - real-time visualization KW - two-dimensional systems KW - voltage magnitude KW - wide area measurement information KW - widely-distributed frequency disturbance recorders KW - Data visualization KW - Frequency measurement KW - Oscillators KW - Power system dynamics KW - Real time systems KW - Shape KW - data visualization KW - frequency disturbance recorder (FDR) KW - frequency monitoring network (FNET) KW - mode shape KW - oscillation KW - post event analysis KW - realtime monitoring DO - 10.1109/PES.2011.6039619 JO - 2011 IEEE Power and Energy Society General Meeting IS - SN - 1932-5517 VO - VL - JA - 2011 IEEE Power and Energy Society General Meeting Y1 - 24-29 July 2011 ER - TY - CONF TI - Adhesion of antireflective coatings in multijunction photovoltaics T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) SP - 0850 EP - 0853 AU - R. Brock AU - D. C. Miller AU - R. H. Dauskardt PY - 2016 KW - adhesion KW - antireflection coatings KW - cantilevers KW - germanium KW - photovoltaic cells KW - solar cells KW - antireflective coating adhesion KW - cDCB thin-film adhesion testing method KW - composite dual cantilever beam KW - damp heat KW - fragile thin substrate KW - germanium substrate KW - interface chemistry KW - interfacial adhesion KW - morphology KW - multijunction cell KW - multijunction photovoltaics KW - temperature 85 C KW - Adhesives KW - Aging KW - Coatings KW - Germanium KW - Reliability KW - Structural beams KW - Substrates KW - adhesion KW - antireflective KW - concentrator photovoltaic KW - delamination KW - durability KW - multijunction cell KW - reliability DO - 10.1109/PVSC.2016.7749728 JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) IS - SN - VO - VL - JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Y1 - 5-10 June 2016 ER - TY - CONF TI - Virtual Oscillator Control subsumes droop control T2 - 2015 American Control Conference (ACC) SP - 2353 EP - 2358 AU - M. Sinha AU - F. Dörfler AU - B. B. Johnson AU - S. V. Dhople PY - 2015 KW - distributed power generation KW - invertors KW - limit cycles KW - nonlinear control systems KW - oscillators KW - reactive power control KW - stability KW - time-domain analysis KW - voltage control KW - VOC dynamics KW - amplitude KW - complex dynamics KW - controlling inverter KW - desired sinusoidal steady state KW - globally stabilizing control strategy KW - harmonic steady state KW - higher-order harmonics KW - islanded microgrid KW - nonlinear Liénard-type oscillator KW - nonlinear limit-cycle oscillator KW - phase dynamics KW - power-electronic inverter KW - quasi-stationary sinusoidal steady state KW - reactive power injection KW - time-domain alternative KW - time-domain control strategy KW - ubiquitous droop control method KW - virtual oscillator control KW - voltage frequency KW - Inverters KW - Limit-cycles KW - Nonlinear dynamical systems KW - Oscillators KW - Power system dynamics KW - Steady-state KW - Voltage control DO - 10.1109/ACC.2015.7171084 JO - 2015 American Control Conference (ACC) IS - SN - 0743-1619 VO - VL - JA - 2015 American Control Conference (ACC) Y1 - 1-3 July 2015 ER - TY - CONF TI - Optimizing carbon nanotube contacts for use in organic photovoltaics T2 - 2008 33rd IEEE Photovoltaic Specialists Conference SP - 1 EP - 5 AU - T. M. Barnes AU - J. L. Blackburn AU - R. C. Tenent AU - A. Morfa AU - M. Heben AU - T. J. Coutts PY - 2008 KW - Carbon nanotubes KW - Contacts KW - Costs KW - Flexible manufacturing systems KW - Morphology KW - Optical devices KW - Optical fiber networks KW - Optical films KW - Photovoltaic cells KW - Thin film devices DO - 10.1109/PVSC.2008.4922486 JO - 2008 33rd IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2008 33rd IEEE Photovoltaic Specialists Conference Y1 - 11-16 May 2008 ER - TY - CONF TI - An Evaluation of 27+ Years Old Photovoltaic Modules Operated in a Hot-Desert Climatic Condition T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference SP - 2145 EP - 2147 AU - Y. Tang AU - B. Raghuraman AU - J. Kuitche AU - G. TamizhMani AU - C. E. Backus AU - C. Osterwald PY - 2006 KW - environmental factors KW - failure analysis KW - life testing KW - solar cells KW - -40 C KW - 1000 hours KW - 85 C KW - 90 C KW - average power degradation KW - damp-heat KW - encapsulant KW - failure mechanism identification KW - fiberglass-like substrate KW - hot-desert climatic condition KW - hot-spot stress tests KW - long-term field deployed modules KW - monoSi cells KW - neoprene cable KW - photovoltaic modules KW - potted junction box KW - silicone rubber superstrate KW - thermal cycling test KW - water pumping array KW - Failure analysis KW - IEC standards KW - Laboratories KW - Manufacturing KW - Optical fiber cables KW - Photovoltaic systems KW - Qualifications KW - Solar power generation KW - Testing KW - Thermal stresses DO - 10.1109/WCPEC.2006.279929 JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference IS - SN - 0160-8371 VO - 2 VL - 2 JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference Y1 - 7-12 May 2006 ER - TY - CONF TI - Acceleration factor determination for potential-induced degradation in crystalline silicon PV modules T2 - 2013 IEEE International Reliability Physics Symposium (IRPS) SP - 4B.1.1 EP - 4B.1.5 AU - P. Hacke AU - R. Smith AU - K. Terwilliger AU - S. Glick AU - D. Jordan AU - S. Johnston AU - M. Kempe AU - S. Kurtz PY - 2013 KW - elemental semiconductors KW - failure analysis KW - life testing KW - probability KW - silicon KW - sodium KW - solar cells KW - statistical analysis KW - Si KW - accelerated lifetime test data KW - acceleration factor determination KW - chamber testing KW - constant relative humidity KW - crystalline silicon PV modules KW - dark I-V measurements KW - electron volt energy 0.73 eV KW - environmental chamber KW - failure mechanism KW - initial module power KW - lognormal analysis KW - module failure probability KW - module power in-situ estimation KW - negative-voltage arrays KW - p-type silicon-based photovoltaic solar cell modules KW - potential-induced degradation KW - statistical data KW - Acceleration KW - Degradation KW - Life estimation KW - Photovoltaic systems KW - Stress KW - Temperature measurement KW - Testing KW - Current-voltage characteristics KW - Degradation KW - High-voltage techniques KW - Photovoltaic cells KW - Photovoltaic systems KW - Reliability DO - 10.1109/IRPS.2013.6532009 JO - 2013 IEEE International Reliability Physics Symposium (IRPS) IS - SN - 1541-7026 VO - VL - JA - 2013 IEEE International Reliability Physics Symposium (IRPS) Y1 - 14-18 April 2013 ER - TY - CONF TI - Thermal treatment improvement of CuSbS2 absorbers T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) SP - 1 EP - 5 AU - F. W. de Souza Lucas AU - A. W. Welch AU - L. L. Baranowski AU - P. C. Dippo AU - L. H. Mascaro AU - A. Zakutayev PY - 2015 KW - antimony compounds KW - copper compounds KW - etching KW - grain size KW - oxygen compounds KW - photoconductivity KW - photoluminescence KW - potassium compounds KW - solar absorber-convertors KW - solar cells KW - thin films KW - CuSbS2 KW - KOH KW - Sb2S3 KW - chemical etching KW - crystallographic texture KW - earth-abundant absorber KW - grain size KW - photoconductivity KW - photoluminescence intensity KW - photovoltaic performance KW - surface layer KW - thermal treatment KW - thin films KW - Optical diffraction KW - Optical films KW - Optical imaging KW - Optical reflection KW - Performance evaluation KW - X-ray scattering KW - CuSbS2 KW - Sb2S3 selective chemical etch KW - annealing KW - non-toxic and earth-abundant absorber DO - 10.1109/PVSC.2015.7355898 JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) IS - SN - VO - VL - JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Y1 - 14-19 June 2015 ER - TY - CONF TI - Comparison of Cu2SnS3 and CuSbS2 as potential solar cell absorbers T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) SP - 2436 EP - 2438 AU - A. Zakutayev AU - L. L. Baranowski AU - A. W. Welch AU - C. A. Wolden AU - E. S. Toberer PY - 2014 KW - antimony compounds KW - copper compounds KW - semiconductor thin films KW - solar absorber-convertors KW - solar cells KW - ternary semiconductors KW - thin film devices KW - tin compounds KW - CZTS performance KW - Cu2SnS3 KW - CuSbS2 KW - chemical complexity KW - composition stability ranges KW - earth-abundant chalcogenide thin-film solar cells KW - electrical transport properties KW - high-throughput combinatorial approach KW - layered structure KW - optical absorption KW - phase stability range KW - photovoltaic field KW - potential solar cell absorbers KW - ternary copper chalcogenides KW - Absorption KW - Chemicals KW - Conductivity KW - Materials KW - Photovoltaic cells KW - Photovoltaic systems KW - combinatorial sputtering KW - solar cell absorber KW - ternary copper metal sulfide DO - 10.1109/PVSC.2014.6925421 JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Y1 - 8-13 June 2014 ER - TY - CONF TI - Impacts of short-term solar power forecasts in system operations T2 - 2016 IEEE/PES Transmission and Distribution Conference and Exposition (T&D) SP - 1 EP - 5 AU - E. Ibanez AU - I. Krad AU - B. M. Hodge AU - E. Ela PY - 2016 KW - load forecasting KW - photovoltaic power systems KW - power generation economics KW - power generation reliability KW - intraday operations KW - short-term forecasting strategies KW - short-term solar power forecasts KW - solar PV forecasting method KW - system operations KW - Clouds KW - Forecasting KW - Mathematical model KW - Power system reliability KW - Reliability KW - Wind forecasting KW - Forecasting KW - Security Constrained Economic Dispatch (SCED) KW - Security Constrained Unit Commitment (SCUC) KW - Solar power generation KW - power system economics KW - power system reliability DO - 10.1109/TDC.2016.7519885 JO - 2016 IEEE/PES Transmission and Distribution Conference and Exposition (T&D) IS - SN - VO - VL - JA - 2016 IEEE/PES Transmission and Distribution Conference and Exposition (T&D) Y1 - 3-5 May 2016 ER - TY - CONF TI - A comparative study of the defect point physics and luminescence of the kesterites Cu2ZnSnS4 and Cu2ZnSnSe4 and chalcopyrite Cu(In,Ga)Se2 T2 - 2012 38th IEEE Photovoltaic Specialists Conference SP - 003349 EP - 003353 AU - M. J. Romero AU - I. Repins AU - G. Teeter AU - M. A. Contreras AU - M. Al-Jassim AU - R. Noufi PY - 2012 KW - II-VI semiconductors KW - cathodoluminescence KW - chemical potential KW - copper compounds KW - electrostatics KW - gallium compounds KW - grain boundaries KW - indium compounds KW - solar cells KW - ternary semiconductors KW - tin compounds KW - zinc compounds KW - Cu2ZnSnS4 KW - Cu2ZnSnSe4 KW - CuInGaSe2 KW - cathodoluminescence KW - chalcopyrite KW - chemical potentials KW - defect point physics KW - electronic properties KW - electrostatic KW - grain boundary KW - kesterite-based solar cells KW - luminescence spectroscopy KW - Electric potential KW - Fluctuations KW - Grain boundaries KW - Luminescence KW - Photovoltaic cells KW - Spectroscopy KW - Temperature measurement KW - cathodoluminescence KW - chalcopyrite KW - kesterite KW - thin film DO - 10.1109/PVSC.2012.6318290 JO - 2012 38th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2012 38th IEEE Photovoltaic Specialists Conference Y1 - 3-8 June 2012 ER - TY - CONF TI - Single crystal growth and phase stability of photovoltaic grade ZnSiP2 by flux technique T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) SP - 1 EP - 5 AU - A. D. Martinez AU - E. L. Warren AU - P. C. Dippo AU - D. Kuciauskas AU - B. R. Ortiz AU - H. Guthrey AU - A. Duda AU - A. G. Norman AU - E. S. Toberer AU - A. C. Tamboli PY - 2015 KW - crystal growth KW - optoelectronic devices KW - solar cells KW - zinc compounds KW - ZnSiP2 KW - flux growth technique KW - flux technique KW - optoelectronic material KW - phase stability KW - photovoltaic grade KW - photovoltaic material KW - single crystal growth KW - Crystals KW - Epitaxial growth KW - Heating KW - Photovoltaic systems KW - Silicon KW - Zinc KW - ZnSiP2 KW - photovoltaic cells KW - silicon KW - single crystal growth KW - tandem photovoltaics DO - 10.1109/PVSC.2015.7355697 JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) IS - SN - VO - VL - JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Y1 - 14-19 June 2015 ER - TY - CONF TI - Degradation in PV encapsulant strength of attachment: An interlaboratory study towards a climate-specific test T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) SP - 0095 EP - 0100 AU - D. C. Miller AU - E. Annigoni AU - A. Ballion AU - J. G. Bokria AU - L. S. Bruckman AU - D. M. Burns AU - X. Chen AU - J. Feng AU - R. H. French AU - S. Fowler AU - C. C. Honeker AU - M. D. Kempe AU - H. Khonkar AU - M. Köhl AU - L. E. Perret-Aebi AU - N. H. Phillips AU - K. P. Scott AU - F. Sculati-Meillaud AU - J. H. Wohlgemuth PY - 2016 KW - compressive strength KW - electron microscopy KW - life testing KW - optical images KW - shear strength KW - solar cells KW - EVA formulation KW - PV components KW - PV encapsulant strength of attachment KW - UV light source KW - accelerated aging tests KW - compressive shear test KW - electron microscopy KW - environmental stress KW - mechanical load-frame KW - optical imaging KW - poly(ethylene-co-vinyl acetate) KW - shear strain KW - shear strength KW - toughness KW - Adhesives KW - Aging KW - Glass KW - IEC Standards KW - Strain KW - Temperature measurement KW - Xenon KW - Xenon KW - durability KW - reliability DO - 10.1109/PVSC.2016.7749556 JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) IS - SN - VO - VL - JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Y1 - 5-10 June 2016 ER - TY - CONF TI - Optimization of organic photovoltaic devices using tuned mixed metal oxide contact layers T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 000102 EP - 000104 AU - K. X. Steirer AU - N. E. Widjonarko AU - A. K. Sigdel AU - M. T. Lloyd AU - D. S. Ginley AU - D. C. Olson AU - J. J. Berry PY - 2010 KW - nickel compounds KW - optimisation KW - pulsed laser deposition KW - solar cells KW - sputtering KW - NiOx KW - bulk heterojunction device KW - highest occupied molecular orbital level KW - hole collection KW - hole transport layers KW - optimization KW - organic photovoltaic device KW - oxide materials KW - pulsed laser deposition KW - solution precursor KW - sputtering KW - tuned mixed metal oxide contact layers KW - Electrodes KW - Heterojunctions KW - Materials KW - Performance evaluation KW - Photovoltaic systems KW - Plasmas DO - 10.1109/PVSC.2010.5614501 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - Beneficial effects of sodium on CuIn1-XGaXS2 thin film solar cells T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) SP - 001098 EP - 001101 AU - A. Kaul AU - P. Vasekar AU - N. G. Dhere AU - H. Moutinho PY - 2009 KW - carrier density KW - copper compounds KW - gallium compounds KW - indium compounds KW - semiconductor thin films KW - sodium KW - solar cells KW - ternary semiconductors KW - thin film devices KW - CuIn1-xGaxS2-Na KW - chalcopyrites KW - film morphology KW - free carrier concentration KW - microstructure KW - solar cells KW - sulfurization KW - thin films KW - Absorption KW - Copper KW - Etching KW - Gallium compounds KW - Indium KW - Microstructure KW - Morphology KW - Photonic band gap KW - Photovoltaic cells KW - Transistors DO - 10.1109/PVSC.2009.5411211 JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Y1 - 7-12 June 2009 ER - TY - CONF TI - Characterization of laser edge isolation in multicrystalline silicon solar cells T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 001721 EP - 001726 AU - C. S. Jiang AU - H. R. Moutinho AU - S. Johnston AU - Y. Yan AU - M. M. Al-Jassim AU - J. Gorman AU - A. Blosse PY - 2010 KW - atomic force microscopy KW - electron backscattering KW - failure analysis KW - laser ablation KW - scanning electron microscopy KW - silicon KW - solar cells KW - SEM KW - Si KW - ablated material KW - conductive atomic force microscopy KW - electron backscattering diffraction KW - emitter dopant KW - failure analysis KW - laser ablation KW - laser edge isolation KW - laser groove KW - lock-in thermography KW - microscopic electrical tools KW - molten material KW - morphological tools KW - multicrystalline solar cells KW - polycrystalline stripes KW - scanning capacitance microscopy KW - scanning electron microscopy KW - structural tools DO - 10.1109/PVSC.2010.5616118 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - An assessment of the impact of stochastic day-ahead SCUC on economic and reliability metrics at multiple timescales T2 - 2015 IEEE Power & Energy Society General Meeting SP - 1 EP - 5 AU - H. Wu AU - E. Ela AU - I. Krad AU - A. Florita AU - J. Zhang AU - B. M. Hodge AU - E. Ibanez AU - Wenzhong Gao PY - 2015 KW - optimisation KW - power generation control KW - power generation dispatch KW - power generation economics KW - power generation reliability KW - power generation scheduling KW - power system security KW - solar power stations KW - stochastic processes KW - wind power plants KW - RTS-96 system KW - automatic generation control KW - economic metrics KW - multitimescale multischeduling application KW - progressive hedging algorithm KW - reliability metrics KW - stochastic DASCUC KW - stochastic day-ahead security-constrained unit commitment KW - Automatic generation control KW - Load modeling KW - Optimization KW - Production KW - Reliability KW - Stochastic processes KW - Uncertainty KW - Area control error KW - multiple timescales KW - progressive hedging KW - security-constrained unit commitment KW - stochastic optimization DO - 10.1109/PESGM.2015.7286542 JO - 2015 IEEE Power & Energy Society General Meeting IS - SN - 1932-5517 VO - VL - JA - 2015 IEEE Power & Energy Society General Meeting Y1 - 26-30 July 2015 ER - TY - CONF TI - Investigation of thermal interface materials using phase-sensitive transient thermoreflectance technique T2 - Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) SP - 1296 EP - 1307 AU - X. Feng AU - C. King AU - D. DeVoto AU - M. Mihalic AU - S. Narumanchi PY - 2014 KW - adhesives KW - diffusion bonding KW - greases KW - plastic packaging KW - thermal management (packaging) KW - bulk thermal conductivity KW - contact resistance KW - diffusion bonded interface KW - electronics modules KW - electronics packages KW - grease material KW - heat removal KW - multilayer heat conduction model KW - phase sensitive transient thermoreflectance technique KW - power electronics application KW - thermal interface material KW - thermal management KW - thermal resistances KW - thermoplastic adhesives KW - Electronic packaging thermal management KW - Heating KW - Laser excitation KW - Materials KW - Pump lasers KW - Thermal conductivity KW - Thermal resistance KW - Thermal interface materials KW - bulk thermal conductivity KW - contact resistance KW - phase-sensitive transient thremoreflectance KW - thermophysical properties DO - 10.1109/ITHERM.2014.6892430 JO - Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) IS - SN - 1087-9870 VO - VL - JA - Fourteenth Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Y1 - 27-30 May 2014 ER - TY - CONF TI - Independent blade pitch controller design for a three-bladed turbine using disturbance accommodating control T2 - 2016 American Control Conference (ACC) SP - 2301 EP - 2306 AU - N. Wang AU - A. D. Wright AU - K. E. Johnson PY - 2016 KW - blades KW - control system synthesis KW - pitch control (position) KW - velocity control KW - wind turbines KW - DAC-based IPCs KW - Kronecker product KW - MBC transformed turbine model KW - TSA turbine model KW - above-rated wind speed KW - actuator dynamics KW - actuator phase delay KW - asymmetrical linear shear component KW - blade root flapwise bending loads KW - collective horizontal component KW - disturbance accommodating control KW - independent blade pitch controller design KW - multiblade coordinate transformed turbine model KW - once-per-revolution load reductions KW - rotor speed regulation KW - step waveform disturbance KW - three-bladed controls advanced research turbine KW - three-bladed turbine KW - transformed symmetrical-asymmetrical turbine model KW - twice-per-revolution load reductions KW - vertical shear component KW - wind disturbances KW - Blades KW - Load modeling KW - Mathematical model KW - Rotors KW - Wind speed KW - Wind turbines DO - 10.1109/ACC.2016.7525261 JO - 2016 American Control Conference (ACC) IS - SN - VO - VL - JA - 2016 American Control Conference (ACC) Y1 - 6-8 July 2016 ER - TY - CONF TI - Ion implanted passivated contacts for interdigitated back contacted solar cells T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) SP - 1 EP - 5 AU - D. L. Young AU - W. Nemeth AU - V. LaSalvia AU - R. Reedy AU - N. Bateman AU - P. Stradins PY - 2015 KW - annealing KW - electrical resistivity KW - electron-hole recombination KW - ion implantation KW - passivation KW - solar cells KW - tunnelling KW - Sinton lifetime tester KW - TLM patterns KW - contact resistivity KW - electron passivated contact KW - hole passivated contact KW - interdigitated back contacted solar cell KW - ion implantation KW - ion implanted amorphous silicon film KW - ion implanted passivated contact KW - n-type CZ wafer KW - n-type contact KW - p-type contact KW - passivated contacts KW - passivation quality improvement KW - post-implant anneal KW - recombination parameter KW - tunneling SiO2 KW - Annealing KW - Films KW - Implants KW - Passivation KW - Silicon KW - Temperature measurement KW - Transmission line measurements KW - Contacts KW - ion implantation KW - photovoltaic cells KW - silicon DO - 10.1109/PVSC.2015.7356141 JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) IS - SN - VO - VL - JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Y1 - 14-19 June 2015 ER - TY - CONF TI - Cross-Sectional Conductive Atomic Force Microscopy of CdTe/CdS Solar Cells: Effects of Etching and Back-Contact Processes T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference SP - 404 EP - 407 AU - H. R. Moutinho AU - R. G. Dhere AU - C. s. Jiang AU - T. Gessert AU - A. Duda AU - M. Young AU - W. K. Metzger AU - X. Li AU - M. m. Al-Jassim PY - 2006 KW - II-VI semiconductors KW - atomic force microscopy KW - cadmium compounds KW - copper KW - diffusion KW - electrical conductivity KW - etching KW - grain boundaries KW - ohmic contacts KW - semiconductor thin films KW - solar cells KW - AFM KW - CdTe surface KW - CdTe-CdS KW - Cu KW - Cu diffusion KW - Cu thin layer KW - back-contact process KW - bromine solutions KW - bulk electrical conductivity KW - cross-sectional conductive atomic force microscopy KW - current transport KW - etching process KW - grain boundaries KW - inhomogeneous conductive layer KW - nitric-phosphoric acid solutions KW - solar cells KW - Atomic force microscopy KW - Chemicals KW - Conductive films KW - Conductivity KW - Copper KW - Etching KW - Grain boundaries KW - Photovoltaic cells KW - Surface topography KW - Voltage DO - 10.1109/WCPEC.2006.279475 JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference IS - SN - 0160-8371 VO - 1 VL - 1 JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference Y1 - May 2006 ER - TY - JOUR TI - Device Physics of Heteroepitaxial Film c-Si Heterojunction Solar Cells T2 - IEEE Journal of Photovoltaics SP - 230 EP - 235 AU - S. Grover AU - C. W. Teplin AU - J. V. Li AU - D. C. Bobela AU - J. Bornstein AU - P. Schroeter AU - S. Johnston AU - H. Guthrey AU - P. Stradins AU - H. M. Branz AU - D. L. Young PY - 2013 KW - chemical vapour deposition KW - dislocations KW - passivation KW - semiconductor thin films KW - silicon KW - solar cells KW - Si KW - device physics KW - heteroepitaxial absorber KW - heteroepitaxial film KW - heteroepitaxy induced dislocation KW - heterojunction solar cell KW - homoepitaxial absorber KW - hot wire chemical vapor deposition KW - hydrogen passivation KW - ideality factor KW - inversion layer KW - recombination KW - single crystal silicon film KW - Heterojunctions KW - Passivation KW - Photovoltaic cells KW - Photovoltaic systems KW - Radiative recombination KW - Silicon KW - Charge recombination KW - diode ideality factor KW - heteroepitaxial silicon KW - open-circuit voltage KW - photovoltaic (PV) cells KW - quantum efficiency (QE) DO - 10.1109/JPHOTOV.2012.2223455 JO - IEEE Journal of Photovoltaics IS - 1 SN - 2156-3381 VO - 3 VL - 3 JA - IEEE Journal of Photovoltaics Y1 - Jan. 2013 ER - TY - JOUR TI - Interface Characterization of Single-Crystal CdTe Solar Cells With VOC > 950 mV T2 - IEEE Journal of Photovoltaics SP - 1650 EP - 1653 AU - J. M. Burst AU - J. N. Duenow AU - A. Kanevce AU - H. R. Moutinho AU - C. S. Jiang AU - M. M. Al-Jassim AU - M. O. Reese AU - D. S. Albin AU - J. A. Aguiar AU - E. Colegrove AU - T. Ablekim AU - S. K. Swain AU - K. G. Lynn AU - D. Kuciauskas AU - T. M. Barnes AU - W. K. Metzger PY - 2016 KW - II-VI semiconductors KW - cadmium compounds KW - carrier lifetime KW - hole density KW - solar cells KW - CdTe KW - carrier lifetime KW - hole density KW - interface characterization KW - interface recombination velocity KW - open circuit voltage KW - single crystal solar cells KW - solar cell efficiency KW - voltage 950 mV KW - Cadmium compounds KW - Copper compounds KW - Microstructure KW - Photovoltaic cells KW - CIGS and CdTe thin-film solar cells KW - Characterization of defects in photovoltaic (PV) KW - microstructure DO - 10.1109/JPHOTOV.2016.2598274 JO - IEEE Journal of Photovoltaics IS - 6 SN - 2156-3381 VO - 6 VL - 6 JA - IEEE Journal of Photovoltaics Y1 - Nov. 2016 ER - TY - CONF TI - A comparative study of DC and AC microgrids in commercial buildings across different climates and operating profiles T2 - 2015 IEEE First International Conference on DC Microgrids (ICDCM) SP - 159 EP - 164 AU - D. Fregosi AU - S. Ravula AU - D. Brhlik AU - J. Saussele AU - S. Frank AU - E. Bonnema AU - J. Scheib AU - E. Wilson PY - 2015 KW - building management systems KW - cost reduction KW - distributed power generation KW - energy conservation KW - power generation reliability KW - redundancy KW - solar cells KW - AC microgrid system KW - Bosch DC microgrid system reliability KW - United State KW - alternating current microgrid system KW - commercial building KW - cost reduction KW - direct current microgrid system KW - energy saving estimation KW - photovoltaic energy efficiency maximizes KW - redundancy KW - Analytical models KW - Buildings KW - Light emitting diodes KW - Lighting KW - Load modeling KW - Logic gates KW - Mathematical model KW - DC microgrid KW - LED KW - PV KW - energy efficiency DO - 10.1109/ICDCM.2015.7152031 JO - 2015 IEEE First International Conference on DC Microgrids (ICDCM) IS - SN - VO - VL - JA - 2015 IEEE First International Conference on DC Microgrids (ICDCM) Y1 - 7-10 June 2015 ER - TY - CONF TI - Indium zinc oxide mediated wafer bonding for III???V/Si tandem solar cells T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) SP - 1 EP - 5 AU - A. C. Tamboli AU - S. Essig AU - K. A. W. Horowitz AU - M. Woodhouse AU - M. F. A. M. van Hest AU - A. G. Norman AU - M. A. Steiner AU - P. Stradins PY - 2015 KW - III-V semiconductors KW - amorphous semiconductors KW - elemental semiconductors KW - indium KW - silicon KW - solar cells KW - zinc compounds KW - III-V tandem solar cell KW - Si tandem solar cell KW - ZnO:In-Si KW - amorphous indium zinc oxide mediated wafer bonding KW - electrical properties KW - heavily doped III-V contact layer KW - low concentration photovoltaics KW - low concentration single axis tracking system KW - low-cost III-V growth KW - material smoothness KW - optical properties KW - sun KW - Absorption KW - Gallium arsenide KW - Optical losses KW - Photonic band gap KW - Silicon KW - Substrates KW - Wafer bonding KW - III???V semiconductor materials KW - photovoltaic cells KW - silicon KW - wafer bonding DO - 10.1109/PVSC.2015.7356233 JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) IS - SN - VO - VL - JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Y1 - 14-19 June 2015 ER - TY - CONF TI - Partial shade evaluation of distributed power electronics for photovoltaic systems T2 - 2012 38th IEEE Photovoltaic Specialists Conference SP - 001627 EP - 001632 AU - C. Deline AU - J. Meydbray AU - M. Donovan AU - J. Forrest PY - 2012 KW - building integrated photovoltaics KW - invertors KW - power electronics KW - solar cell arrays KW - distributed power electronics KW - microinverters KW - partial shade evaluation KW - photovoltaic installations KW - photovoltaic systems KW - power 8 kW KW - shading test KW - Histograms KW - Inverters KW - Loss measurement KW - Performance evaluation KW - Photovoltaic systems KW - Power measurement KW - DC-DC power converters KW - microinverters KW - mismatch KW - partial shading KW - photovoltaic systems DO - 10.1109/PVSC.2012.6317908 JO - 2012 38th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2012 38th IEEE Photovoltaic Specialists Conference Y1 - 3-8 June 2012 ER - TY - CONF TI - Cogging torque minimization in transverse flux machines T2 - 2016 IEEE Energy Conversion Congress and Exposition (ECCE) SP - 1 EP - 8 AU - T. Husain AU - I. Hasan AU - Y. Sozer AU - I. Husain AU - E. Muljadi PY - 2016 KW - Taguchi methods KW - design of experiments KW - ferrites KW - finite element analysis KW - minimisation KW - permanent magnet machines KW - rotors KW - stators KW - torque KW - PM machine KW - Taguchi method KW - cogging torque minimization KW - design of experiments KW - double stator-single rotor configuration KW - e-core stator KW - finite element analysis KW - flux concentrating ferrite magnets KW - pole windings KW - quasiU-shaped stator cores KW - ring winding KW - stator back iron KW - three-level DOE KW - transverse flux machines KW - Forging KW - Magnetic flux KW - Rotors KW - Stator cores KW - Stator windings KW - Torque KW - PM machine KW - cogging torque reduction KW - design of experiment KW - optimization KW - review KW - transverse flux machine DO - 10.1109/ECCE.2016.7854923 JO - 2016 IEEE Energy Conversion Congress and Exposition (ECCE) IS - SN - VO - VL - JA - 2016 IEEE Energy Conversion Congress and Exposition (ECCE) Y1 - 18-22 Sept. 2016 ER - TY - CONF TI - Nanometer-scale study of resistance on CdTe solar cell devices T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) SP - 0090 EP - 0094 AU - H. Li AU - C. S. Jiang AU - W. Metzger AU - C. K. Shih AU - M. Al-Jassim PY - 2014 KW - atomic force microscopy KW - cadmium compounds KW - electric resistance measurement KW - semiconductor doping KW - solar cells KW - thermal analysis KW - CdS-CdTe KW - atomic force microscope laser illumination KW - carrier depletion KW - carrier injection KW - deep depletion region KW - doping KW - forward bias voltage KW - nanometer-resolution resistance mapping KW - photo-excited carriers KW - scanning spreading resistance microscopy KW - solar cell devices KW - thermoequilibrium state KW - Electrical resistance measurement KW - Force KW - Junctions KW - Measurement by laser beam KW - Photovoltaic cells KW - Probes KW - Resistance KW - characterization KW - micro-electrical property KW - scanning probe microscopy KW - thin-film PV DO - 10.1109/PVSC.2014.6925267 JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Y1 - 8-13 June 2014 ER - TY - CONF TI - Polycrystalline CdTe solar cells on buffered commercial TCO-coated glass with efficiencies above 15% T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 003410 EP - 003414 AU - R. Banai AU - C. Blissett AU - C. Buurma AU - E. Colegrove AU - P. Bechmann AU - J. Ellsworth AU - M. Morley AU - S. Barnes AU - C. Lennon AU - C. Gilmore AU - R. Dhere AU - J. Bergeson AU - M. Scott AU - T. Gessert PY - 2011 KW - buffer layers KW - cadmium compounds KW - current density KW - electrical resistivity KW - high-temperature techniques KW - optimisation KW - power semiconductor devices KW - semiconductor thin films KW - short-circuit currents KW - solar cells KW - thin film devices KW - CdTe KW - EPIR cells KW - NREL KW - National Renewable Energy Laboratory-verified efficiencies KW - SnO2-CdS KW - buffered commercial TCO-coated glass KW - commercially-available conductive glass KW - high resistivity buffer layer KW - high-efficiency polycrystalline CdTe solar cells KW - high-temperature technical glass KW - robust process KW - short-circuit current densities KW - thin film polycrystalline CdTe devices KW - transparent conducting oxide-coated glass KW - window layer thickness optimization KW - Absorption KW - Buffer layers KW - Glass KW - Junctions KW - Performance evaluation KW - Photovoltaic cells KW - Production DO - 10.1109/PVSC.2011.6186679 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - CONF TI - Plasma immersion ion implantation for interdigitated back passivated contact (IBPC) solar cells T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) SP - 0225 EP - 0229 AU - D. L. Young AU - W. Nemeth AU - V. LaSalvia AU - M. R. Page AU - S. Theingi AU - M. Young AU - J. Aguiar AU - B. G. Lee AU - P. Stradins PY - 2016 KW - passivation KW - plasma immersion ion implantation KW - semiconductor doping KW - solar cells KW - PH3 PIII doping KW - high-dose low-energy implantation KW - interdigitated back passivated contact solar cell KW - low-cost IBPC solar cell KW - low-cost interdigitated back contact solar cell KW - plasma immersion ion implantation KW - Annealing KW - Doping KW - Implants KW - Ions KW - Particle beams KW - Photovoltaic cells KW - Plasmas KW - Silicon KW - ion implantation KW - passivated contacts KW - photovoltaic cells KW - plasma DO - 10.1109/PVSC.2016.7749583 JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) IS - SN - VO - VL - JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Y1 - 5-10 June 2016 ER - TY - CONF TI - Direct-write contacts: Metallization and contact formation T2 - 2008 33rd IEEE Photovoltaic Specialists Conference SP - 1 EP - 3 AU - M. F. A. M. van Hest AU - C. J. Curtis AU - A. Miedaner AU - R. M. Pasquarelli AU - T. Kaydanova AU - P. Hersh AU - D. S. Ginley PY - 2008 KW - Conducting materials KW - Conductive films KW - Conductivity KW - Costs KW - Ink KW - Inorganic materials KW - Metallization KW - Photovoltaic cells KW - Printing KW - Spraying DO - 10.1109/PVSC.2008.4922798 JO - 2008 33rd IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2008 33rd IEEE Photovoltaic Specialists Conference Y1 - 11-16 May 2008 ER - TY - CONF TI - Imaging interfacial layers and internal fields in nanocrystalline junctions T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) SP - 3498 EP - 3501 AU - R. Ihly AU - S. U. Nanayakkara AU - J. Gao AU - Jianbing Zhang AU - M. Law AU - J. M. Luther PY - 2014 KW - II-VI semiconductors KW - IV-VI semiconductors KW - aluminium KW - atomic force microscopy KW - colloidal crystals KW - contact potential KW - lead compounds KW - nanostructured materials KW - semiconductor heterojunctions KW - semiconductor quantum dots KW - solar cells KW - wide band gap semiconductors KW - zinc compounds KW - Al-PbS-ZnO KW - SKPM KW - atomic force microscopy KW - colloidal quantum dot solar cell KW - conductive AFM tip KW - contact potential KW - electron-hole pairs KW - external quantum efficiencies KW - interfacial layers KW - internal fields KW - isolated nanostructures KW - localized band bending KW - multiple exciton generation KW - nanocrystalline junctions KW - p-n heterojunction KW - photovoltaic devices KW - power conversion efficiency KW - scanning Kelvin probe microscopy KW - solar spectrum KW - space charge KW - Electric potential KW - Films KW - Microscopy KW - Nanocrystals KW - Photovoltaic cells KW - Quantum dots KW - Spatial resolution KW - Kelvin probe KW - PbS KW - PbSe KW - atomic force microscopy KW - carrier multiplication KW - heterostructures KW - multiple exciton generation KW - quantum dot solar cells DO - 10.1109/PVSC.2014.6925686 JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Y1 - 8-13 June 2014 ER - TY - CONF TI - Testing and analysis for lifetime prediction of crystalline silicon PV modules undergoing degradation by system voltage stress T2 - 2012 38th IEEE Photovoltaic Specialists Conference SP - 001750 EP - 001755 AU - P. Hacke AU - R. Smith AU - K. Terwilliger AU - S. Glick AU - D. Jordan AU - S. Johnston AU - M. Kempe AU - S. Kurtz PY - 2012 KW - elemental semiconductors KW - failure analysis KW - life testing KW - silicon KW - solar cells KW - statistical analysis KW - Si KW - accelerated lifetime test data KW - accelerated testing KW - acceleration factors KW - crystalline silicon photovoltaic modules KW - lifetime prediction KW - lognormal analysis KW - potential-induced degradation KW - recombination current KW - statistical data KW - system voltage stress degradation KW - two-diode model analysis KW - Acceleration KW - Degradation KW - Life estimation KW - Resistance KW - Stress KW - Temperature measurement KW - Testing KW - Current-voltage characteristics KW - Degradation KW - High-voltage techniques KW - Photovoltaic cells KW - Photovoltaic systems KW - Reliability DO - 10.1109/PVSC.2012.6317933 JO - 2012 38th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2012 38th IEEE Photovoltaic Specialists Conference Y1 - 3-8 June 2012 ER - TY - CONF TI - Impact of buffer and absorber properties in the vicinity of the interface on wide-gap Cu(In,Ga)Se2 solar cell performance T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) SP - 0382 EP - 0386 AU - A. Kanevce AU - K. Ramanathan AU - M. Contreras PY - 2014 KW - copper compounds KW - indium compounds KW - inversion layers KW - solar cells KW - ternary semiconductors KW - CIGS KW - Cu(In-Ga)Se2 KW - absorber material property KW - absorber-buffer interface KW - defective heterointerface KW - doping KW - electron volt energy 1.15 eV KW - interface recombination KW - nonideal band alignment KW - recombination loss KW - solar cell KW - Buffer layers KW - Charge carrier density KW - Doping KW - Performance evaluation KW - Photonic band gap KW - Photovoltaic cells KW - Standards KW - CIGS KW - interface recombination KW - numerical modeling DO - 10.1109/PVSC.2014.6924938 JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Y1 - 8-13 June 2014 ER - TY - CONF TI - A kinetic model for GaAs growth by hydride vapor phase epitaxy T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) SP - 1930 EP - 1933 AU - K. L. Schulte AU - J. Simon AU - N. Jain AU - D. L. Young AU - A. J. Ptak PY - 2016 KW - III-V semiconductors KW - gallium arsenide KW - semiconductor epitaxial layers KW - semiconductor growth KW - thermodynamics KW - vapour phase epitaxial growth KW - GaAs KW - HVPE reactor KW - Langmuir-Hinshelwood analysis KW - TTT-V materials KW - growth rate law KW - hydride vapor phase epitaxy KW - kinetic model KW - kinetic phenomena KW - thermodynamic phenomena KW - Boats KW - Epitaxial growth KW - Gallium KW - Gallium arsenide KW - Inductors KW - Kinetic theory KW - Surface treatment DO - 10.1109/PVSC.2016.7749961 JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) IS - SN - VO - VL - JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Y1 - 5-10 June 2016 ER - TY - JOUR TI - Simultaneous Measurement of Minority-Carrier Lifetime in Single-Crystal CdTe Using Three Transient Decay Techniques T2 - IEEE Journal of Photovoltaics SP - 1295 EP - 1300 AU - S. Johnston AU - K. Zaunbrecher AU - R. Ahrenkiel AU - D. Kuciauskas AU - D. Albin AU - W. Metzger PY - 2014 KW - II-VI semiconductors KW - cadmium compounds KW - carrier lifetime KW - minority carriers KW - photoluminescence KW - surface recombination KW - μ-PCD KW - CdTe KW - Nd:YAG laser KW - TFCA KW - bulk-dominated recombination KW - hole concentration KW - microwave-reflection photoconductive decay KW - minority-carrier lifetime KW - simultaneous measurement KW - simultaneous measurements KW - single-crystal sample KW - single-exponential decays KW - size 0.8 mm KW - surface recombination KW - surface-limited initial decay KW - temperature 293 K to 298 K KW - time-resolved photoluminescence KW - transient decay techniques KW - transient free-carrier absorption KW - two-photon excitation KW - unpassivated front surface KW - wavelength 532 nm KW - Absorption KW - Laser excitation KW - Measurement by laser beam KW - Power lasers KW - Semiconductor device measurement KW - Semiconductor lasers KW - Surface waves KW - Cadmium compounds KW - charge carrier lifetime KW - infrared detectors KW - microwave bands KW - photoconductivity KW - photoluminescence KW - photovoltaic cells KW - tellurium DO - 10.1109/JPHOTOV.2014.2339491 JO - IEEE Journal of Photovoltaics IS - 5 SN - 2156-3381 VO - 4 VL - 4 JA - IEEE Journal of Photovoltaics Y1 - Sept. 2014 ER - TY - CONF TI - Solar cell/module degradation and failure diagnostics T2 - 2008 IEEE International Reliability Physics Symposium SP - 172 EP - 177 AU - T. J. McMahon PY - 2008 KW - failure analysis KW - solar cells KW - damage mechanisms KW - failure diagnostics KW - large-area module KW - packaging failure KW - photovoltaics KW - solar cell KW - solar module KW - Acceleration KW - Moisture KW - Packaging KW - Photovoltaic cells KW - Photovoltaic systems KW - Solar power generation KW - Temperature KW - Thermal degradation KW - Thermal stresses KW - Voltage KW - PV modules KW - photovoltaics KW - reliability KW - stress KW - testing DO - 10.1109/RELPHY.2008.4558880 JO - 2008 IEEE International Reliability Physics Symposium IS - SN - 1541-7026 VO - VL - JA - 2008 IEEE International Reliability Physics Symposium Y1 - April 27 2008-May 1 2008 ER - TY - CONF TI - PV Manufacturing R&D Project Status and Accomplishments Under "in-Line Diagnostics and Intelligent Processing" and "Yield, Durability and Reliability" T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference SP - 2502 EP - 2505 AU - D. J. Friedman AU - R. L. Mitchell AU - B. M. Keyes AU - W. I. Bower AU - R. King AU - J. A. Mazer PY - 2006 KW - costing KW - durability KW - intelligent control KW - process control KW - reliability KW - solar cells KW - PV manufacturing R&D project KW - PV module fabrication KW - PV system component KW - cost-shared research-and-development programs KW - durability KW - experience curve analysis KW - in-line diagnostics KW - intelligent processing KW - module production cost-capacity metrics KW - optimal process control KW - reliability KW - silicon module production KW - thin-film module production KW - yield KW - Electrical equipment industry KW - Fabrication KW - Feedback KW - Manufacturing industries KW - Manufacturing processes KW - Monitoring KW - Process control KW - Production KW - Real time systems KW - Research and development DO - 10.1109/WCPEC.2006.279736 JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference IS - SN - 0160-8371 VO - 2 VL - 2 JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference Y1 - May 2006 ER - TY - CONF TI - Comparison of pyranometers vs. PV reference cells for evaluation of PV array performance T2 - 2012 38th IEEE Photovoltaic Specialists Conference SP - 002899 EP - 002904 AU - L. Dunn AU - M. Gostein AU - K. Emery PY - 2012 KW - atmospheric measuring apparatus KW - power system measurement KW - solar cell arrays KW - solar power stations KW - thermopiles KW - IEC 60904-3 reference solar spectrum KW - PV array performance evaluation KW - PV industry KW - PV power plant monitoring KW - PV power plants KW - PV reference cells KW - PV reference devices KW - historical irradiance data KW - incident solar radiation KW - irradiance measurements KW - photovoltaic industry KW - solar resource monitoring KW - thermopile pyranometers KW - Calibration KW - Measurement uncertainty KW - Monitoring KW - Power measurement KW - Surface waves KW - Temperature distribution KW - Temperature measurement KW - calibration KW - energy resources KW - instrumentation and measurement KW - measurement uncertainty KW - photovoltaic cells DO - 10.1109/PVSC.2012.6318193 JO - 2012 38th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2012 38th IEEE Photovoltaic Specialists Conference Y1 - 3-8 June 2012 ER - TY - CONF TI - A liquid-phase quartz crystal microbalance for photovoltaics research T2 - 2008 33rd IEEE Photovoltaic Specialists Conference SP - 1 EP - 5 AU - C. L. Perkins AU - X. Li PY - 2008 KW - Buffer layers KW - Chemical processes KW - Control systems KW - Electronics industry KW - Etching KW - Photovoltaic cells KW - Quantum dots KW - Silicon KW - Solids KW - Surface contamination DO - 10.1109/PVSC.2008.4922627 JO - 2008 33rd IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2008 33rd IEEE Photovoltaic Specialists Conference Y1 - 11-16 May 2008 ER - TY - CONF TI - Using diffusion-reaction simulation to study the formation and self-compensation mechanism of Cu doping in CdTe T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) SP - 1964 EP - 1967 AU - D. Guo AU - R. Akis AU - D. Brinkman AU - A. Moore AU - J. H. Yang AU - D. Krasikov AU - I. Sankin AU - C. Ringhofer AU - D. Vasileska PY - 2016 KW - II-VI semiconductors KW - cadmium compounds KW - copper compounds KW - discrete Fourier transforms KW - photovoltaic cells KW - semiconductor device models KW - semiconductor doping KW - solar absorber-convertors KW - solar cells KW - Cu-CdTe KW - DFT calculated KW - PV devices KW - diffusion-reaction simulation KW - fitted diffusion parameters KW - Cadmium compounds KW - Doping KW - II-VI semiconductor materials KW - Mathematical model KW - Photovoltaic cells KW - Photovoltaic systems KW - Semiconductor process modeling KW - CdTe KW - Photovoltaic cells KW - copper KW - diffusion KW - numerical simulations KW - semiconductor device doping DO - 10.1109/PVSC.2016.7749970 JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) IS - SN - VO - VL - JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Y1 - 5-10 June 2016 ER - TY - CONF TI - Understanding of defect physics in polycrystalline photovoltaic materials T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 001218 EP - 001222 AU - Y. Yan PY - 2011 KW - cadmium compounds KW - copper compounds KW - electron microscopy KW - gallium compounds KW - indium compounds KW - semiconductor thin films KW - silicon KW - solar cells KW - stacking faults KW - tin compounds KW - twin boundaries KW - zinc compounds KW - CIGS KW - CIS KW - CZTS KW - CZTSe KW - CdTe KW - Cu(InGa)Se2 KW - Cu2ZnSnS2 KW - Cu2ZnSnSe2 KW - DFT KW - Si KW - defect physics understanding KW - defects formation KW - density-functional theory KW - dislocations KW - electronic properties KW - grain boundaries KW - harmful defects formation KW - nanoscale electron microscopy characterization KW - point defects KW - polycrystalline photovoltaic materials KW - stacking faults KW - thin-film PV materials KW - thin-film materials KW - thin-film photovoltaic KW - thin-film solar cells performance KW - twins KW - Grain boundaries KW - P-n junctions KW - Photovoltaic cells KW - Silicon KW - Stacking DO - 10.1109/PVSC.2011.6186177 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - CONF TI - Applications of imaging techniques to Si, Cu(In,Ga)Se2, and CdTe and correlation to solar cell parameters T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 001727 EP - 001732 AU - S. Johnston AU - I. Repins AU - N. Call AU - R. Sundaramoorthy AU - K. M. Jones AU - B. To PY - 2010 KW - II-VI semiconductors KW - cadmium compounds KW - carrier lifetime KW - copper compounds KW - electroluminescence KW - gallium compounds KW - indium compounds KW - infrared imaging KW - minority carriers KW - photoluminescence KW - scanning electron microscopy KW - silicon KW - solar cells KW - wide band gap semiconductors KW - CdS KW - CdTe KW - Cu(InGa)Se2 KW - Si KW - carrier recombination KW - dark lock-in thermography KW - detrimental weak diodes KW - electroluminescence imaging KW - illuminated lock-in thermography KW - image intensity KW - imaging techniques KW - minority-carrier lifetime KW - open circuit voltage KW - photoluminescence imaging KW - scanning electron microscopy KW - solar cell parameters DO - 10.1109/PVSC.2010.5616123 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - Transient stability of the US Western Interconnection with high wind and solar generation T2 - 2015 IEEE Power & Energy Society General Meeting SP - 1 EP - 5 AU - K. Clark AU - N. W. Miller AU - M. Shao AU - S. Pajic AU - R. D'Aquila PY - 2015 KW - power system interconnection KW - power system transient stability KW - solar power stations KW - wind power plants KW - US Western interconnection transient stability KW - WI KW - solar generation KW - wind generation KW - Load modeling KW - Power system stability KW - Springs KW - Stability criteria KW - Thermal stability KW - Transient analysis KW - Solar generation KW - transient stability KW - wind generation DO - 10.1109/PESGM.2015.7285987 JO - 2015 IEEE Power & Energy Society General Meeting IS - SN - 1932-5517 VO - VL - JA - 2015 IEEE Power & Energy Society General Meeting Y1 - 26-30 July 2015 ER - TY - CONF TI - Defect-related trapping and recombination in metamorphic GaAs0.72P0.28 grown on GaAs T2 - 2008 33rd IEEE Photovoltaic Specialists Conference SP - 1 EP - 4 AU - T. H. Gfroerer AU - P. R. Simov AU - B. A. West AU - M. W. Wanlass PY - 2008 KW - Energy states KW - Gallium arsenide KW - Photoluminescence KW - Photonic band gap KW - Photovoltaic cells KW - Photovoltaic systems KW - Solar power generation KW - Spectroscopy KW - Temperature KW - Testing DO - 10.1109/PVSC.2008.4922904 JO - 2008 33rd IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2008 33rd IEEE Photovoltaic Specialists Conference Y1 - 11-16 May 2008 ER - TY - CONF TI - Printed module interconnects T2 - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) SP - 1 EP - 4 AU - T. R. Stockert AU - J. D. Fields AU - G. F. Pach AU - S. A. Mauger AU - M. F. A. M. van Hest PY - 2015 KW - copper compounds KW - gallium compounds KW - indium compounds KW - interconnections KW - solar cell arrays KW - thin films KW - 2-scribe printed interconnect approach KW - CIGS solar cells KW - Cu(InGa)Se2 KW - copper-indium-gallium-diselenide KW - interconnect widths KW - interconnected solar panel KW - interconnection method KW - monolithic interconnects KW - photovoltaic stack KW - power generation KW - printed module interconnects KW - scribe alignment KW - size 10 mm KW - size 250 mum KW - size 500 mum KW - thin film photovoltaic modules KW - Dielectrics KW - Electrodes KW - Integrated circuit interconnections KW - Metals KW - Photovoltaic systems KW - Printing KW - atmospheric processing KW - interconnects KW - photovoltaics DO - 10.1109/PVSC.2015.7356284 JO - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) IS - SN - VO - VL - JA - 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC) Y1 - 14-19 June 2015 ER - TY - JOUR TI - GaAs Solar Cells Grown by Hydride Vapor-Phase Epitaxy and the Development of GaInP Cladding Layers T2 - IEEE Journal of Photovoltaics SP - 191 EP - 195 AU - J. Simon AU - K. L. Schulte AU - D. L. Young AU - N. M. Haegel AU - A. J. Ptak PY - 2016 KW - III-V semiconductors KW - claddings KW - gallium arsenide KW - gallium compounds KW - p-n junctions KW - passivation KW - semiconductor growth KW - solar cells KW - vapour phase epitaxial growth KW - GaAs p-n junctions KW - GaAs solar cells KW - GaAs-GaInP KW - GaInP cladding layers KW - GaInP window layers KW - high-efficiency III-V photovoltaic devices KW - high-quality surface passivation layer KW - hydride vapor-phase epitaxy KW - open-circuit voltage KW - quantum efficiency KW - short-circuit current KW - Epitaxial growth KW - Gain measurement KW - Gallium arsenide KW - Metals KW - Photovoltaic cells KW - Substrates KW - Temperature measurement KW - Gallium arsenide KW - hydride vapor-phase epitaxy (HVPE) KW - photovoltaics DO - 10.1109/JPHOTOV.2015.2501723 JO - IEEE Journal of Photovoltaics IS - 1 SN - 2156-3381 VO - 6 VL - 6 JA - IEEE Journal of Photovoltaics Y1 - Jan. 2016 ER - TY - CONF TI - Two-dimensional measurement of n+-p asymmetrical junctions in multicrystalline silicon solar cells using AFM-based electrical techniques with nanometer resolution T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 001972 EP - 001977 AU - C. S. Jiang AU - J. T. Heath AU - H. R. Moutinho AU - J. V. Li AU - M. M. Al-Jassim PY - 2011 KW - atomic force microscopy KW - bending KW - elemental semiconductors KW - image resolution KW - p-n junctions KW - probes KW - silicon KW - solar cells KW - AFM-based electrical technique KW - SCM-SCS KW - SKPFM KW - Si KW - atomic force microscopy-based electrical technique KW - direct electrical imaging KW - direct electrical measurement KW - electric field KW - junction distribution KW - metallurgical junction location deduce KW - multicrystalline solar cell KW - n+-p asymmetrical electrical junction KW - nanometer resolution KW - scanning Kelvin probe force microscopy KW - scanning capacitance microscopy-spectroscopy KW - solar cell lateral inhomogeneity KW - surface band bending KW - two-dimensional determination junction locations KW - two-dimensional measurement KW - Capacitance-voltage characteristics KW - Doping profiles KW - Electric fields KW - Electric potential KW - Junctions KW - Silicon KW - Surface topography DO - 10.1109/PVSC.2011.6186340 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - CONF TI - Transparent conducting oxide development for electronics applications T2 - 2008 17th IEEE International Symposium on the Applications of Ferroelectrics SP - 1 EP - 2 PY - 2008 KW - Amorphous materials KW - Conductive films KW - Conductivity KW - Electrical resistance measurement KW - Electromagnetic wave absorption KW - Indium KW - Optical reflection KW - Sputtering KW - Substrates KW - Zinc oxide DO - 10.1109/ISAF.2008.4688157 JO - 2008 17th IEEE International Symposium on the Applications of Ferroelectrics IS - SN - 1099-4734 VO - VL - JA - 2008 17th IEEE International Symposium on the Applications of Ferroelectrics Y1 - 23-28 Feb. 2008 ER - TY - CONF TI - High penetration PV deployment in the Arizona Public Service system T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 002402 EP - 002405 AU - D. Narang AU - J. Hambrick PY - 2011 KW - data acquisition KW - photovoltaic power systems KW - power distribution protection KW - power generation reliability KW - power meters KW - APS community power project KW - Arizona public service system KW - Flagstaff Pilot KW - antiislanding KW - digital smart meters KW - distribution circuit protection systems KW - electrical data acquisition systems KW - high-penetration PV deployment KW - high-speed weather KW - phase balance KW - photovoltaic generators KW - power 1.5 MW KW - residential-scale PV KW - volt-var control schemes KW - voltage regulation KW - Analytical models KW - Communities KW - Data acquisition KW - Data models KW - Integrated circuit modeling KW - Load modeling KW - Renewable energy resources DO - 10.1109/PVSC.2011.6186433 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - JOUR TI - Synchrophasor-Based Auxiliary Controller to Enhance the Voltage Stability of a Distribution System With High Renewable Energy Penetration T2 - IEEE Transactions on Smart Grid SP - 2107 EP - 2115 AU - H. Jiang AU - Y. Zhang AU - J. J. Zhang AU - D. W. Gao AU - E. Muljadi PY - 2015 KW - IEEE standards KW - distributed power generation KW - phasor measurement KW - power distribution control KW - power grids KW - power system stability KW - predictive control KW - support vector machines KW - turbogenerators KW - wind power KW - wind turbines KW - IEEE 13-bus distribution system KW - North America KW - SVM predictor KW - WTG KW - auxiliary coordinated-control approach KW - distributed wind turbine generator KW - distribution feeder stability KW - distribution phasor measurement KW - grid stability KW - linear time-invariant system KW - linear time-variant system KW - megawatt-scale wind turbine KW - multiple input multiple output model predictive control KW - renewable energy penetration KW - support vector machine predictor KW - synchrophasor-based auxiliary controller KW - transmission grid KW - voltage deviation stabilization KW - voltage stability enhancement KW - wind energy KW - Phasor measurement units KW - Power system stability KW - Stability analysis KW - Support vector machines KW - Vectors KW - Voltage control KW - Voltage measurement KW - Distributed phasor measurement unit KW - linear time-variant (LTV) system KW - model predictive control (MPC) KW - multiple-input and multiple-output (MIMO) control KW - support vector machine (SVM) KW - wind turbine DO - 10.1109/TSG.2014.2387012 JO - IEEE Transactions on Smart Grid IS - 4 SN - 1949-3053 VO - 6 VL - 6 JA - IEEE Transactions on Smart Grid Y1 - July 2015 ER - TY - CONF TI - Transient response of cadmium telluride modules to light exposure T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 003113 EP - 003118 AU - C. Deline AU - J. del Cueto AU - D. S. Albin AU - C. Petersen AU - L. Tyler AU - G. TamizhMani PY - 2011 KW - cadmium compounds KW - modules KW - solar cells KW - thin films KW - βVoc KW - CdTe KW - cadmium telluride modules KW - indoor light-exposure KW - light exposure KW - outdoor light-exposure KW - photovoltaic modules KW - transient response KW - Current measurement KW - Steady-state KW - Temperature distribution KW - Temperature measurement KW - Temperature sensors KW - Transient analysis DO - 10.1109/PVSC.2011.6186602 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - CONF TI - How can we make PV modules safer? T2 - 2012 38th IEEE Photovoltaic Specialists Conference SP - 003162 EP - 003165 AU - J. H. Wohlgemuth AU - S. R. Kurtz PY - 2012 KW - building management systems KW - safety systems KW - solar cells KW - IEC 61730 KW - PV industry KW - PV modules KW - UL 1703 KW - commercial buildings KW - electrical arcing KW - electrical shock risk KW - exposed circuit element KW - ground faults KW - mechanical damage KW - open circuits KW - photovoltaic industry KW - redundant connection designs KW - residential buildings KW - robust mounting methods KW - safety standards KW - shock hazard KW - voltage 300 V to 600 V KW - Fires KW - IEC standards KW - Photovoltaic systems KW - x KW - y KW - z DO - 10.1109/PVSC.2012.6318250 JO - 2012 38th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2012 38th IEEE Photovoltaic Specialists Conference Y1 - 3-8 June 2012 ER - TY - CONF TI - Epitaxial growth of CZTS on Si substrates investigated with electron backscatter diffraction T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) SP - 2379 EP - 2383 AU - H. R. Moutinho AU - M. Young AU - S. Harvey AU - C. S. Jiang AU - C. Perkins AU - S. Wilson AU - M. M. Al-Jassim AU - I. L. Repins AU - G. Teeter PY - 2014 KW - copper compounds KW - electron backscattering KW - electron diffraction KW - molecular beam epitaxial growth KW - semiconductor epitaxial layers KW - semiconductor growth KW - semiconductor materials KW - tin compounds KW - zinc compounds KW - Cu2ZnSnS4 KW - EBSD analysis KW - Si KW - Si substrates KW - electron backscatter diffraction KW - epitaxial [111]-oriented CZTS films KW - epitaxial growth KW - molecular beam epitaxy KW - reliability KW - Diffraction KW - Epitaxial growth KW - Lattices KW - Silicon KW - Substrates KW - CZTS KW - EBSD KW - epitaxial growth DO - 10.1109/PVSC.2014.6925405 JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Y1 - 8-13 June 2014 ER - TY - CONF TI - AC/DC/AC Converter Modulation Strategy With Natural Zero sequence Rejection Using Only One Six-Switch Inverter Module T2 - 2007 IEEE International Electric Machines & Drives Conference SP - 1226 EP - 1233 AU - A. N. Velpuri AU - H. L. Hess AU - J. D. Law AU - E. J. Cegnar AU - E. Muljadi PY - 2007 KW - AC-DC power convertors KW - DC-AC power convertors KW - invertors KW - AC/DC/AC converter modulation KW - CPRWM inverter KW - natural zero sequence rejection KW - poly phase variable frequency KW - single phase fixed frequency KW - six switch inverter module KW - voltage components KW - Analog-digital conversion KW - Bridge circuits KW - Filters KW - Frequency conversion KW - Induction generators KW - Inverters KW - Voltage KW - Wind energy KW - Wind energy generation KW - Wind power generation KW - CRPWM KW - DC-AC power conversion KW - Induction generators KW - VSI KW - Wind energy KW - pulse width modulation KW - simultaneous modulation KW - space vector modulation KW - wind power generation KW - zero sequence filter KW - zigzag transformer DO - 10.1109/IEMDC.2007.383605 JO - 2007 IEEE International Electric Machines & Drives Conference IS - SN - VO - 2 VL - 2 JA - 2007 IEEE International Electric Machines & Drives Conference Y1 - 3-5 May 2007 ER - TY - JOUR TI - Synchronization of Nonlinear Oscillators in an LTI Electrical Power Network T2 - IEEE Transactions on Circuits and Systems I: Regular Papers SP - 834 EP - 844 AU - B. B. Johnson AU - S. V. Dhople AU - A. O. Hamadeh AU - P. T. Krein PY - 2014 KW - distributed power generation KW - invertors KW - oscillators KW - power distribution control KW - power generation control KW - synchronisation KW - transmission networks KW - LTI KW - branch impedance KW - common node KW - electrical power network KW - global asymptotic synchronization KW - islanded microgrid KW - linear time-invariant network KW - load impedance KW - modular design KW - nonlinear oscillators KW - parallel single-phase voltage source inverters KW - system control KW - Impedance KW - Inverters KW - Microgrids KW - Oscillators KW - Power system stability KW - Synchronization KW - Vectors KW - Inverter control KW - microgrids KW - nonlinear oscillators KW - synchronization DO - 10.1109/TCSI.2013.2284180 JO - IEEE Transactions on Circuits and Systems I: Regular Papers IS - 3 SN - 1549-8328 VO - 61 VL - 61 JA - IEEE Transactions on Circuits and Systems I: Regular Papers Y1 - March 2014 ER - TY - CONF TI - Applications of admittance spectroscopy in photovoltaic devices beyond majority-carrier trapping defects T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 000075 EP - 000078 AU - J. V. Li AU - R. S. Crandall AU - I. L. Repins AU - A. M. Nardes AU - D. H. Levi PY - 2011 KW - electric admittance measurement KW - solar cells KW - admittance measurement KW - admittance spectroscopy applications KW - admittance spectroscopy-based methods KW - data interpretation KW - highly conductive absorbers KW - majority-carrier mobility KW - majority-carrier trapping defects KW - minority-carrier inversion KW - minority-carrier lifetime KW - nonohmic contact potential barrier KW - ohmic contact KW - organic photovoltaic materials KW - photovoltaic devices KW - Admittance KW - Admittance measurement KW - Capacitance KW - Dielectrics KW - Photovoltaic systems KW - Spectroscopy KW - Temperature measurement DO - 10.1109/PVSC.2011.6185849 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - JOUR TI - Thermal and Electrical Effects of Partial Shade in Monolithic Thin-Film Photovoltaic Modules T2 - IEEE Journal of Photovoltaics SP - 1742 EP - 1747 AU - T. J. Silverman AU - M. G. Deceglie AU - X. Sun AU - R. L. Garris AU - M. A. Alam AU - C. Deline AU - S. Kurtz PY - 2015 KW - electric breakdown KW - solar cells KW - thin film devices KW - electrical effects KW - light-enhanced reverse breakdown KW - module engineering KW - monolithic thin-film photovoltaic modules KW - partial shade KW - reliability testing KW - thermal effects KW - Breakdown voltage KW - Current density KW - Electric breakdown KW - Heat transfer KW - Junctions KW - Photovoltaic cells KW - Stress DO - 10.1109/JPHOTOV.2015.2478071 JO - IEEE Journal of Photovoltaics IS - 6 SN - 2156-3381 VO - 5 VL - 5 JA - IEEE Journal of Photovoltaics Y1 - Nov. 2015 ER - TY - CONF TI - Fabrication of two-terminal metal-interconnected multijunction III–V solar cells T2 - 2012 38th IEEE Photovoltaic Specialists Conference SP - 000944 EP - 000948 AU - C. T. Lin AU - W. E. McMahon AU - J. S. Ward AU - J. F. Geisz AU - M. W. Wanlass AU - J. J. Carapella AU - W. Olavarria AU - M. Young AU - M. A. Steiner AU - R. M. Frances AU - A. E. Kibbler AU - A. Duda AU - J. M. Olson AU - E. E. Perl AU - D. J. Friedman AU - J. E. Bowers PY - 2012 KW - III-V semiconductors KW - bonds (chemical) KW - crystal structure KW - gallium arsenide KW - gallium compounds KW - indium compounds KW - nanofabrication KW - solar cells KW - Au-Au bonding KW - GaAs substrate KW - GaInAsP-GaInAs KW - GaInP-GaAs KW - InP substrate KW - conducting GaAs wafer KW - electron volt energy 1.42 eV KW - electron volt energy 1.85 eV KW - filler material KW - fully lattice-matched two-terminal solar cells KW - inverted GaAs cell KW - metal-interconnected multijunction III-V solar cells KW - optical coupling layer KW - two-junction tandem cell KW - Annealing KW - Bonding KW - Gallium arsenide KW - Metals KW - Optical coupling KW - Photovoltaic cells KW - III–V multijunction solar cell KW - device bonding DO - 10.1109/PVSC.2012.6317758 JO - 2012 38th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2012 38th IEEE Photovoltaic Specialists Conference Y1 - 3-8 June 2012 ER - TY - JOUR TI - Scalable Optimization Methods for Distribution Networks With High PV Integration T2 - IEEE Transactions on Smart Grid SP - 2061 EP - 2070 AU - S. S. Guggilam AU - E. Dall’Anese AU - Y. C. Chen AU - S. V. Dhople AU - G. B. Giannakis PY - 2016 KW - algebra KW - distribution networks KW - invertors KW - load flow KW - photovoltaic power systems KW - quadratic programming KW - OPF problem KW - PV-generation KW - QCQP KW - ac optimal power flow KW - algebraic power-flow equations KW - distribution feeder KW - distribution networks KW - distribution-system test feeders KW - high PV integration KW - linear approximation KW - nonlinear power-flow constraints KW - photovoltaic inverters KW - quadratic constrained quadratic program KW - reactive-power setpoints KW - scalable optimization methods KW - voltage regulation KW - Inverters KW - Linear approximation KW - Mathematical model KW - Optimization KW - Reactive power KW - Renewable energy sources KW - Scalability KW - Distribution networks KW - PV systems KW - linearization KW - optimization DO - 10.1109/TSG.2016.2543264 JO - IEEE Transactions on Smart Grid IS - 4 SN - 1949-3053 VO - 7 VL - 7 JA - IEEE Transactions on Smart Grid Y1 - July 2016 ER - TY - CONF TI - Superior low-light-level performance of upgraded metallurgical-grade silicon modules T2 - 2012 38th IEEE Photovoltaic Specialists Conference SP - 002359 EP - 002361 AU - K. Ounadjela AU - P. Rakotoniaina AU - O. Sidelkheir AU - O. Laparra AU - M. Kaes AU - R. Smith AU - S. Rummel AU - M. Al-Jassim PY - 2012 KW - metallurgy KW - performance evaluation KW - silicon KW - solar cells KW - testing KW - Calisolar upgraded metallurgical-grade solar cell KW - Si KW - electronic grade solar cells KW - standard monocrystalline solar cells KW - superior low light level performance KW - upgraded metallurgical-grade silicon modules KW - Electrical resistance measurement KW - Lighting KW - Mathematical model KW - Photovoltaic cells KW - Resistance KW - Silicon KW - Standards KW - emitter KW - low light KW - performance ratio KW - photovoltaic cells KW - shunt resistance KW - silicon KW - solar modules DO - 10.1109/PVSC.2012.6318072 JO - 2012 38th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2012 38th IEEE Photovoltaic Specialists Conference Y1 - 3-8 June 2012 ER - TY - CONF TI - Active integrated antenna based on planar dielectric resonator with tuning ferroelectric varactor T2 - 2007 IEEE/MTT-S International Microwave Symposium SP - 1201 EP - 1204 AU - O. Y. Buslov AU - A. A. Golovkov AU - V. N. Keis AU - A. B. Kozyrev AU - S. V. Krasilnikov AU - T. B. Samoilova AU - A. Y. Shimko AU - D. Ginley AU - T. Kaydanova PY - 2007 KW - Gunn diodes KW - active antennas KW - dielectric resonator antennas KW - ferroelectric capacitors KW - microwave antennas KW - phase noise KW - tuning KW - varactors KW - active antenna module KW - active integrated antenna KW - frequency 17 GHz KW - phase noise KW - planar dielectric resonator KW - radiation frequency tuning KW - radiation pattern KW - stabilizing resonator KW - tunability KW - tunable Gunn diode KW - tuning ferroelectric varactor KW - Antenna radiation patterns KW - Dielectric resonator antennas KW - Diodes KW - Ferroelectric materials KW - Frequency KW - Gunn devices KW - Phase noise KW - Power measurement KW - Tuning KW - Varactors KW - Active antenna KW - VCO KW - ferroelectric varactor KW - planar dielectric resonator KW - tunable oscillator DO - 10.1109/MWSYM.2007.380382 JO - 2007 IEEE/MTT-S International Microwave Symposium IS - SN - 0149-645X VO - VL - JA - 2007 IEEE/MTT-S International Microwave Symposium Y1 - 3-8 June 2007 ER - TY - CONF TI - Local voltage control in distribution networks: A game-theoretic perspective T2 - 2016 North American Power Symposium (NAPS) SP - 1 EP - 6 AU - X. Zhou AU - J. Tian AU - L. Chen AU - E. Dall'Anese PY - 2016 KW - game theory KW - load flow control KW - nonlinear control systems KW - photovoltaic power systems KW - power distribution control KW - power system stability KW - reactive power control KW - voltage control KW - PV system penetration KW - distribution network KW - fixed-point theorem KW - game theory KW - inverter-based voltage regulation KW - linear surrogate approximation KW - local Volt-VAr controller stability KW - local voltage control KW - nonlinear AC power flow model KW - nonlinear dynamical system KW - pertinent contraction mapping KW - photovoltaic system penetration KW - power system reliability KW - power-quality KW - reactive power compensation domain KW - Games KW - Mathematical model KW - Nonlinear dynamical systems KW - Numerical models KW - Optimization KW - Reactive power KW - Voltage control KW - Distribution systems KW - Volt/VAr control KW - game theory KW - photovoltaic systems KW - stability KW - voltage regulation DO - 10.1109/NAPS.2016.7747940 JO - 2016 North American Power Symposium (NAPS) IS - SN - VO - VL - JA - 2016 North American Power Symposium (NAPS) Y1 - 18-20 Sept. 2016 ER - TY - CONF TI - Development of Cu(In, Ga)Se2 test coupons for potential induced degradation studies T2 - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) SP - 0857 EP - 0862 AU - M. A. Contreras AU - P. Hacke AU - I. Repins PY - 2016 KW - copper compounds KW - encapsulation KW - gallium compounds KW - indium compounds KW - life testing KW - organic compounds KW - solar cells KW - ternary semiconductors KW - CuInGaSe2 KW - accelerated testing KW - edge seal encapsulation materials KW - encapsulated small area coupons KW - ethylene vinyl acetate KW - framed modules KW - frameless modules KW - glass covers KW - induced degradation KW - monolithically interconnected modules KW - photovoltaic module manufacturing KW - plastic-based top covers KW - solar cells KW - temperature 85 degC KW - test coupons KW - time 1000 hour KW - Degradation KW - Encapsulation KW - Fabrication KW - Glass KW - Nickel KW - Seals KW - Testing KW - CIGS KW - PID KW - photovoltaic cells KW - thin-film DO - 10.1109/PVSC.2016.7749730 JO - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) IS - SN - VO - VL - JA - 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) Y1 - 5-10 June 2016 ER - TY - CONF TI - Formation of a back contact by fire-through process of screen-printed silicon solar cells T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) SP - 001963 EP - 001968 AU - B. Sopori AU - V. Mehta AU - D. Guhabiswas AU - R. Reedy AU - H. Moutinho AU - B. To AU - A. Shaikh AU - A. Rangappan PY - 2009 KW - aluminium KW - diffusion KW - electrical contacts KW - elemental semiconductors KW - liquid metals KW - semiconductor-metal boundaries KW - silicon KW - solar cells KW - thick films KW - Si-Al KW - back contact KW - diffusion KW - dimple-free melt KW - eutectic composition KW - eutectic particles KW - fire-through process KW - incident light flux KW - molten particles KW - screen-printed multi-crystalline solar cells KW - stratification kinetics KW - temperature ramp-down profile KW - Artificial intelligence KW - Contact resistance KW - Gettering KW - Impurities KW - Ohmic contacts KW - Optical reflection KW - Photovoltaic cells KW - Silicon KW - Surface resistance KW - Temperature DO - 10.1109/PVSC.2009.5411536 JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Y1 - 7-12 June 2009 ER - TY - JOUR TI - Unlocking Flexibility: Integrated Optimization and Control of Multienergy Systems T2 - IEEE Power and Energy Magazine SP - 43 EP - 52 AU - E. Dall'Anese AU - P. Mancarella AU - A. Monti PY - 2017 KW - power system control KW - quality of service KW - district heating-cooling systems KW - environmental benefits KW - integrated optimization KW - multienergy systems control KW - operational efficiency KW - optimization KW - quality-of-service KW - Cooling KW - Electricity supply industry KW - Heat pumps KW - Hydrogen KW - Natural gas KW - Optimization KW - Power system planning KW - Resistance heating KW - Water heating DO - 10.1109/MPE.2016.2625218 JO - IEEE Power and Energy Magazine IS - 1 SN - 1540-7977 VO - 15 VL - 15 JA - IEEE Power and Energy Magazine Y1 - Jan.-Feb. 2017 ER - TY - CONF TI - Nanoscale measurements of the surface photovoltage in Cu(In, Ga)Se2, Cu2ZnSnS4, and Cu2ZnSnSe4 thin films: The role of the surface electronics on the efficiency of solar cells T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 001983 EP - 001986 AU - H. Du AU - M. J. Romero AU - I. Repins AU - G. Teeter AU - R. Noufi AU - M. M. Al-Jassim PY - 2011 KW - copper compounds KW - gallium compounds KW - indium compounds KW - scanning tunnelling spectroscopy KW - solar cells KW - space charge KW - stoichiometry KW - surface charging KW - thin films KW - tin compounds KW - voltage measurement KW - zinc compounds KW - Cu(InGa)Se2 KW - Cu2ZnSnS4 KW - Cu2ZnSnSe4 KW - SPV nanoscale measurement KW - STM KW - first-principle calculation prediction KW - inversion region KW - kesterite compound KW - scanning tunneling microscopy KW - solar cell efficiency KW - surface electronic KW - surface photovoltage nanoscale measurement KW - surface space charge region KW - surface stoichiometry deviation KW - thin film KW - Copper KW - Films KW - Photoconductivity KW - Photovoltaic cells KW - Semiconductor device measurement KW - Tunneling KW - Voltage measurement DO - 10.1109/PVSC.2011.6186342 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - CONF TI - Investigation of effects of processing and impurities on the properties of CdTe using microscopic two-dimensional photoluminescence imaging technique T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) SP - 001443 EP - 001447 AU - R. Dhere AU - B. Fluegel AU - A. Mascarenhas AU - J. Duenow AU - T. Gessert PY - 2009 KW - II-VI semiconductors KW - cadmium compounds KW - chemical vapour deposition KW - glass KW - grain boundaries KW - heat treatment KW - impurities KW - liquid phase deposition KW - multilayers KW - photoluminescence KW - semiconductor growth KW - tin compounds KW - wide band gap semiconductors KW - SiO2-SnO2-CdS-CdTe KW - alloying degree KW - chemical bath deposition KW - chemical vapor deposition KW - close-spaced sublimation KW - direct-imaging technique KW - electron-multiplying-CCD camera KW - grain boundary region KW - heat treatment KW - impurities KW - microscopic two-dimensional photoluminescence imaging KW - nonradiative recombination KW - photoluminescence mapping KW - size 100 nm KW - temperature 400 degC KW - time 5 min KW - wavelength 740 nm KW - wavelength 850 nm KW - wavelength 900 nm KW - Cameras KW - Chemicals KW - Glass KW - Grain boundaries KW - Heat treatment KW - Impurities KW - Microscopy KW - Photoluminescence KW - Surface treatment KW - Tellurium DO - 10.1109/PVSC.2009.5411317 JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Y1 - 7-12 June 2009 ER - TY - JOUR TI - Measurements and Modeling of III-V Solar Cells at High Temperatures up to 400 ${}^{circ}$C T2 - IEEE Journal of Photovoltaics SP - 1345 EP - 1352 AU - E. E. Perl AU - J. Simon AU - J. F. Geisz AU - M. L. Lee AU - D. J. Friedman AU - M. A. Steiner PY - 2016 KW - III-V semiconductors KW - aluminium compounds KW - carrier density KW - current density KW - energy gap KW - gallium arsenide KW - gallium compounds KW - indium compounds KW - ion recombination KW - photoemission KW - short-circuit currents KW - solar cells KW - Al0.12Ga0.39In0.49P KW - GaAs KW - III-V solar cell measurement KW - III-V solar cell model KW - bandgap reduction KW - cell efficiency KW - dark currents KW - electron volt energy 1.4 eV KW - electron volt energy 2 eV KW - fitting current-voltage measurement KW - high-temperature solar cell operation KW - illuminated current-voltage characteristics KW - intrinsic carrier concentration KW - open-circuit voltage KW - photocurrent KW - quantum efficiency KW - recombination characteristics KW - short-circuit current density KW - temperature 25 degC to 400 degC KW - temperature-dependent dark current extraction KW - two-diode model KW - Gallium arsenide KW - Photovoltaic cells KW - Photovoltaic systems KW - Temperature KW - Temperature measurement KW - Temperature sensors KW - III–V and concentrator photovoltaics (PV) KW - PV cells KW - semiconductor materials KW - solar energy KW - temperature dependence DO - 10.1109/JPHOTOV.2016.2582398 JO - IEEE Journal of Photovoltaics IS - 5 SN - 2156-3381 VO - 6 VL - 6 JA - IEEE Journal of Photovoltaics Y1 - Sept. 2016 ER - TY - CONF TI - Relative lifetime prediction for CPV die-attach layers T2 - 2012 IEEE International Reliability Physics Symposium (IRPS) SP - 4A.2.1 EP - 4A.2.8 AU - T. J. Silverman AU - N. Bosco AU - S. Kurtz PY - 2012 KW - cracks KW - failure analysis KW - microassembling KW - photovoltaic power systems KW - solar cells KW - solders KW - CPV cell assemblies KW - CPV cell eventual failure KW - CPV die-attach layers KW - Colorado KW - Oak Ridge KW - Tennessee KW - accelerated-test thermal cycles KW - arbitrary transient temperature conditions KW - concentrating photovoltaics cell assemblies KW - damage metric representation KW - geographic locations KW - higher ramp rates KW - large-area die-attach layer KW - lumped progress KW - numerical model KW - relative lifetime prediction KW - solder die-attach layer KW - thermal cycles KW - thermal runaway KW - thermomechanical fatigue KW - Assembly KW - Failure analysis KW - Life estimation KW - Materials KW - Standards KW - Strain KW - Stress DO - 10.1109/IRPS.2012.6241826 JO - 2012 IEEE International Reliability Physics Symposium (IRPS) IS - SN - 1541-7026 VO - VL - JA - 2012 IEEE International Reliability Physics Symposium (IRPS) Y1 - 15-19 April 2012 ER - TY - JOUR TI - The Influence of PV Module Materials and Design on Solder Joint Thermal Fatigue Durability T2 - IEEE Journal of Photovoltaics SP - 1407 EP - 1412 AU - N. Bosco AU - T. J. Silverman AU - S. Kurtz PY - 2016 KW - durability KW - elemental semiconductors KW - finite element analysis KW - laminates KW - silicon KW - solar cells KW - solders KW - statistical analysis KW - thermal stress cracking KW - ATC KW - FEM simulation KW - Latin Hypercube sampling statistical method KW - PV cell temperature history KW - PV module material KW - PbSn eutectic solder joint thermal fatigue durability KW - accelerated thermal cycle KW - acceleration factor KW - copper ribbon KW - finite element model simulation KW - flat plate photovoltaic module material KW - laminate material property variable KW - silicon thickness KW - solder layer thickness KW - Computational modeling KW - Fatigue KW - Finite element analysis KW - Photovoltaic systems KW - Silicon KW - Soldering KW - Acceleration factor KW - photovoltaic (PV) reliability KW - solder fatigue KW - thermal cycling DO - 10.1109/JPHOTOV.2016.2598255 JO - IEEE Journal of Photovoltaics IS - 6 SN - 2156-3381 VO - 6 VL - 6 JA - IEEE Journal of Photovoltaics Y1 - Nov. 2016 ER - TY - CONF TI - Growth of Biaxially Textured CeO2 Layers on Glass by Magnetron Sputtering T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference SP - 1368 EP - 1371 AU - M. f. a. m. V. Hest AU - A. J. Leenheer AU - J. D. Perkins AU - C. W. Teplin AU - D. S. Ginley PY - 2006 KW - cerium compounds KW - ion beam assisted deposition KW - sputter deposition KW - texture KW - thin films KW - CeO2 KW - IBAD KW - RF sputtering KW - biaxially textured layers KW - crystalline silicon KW - glass substrate KW - inclined substrate deposition KW - ion beam assisted deposition KW - magnetron sputtering KW - texture orientation KW - Crystalline materials KW - Crystallization KW - Glass KW - Grain boundaries KW - Ion beams KW - Ion sources KW - Radio frequency KW - Silicon KW - Sputtering KW - Substrates DO - 10.1109/WCPEC.2006.279686 JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference IS - SN - 0160-8371 VO - 2 VL - 2 JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference Y1 - May 2006 ER - TY - CONF TI - Comparative study of the performance of field-aged photovoltaic modules located in a hot and humid environment T2 - 2012 38th IEEE Photovoltaic Specialists Conference SP - 002376 EP - 002381 AU - N. Sorloaica-Hickman AU - K. Davis AU - A. Leyte-Vidal AU - S. Kurtz AU - D. Jordan PY - 2012 KW - failure analysis KW - insulation KW - real-time systems KW - regression analysis KW - reliability KW - solar cells KW - DC-AC current KW - DC-AC voltage KW - Florida state KW - IR inspections KW - PVUSA regression analysis KW - electrical insulation inspections KW - energy production KW - failure mechanism KW - failure mechanisms KW - field-aged photovoltaic modules performance KW - hot environment KW - humid environment KW - long term module reliability KW - long-term outdoor exposure KW - long-term systems monitoring KW - multiple analytical methods KW - nameplate performance values KW - performance measurements KW - performance ratio analysis KW - photovoltaic components KW - photovoltaic modules KW - power degradation KW - real-time climate KW - real-time field measurements KW - time constrained accelerated tests KW - visual inspections KW - Instruments KW - Internet KW - Lighting KW - MATLAB KW - Sensors KW - Time measurement KW - Transducers KW - PVUSA regression KW - Performance Rati KW - Photovoltaic KW - degradation rate KW - reliability DO - 10.1109/PVSC.2012.6318076 JO - 2012 38th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2012 38th IEEE Photovoltaic Specialists Conference Y1 - 3-8 June 2012 ER - TY - CONF TI - Defect characterization by admittance spectroscopy techniques based on temperature-rate duality T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 000239 EP - 000243 AU - J. V. Li AU - Y. Yan AU - A. J. Ptak AU - I. L. Repins AU - D. H. Levi PY - 2010 KW - III-V semiconductors KW - copper compounds KW - crystal defects KW - electron traps KW - gallium arsenide KW - hole traps KW - indium compounds KW - solar cells KW - Arrhenius plot KW - CuInGaSe2 KW - GaAsN KW - Meyer-Neldel rule KW - admittance spectroscopy technique KW - charge trapping KW - defect characterization KW - temperature derivative method KW - temperature rate duality KW - Admittance KW - Capacitance KW - Photovoltaic cells KW - Spectroscopy KW - Temperature KW - Temperature measurement DO - 10.1109/PVSC.2010.5614469 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - Comparison of minority carrier lifetime measurements in superstrate and substrate CdTe PV devices T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 001271 EP - 001274 AU - T. A. Gessert AU - R. G. Dhere AU - J. N. Duenow AU - D. Kuciauskas AU - A. Kanevce AU - J. D. Bergeson PY - 2011 KW - II-VI semiconductors KW - cadmium compounds KW - carrier lifetime KW - electron-hole recombination KW - minority carriers KW - photoluminescence KW - solar cells KW - wide band gap semiconductors KW - CdS-CdTe KW - TRPL decay analysis KW - TRPL measurements KW - bulk MCL and interface recombination KW - depletion region KW - drift field KW - fast recombination rate KW - minority carrier lifetime measurements KW - numerical modeling KW - photovoltaic device functionality analysis KW - substrate PV devices KW - superstrate PV devices KW - time-resolved photoluminescence measurements KW - Copper KW - Correlation KW - Glass KW - Junctions KW - Luminescence KW - Performance evaluation KW - Substrates DO - 10.1109/PVSC.2011.6186189 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - CONF TI - Evaluation and modeling of edge-seal materials for photovoltaic applications T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 000256 EP - 000261 AU - M. D. Kempe AU - A. A. Dameron AU - T. J. Moricone AU - M. O. Reese PY - 2010 KW - corrosion KW - glass KW - moisture KW - polymer films KW - sealing materials KW - solar cells KW - substrates KW - edge seal materials KW - encapsulant materials KW - glass substrate KW - moisture ingress KW - moisture permeation data KW - moisture-induced corrosion KW - nonFickian behavior KW - photovoltaic applications KW - photovoltaic devices KW - polyisobutylene materials KW - polymer films KW - water vapor transport KW - Glass DO - 10.1109/PVSC.2010.5614463 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - Direct analysis of the current-voltage curves of outdoor-degrading modules T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) SP - 2856 EP - 2861 AU - C. Ulbrich AU - S. Kurtz AU - D. Jordan AU - M. Görig AU - A. Gerber AU - U. Rau PY - 2014 KW - II-VI semiconductors KW - cadmium compounds KW - short-circuit currents KW - solar cells KW - CdTe KW - current-voltage curve direct analysis KW - double-exponential diode behavior KW - fill factor FF degradation KW - measured current density-voltage J-V curves KW - open-circuit voltage KW - outdoor-degrading modules KW - phenomenological four-parameter equation KW - short-circuit current density KW - time 2.5 year KW - voltage-dependent charge-carrier collection KW - Current density KW - Degradation KW - Equations KW - Mathematical model KW - Resistance KW - Short-circuit currents KW - Temperature measurement KW - CdTe KW - IV curve KW - degradation KW - diode ideality KW - monitoring KW - photovoltaic modules DO - 10.1109/PVSC.2014.6925527 JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Y1 - 8-13 June 2014 ER - TY - JOUR TI - Change in Brooklyn and Queens: How New York?s Reforming the Energy Vision Program and Con Edison Are Reshaping Electric Distribution Planning T2 - IEEE Power and Energy Magazine SP - 40 EP - 47 AU - M. Coddington AU - D. Sciano AU - J. Fuller PY - 2017 KW - power distribution planning KW - Brooklyn KW - New York City KW - Queens KW - electric distribution planning KW - gentrification KW - infrastructure rebuilding KW - load growth KW - new construction KW - Batteries KW - Distributed processing KW - Electricity supply industry KW - Power grids KW - Power system planing KW - Power system reliability KW - Substations KW - Urban areas DO - 10.1109/MPE.2016.2639179 JO - IEEE Power and Energy Magazine IS - 2 SN - 1540-7977 VO - 15 VL - 15 JA - IEEE Power and Energy Magazine Y1 - March-April 2017 ER - TY - JOUR TI - Energy Comes Together: The Integration of All Systems [Guest Editorial] T2 - IEEE Power and Energy Magazine SP - 18 EP - 23 AU - M. OMalley AU - B. Kroposki PY - 2013 KW - Electricity supply industry KW - Energy efficiency KW - Energy management KW - Power system economics KW - Power system planning KW - Renewable energy resources KW - Special issues and sections DO - 10.1109/MPE.2013.2266594 JO - IEEE Power and Energy Magazine IS - 5 SN - 1540-7977 VO - 11 VL - 11 JA - IEEE Power and Energy Magazine Y1 - Sept.-Oct. 2013 ER - TY - CONF TI - Characterization of in-use medium duty electric vehicle driving and charging behavior T2 - 2014 IEEE International Electric Vehicle Conference (IEVC) SP - 1 EP - 8 AU - A. Duran AU - A. Ragatz AU - R. Prohaska AU - K. Kelly AU - K. Walkowicz PY - 2014 KW - battery powered vehicles KW - data analysis KW - energy storage KW - average daily driving distance KW - charging frequency KW - data analysis KW - data collection KW - early deployment behavior KW - fuel consumption KW - medium duty EV charging behavior KW - medium duty electric vehicle driving KW - route aggressiveness KW - Batteries KW - Data collection KW - Energy consumption KW - Kinetic theory KW - Market research KW - Standards KW - Vehicles KW - Charging Behavior KW - Commercial Vehicle KW - Driving Behavior KW - Electric Vehicle (EV) KW - Medium Duty (MD) KW - Navistar KW - Smith DO - 10.1109/IEVC.2014.7056213 JO - 2014 IEEE International Electric Vehicle Conference (IEVC) IS - SN - VO - VL - JA - 2014 IEEE International Electric Vehicle Conference (IEVC) Y1 - 17-19 Dec. 2014 ER - TY - CONF TI - Comparison of transparent back contacts for CdTe top cells in tandem thin-film photovoltaic devices T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) SP - 002443 EP - 002447 AU - J. N. Duenow AU - T. M. Barnes AU - R. G. Dhere AU - J. D. Bergeson AU - B. A. Larson AU - J. L. Blackburn AU - A. Duda AU - G. Teeter AU - T. A. Gessert PY - 2009 KW - II-VI semiconductors KW - aluminium KW - cadmium compounds KW - carbon nanotubes KW - copper KW - indium compounds KW - ohmic contacts KW - photovoltaic cells KW - semiconductor thin films KW - tin compounds KW - wide band gap semiconductors KW - zinc compounds KW - CdTe-C KW - CdTe-ITO KW - CdTe-ZnO:Al KW - CdTe-ZnTe:Cu KW - device efficiency KW - metallization KW - narrower bandgap bottom cell KW - ohmic contact KW - single-wall carbon nanotube KW - tandem thin film photovoltaic devices KW - top cells KW - transparent back contacts KW - transparent conductor KW - two-junction cells KW - wide bandgap top cell KW - Indium tin oxide KW - Ohmic contacts KW - Photonic band gap KW - Photovoltaic cells KW - Photovoltaic systems KW - Solar power generation KW - Thin film devices KW - Transistors KW - Zinc compounds KW - Zinc oxide DO - 10.1109/PVSC.2009.5411282 JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Y1 - 7-12 June 2009 ER - TY - JOUR TI - The Tianjin 2014 Symposium on Microgrids: A meeting of the minds for international microgrid experts. T2 - IEEE Electrification Magazine SP - 79 EP - 85 AU - C. Marnay AU - B. Kroposki AU - M. Mao AU - H. Xu AU - A. Chong AU - S. K. Chung AU - R. Hara AU - T. Ise AU - R. Iravani AU - F. Katiraei AU - M. Albu AU - N. Hatziargyriou AU - T. Funabashi AU - J. Reilly AU - J. Driesen AU - G. Jimenez AU - X. Vallve PY - 2015 KW - Asia KW - Electricity supply industry KW - Microgrids KW - Power distribution KW - Power system economics KW - Power system planning KW - Research and development DO - 10.1109/MELE.2014.2381605 JO - IEEE Electrification Magazine IS - 1 SN - 2325-5897 VO - 3 VL - 3 JA - IEEE Electrification Magazine Y1 - March 2015 ER - TY - CONF TI - Procedure for applying IEC-61853 test data to a single diode model T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) SP - 2846 EP - 2849 AU - A. P. Dobos AU - S. M. MacAlpine PY - 2014 KW - IEC standards KW - photovoltaic cells KW - photovoltaic power systems KW - power semiconductor diodes KW - IEC-61853 test data standard KW - average maximum power point prediction error reduction KW - modified auxiliary diode model equations KW - photovoltaic module current-voltage characteristic KW - photovoltaic systems KW - single diode model KW - Complexity theory KW - Predictive models KW - IEC-61853 KW - performance modeling KW - photovoltaic module model KW - single diode model KW - thin film model DO - 10.1109/PVSC.2014.6925525 JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Y1 - 8-13 June 2014 ER - TY - CONF TI - Carrier density and compensation in semiconductors with multi dopants and multi transition energy levels: The case of Cu impurity in CdTe T2 - 2011 37th IEEE Photovoltaic Specialists Conference SP - 002833 EP - 002836 AU - S. H. Wei AU - J. Ma AU - T. A. Gessert AU - K. K. Chin PY - 2011 KW - cadmium compounds KW - carrier density KW - copper KW - semiconductor doping KW - solar cells KW - Cu:CdTe KW - cadmium telluride KW - carrier density KW - charge carrier KW - copper concentration KW - detailed balance theory KW - first-principle-calculated defect formation energies KW - multdopant energy level KW - multitransition energy level KW - optoelectronic device applications KW - semiconductor physics KW - semiconductor properties KW - solar cells KW - Charge carrier processes KW - Copper KW - Doping KW - Energy states KW - Impurities KW - Photovoltaic cells KW - Temperature measurement DO - 10.1109/PVSC.2011.6186535 JO - 2011 37th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2011 37th IEEE Photovoltaic Specialists Conference Y1 - 19-24 June 2011 ER - TY - CONF TI - Impact of Zn1−XMnXO on Cu(In,Ga)Se2 thin-film solar cells T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) SP - 000305 EP - 000308 AU - X. Li AU - A. Kanevce AU - J. V. Li AU - I. Repins AU - B. Egaas AU - R. Noufi PY - 2009 KW - copper compounds KW - gallium compounds KW - indium compounds KW - magnesium KW - semiconductor thin films KW - solar cells KW - thin film devices KW - zinc compounds KW - Zn1-xMnxO-CuInGaSe2 KW - cell properties KW - front-window layer KW - layer thickness KW - thin-film solar cells KW - Absorption KW - Numerical simulation KW - Optical buffering KW - Optical films KW - Optical sensors KW - Photonic band gap KW - Photovoltaic cells KW - Radio frequency KW - Sputtering KW - Zinc oxide KW - CIGS solar cell KW - ZnMgO KW - conduction-band offset DO - 10.1109/PVSC.2009.5411675 JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Y1 - 7-12 June 2009 ER - TY - CONF TI - Analytical improvements in PV degradation rate determination T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 002688 EP - 002693 AU - D. C. Jordan AU - S. R. Kurtz PY - 2010 KW - photovoltaic power systems KW - power grids KW - PV degradation rate determination KW - data analysis KW - data shifts KW - measurement time periods KW - outliers KW - power grid KW - Data models KW - Degradation KW - Mathematical model KW - Photovoltaic systems KW - Robustness KW - Silicon KW - Uncertainty DO - 10.1109/PVSC.2010.5617074 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - Variable-speed wind power plant operating with reserve power capability T2 - 2013 IEEE Energy Conversion Congress and Exposition SP - 3305 EP - 3310 AU - M. Singh AU - V. Gevorgian AU - E. Muljadi AU - E. Ela PY - 2013 KW - asynchronous generators KW - wind power plants KW - wind turbines KW - doubly-fed induction generator KW - reserve power capability KW - reserve-holding capability KW - variable-speed wind power plant KW - wind turbine control KW - wind turbine generators KW - Aerodynamics KW - Generators KW - Power systems KW - Spinning KW - Wind power generation KW - Wind speed KW - Wind turbines KW - governor response KW - induction generator KW - inertial response KW - renewable energy KW - variable speed KW - wind turbine generator DO - 10.1109/ECCE.2013.6647134 JO - 2013 IEEE Energy Conversion Congress and Exposition IS - SN - 2329-3721 VO - VL - JA - 2013 IEEE Energy Conversion Congress and Exposition Y1 - 15-19 Sept. 2013 ER - TY - CONF TI - High-Efficiency CdTe and CIGS Thin-Film Solar Cells: Highlights and Challenges T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference SP - 317 EP - 320 AU - R. Noufi AU - K. Zweibel PY - 2006 KW - II-VI semiconductors KW - cadmium compounds KW - copper compounds KW - indium compounds KW - semiconductor device manufacture KW - semiconductor thin films KW - solar cells KW - ternary semiconductors KW - thin film devices KW - 10.2 percent KW - 13 percent KW - 16.5 percent KW - 19.5 percent KW - CIGS thin-film solar cells KW - CdTe KW - CuInGaSe2 KW - absorption KW - deposition process KW - device-module structure KW - diagnostics KW - durability KW - encapsulation KW - high-speed processing KW - in-situ process control KW - junction layer KW - monolithic integration KW - thin-film photovoltaic modules KW - thin-film technologies KW - top electrode KW - water vapor KW - Costs KW - Degradation KW - Electrodes KW - Laboratories KW - Manufacturing KW - Monolithic integrated circuits KW - Photovoltaic cells KW - Photovoltaic systems KW - Solar power generation KW - Transistors DO - 10.1109/WCPEC.2006.279455 JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference IS - SN - 0160-8371 VO - 1 VL - 1 JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference Y1 - May 2006 ER - TY - CONF TI - Rapid fabrication of Cu(In,Ga)Se2 thin films by the two-step selenization process T2 - 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 SP - 1 EP - 7 AU - S. Ishizuka AU - L. M. Mansfield AU - C. DeHart AU - M. Scott AU - B. To AU - M. R. Young AU - B. Egaas AU - R. Noufi PY - 2012 KW - Grain size KW - Metals KW - Photovoltaic cells KW - Stacking KW - Surface morphology KW - Surface treatment KW - X-ray scattering KW - Copper indium gallium diselenide KW - Cu(In, Ga)Se2 (CIGS) KW - photovoltaic cells KW - selenization KW - thin films DO - 10.1109/PVSC-Vol2.2012.6656749 JO - 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 IS - SN - VO - VL - JA - 2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2 Y1 - 3-8 June 2012 ER - TY - CONF TI - Creep in photovoltaic modules: Examining the stability of polymeric materials and components T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 000262 EP - 000268 AU - D. C. Miller AU - M. D. Kempe AU - S. H. Glick AU - S. R. Kurtz PY - 2010 KW - creep KW - differential scanning calorimetry KW - non-Newtonian flow KW - photovoltaic cells KW - polymers KW - renewable energy sources KW - creep KW - differential scanning calorimetry KW - encapsulation materials KW - installation location KW - module configuration KW - module service life KW - mounting configuration KW - mounting-adhesive technologies KW - noncross-linked thermoplastics KW - phase transformation KW - photovoltaic modules KW - polymeric components KW - polymeric materials KW - renewable energy KW - rheometry data KW - site-specific time-temperature information KW - unacceptable physical displacement KW - viscoelastic flow DO - 10.1109/PVSC.2010.5615832 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - New Qualification Test Procedures for Concentrator Photovoltaic Modules and Assemblies T2 - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference SP - 721 EP - 724 AU - L. Ji AU - R. McConnell PY - 2006 KW - plastics KW - solar cells KW - solar energy concentrators KW - testing KW - IEC 62108.8d KW - concentrator photovoltaic modules KW - electric-current cycle KW - in-lab testing KW - on-site testing KW - photovoltaic assemblies KW - plastic materials KW - solar cell design KW - test procedures KW - test-sequence charts KW - thermal-cycling tests KW - type passing criterion selection KW - Assembly KW - IEC standards KW - Life testing KW - Materials testing KW - Photovoltaic systems KW - Qualifications KW - Solar power generation KW - Temperature distribution KW - Thermal conductivity KW - Thermal stresses DO - 10.1109/WCPEC.2006.279557 JO - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference IS - SN - 0160-8371 VO - 1 VL - 1 JA - 2006 IEEE 4th World Conference on Photovoltaic Energy Conference Y1 - May 2006 ER - TY - CONF TI - The direct correlation of CDTE solar cell stability with mobile ion charge generation during accelerated lifetime testing T2 - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) SP - 001903 EP - 001908 AU - D. S. Albin AU - R. G. Dhere AU - S. C. Glynn AU - W. K. Metzger PY - 2009 KW - II-VI semiconductors KW - cadmium compounds KW - solar cells KW - substrates KW - wide band gap semiconductors KW - CdS-CdTe KW - SnO2 KW - Zn2SO4 KW - accelerated lifetime testing KW - cadmium stannate KW - capacitance-voltage method KW - direct correlation KW - mobile ion charge generation KW - mobile ion concentration KW - solar cell stability KW - transparent conducting oxide substrates KW - zinc stannate KW - Cadmium compounds KW - Degradation KW - Hysteresis KW - Life estimation KW - Life testing KW - Photovoltaic cells KW - Solar power generation KW - Stability KW - Stress KW - Zinc DO - 10.1109/PVSC.2009.5411121 JO - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2009 34th IEEE Photovoltaic Specialists Conference (PVSC) Y1 - 7-12 June 2009 ER - TY - CONF TI - Evaluating future standards and codes with a focus on high penetration photovoltaic (HPPV) system deployment T2 - 2010 35th IEEE Photovoltaic Specialists Conference SP - 000544 EP - 000549 AU - M. H. Coddington AU - B. D. Kroposki AU - T. S. Basso PY - 2010 KW - photovoltaic power systems KW - power system security KW - electric utility rates KW - energy security KW - high penetration photovoltaic system deployment KW - penetration levels KW - power 792 MW KW - renewable capacity KW - societal deliberations DO - 10.1109/PVSC.2010.5616833 JO - 2010 35th IEEE Photovoltaic Specialists Conference IS - SN - 0160-8371 VO - VL - JA - 2010 35th IEEE Photovoltaic Specialists Conference Y1 - 20-25 June 2010 ER - TY - CONF TI - Performance characterization of cadmium telluride modules validated by utility-scale and test systems T2 - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) SP - 1957 EP - 1962 AU - L. Ngan AU - N. Strevel AU - K. Passow AU - A. F. Panchula AU - D. Jordan PY - 2014 KW - cadmium compounds KW - photovoltaic power systems KW - power engineering computing KW - power system measurement KW - solar cell arrays KW - statistical analysis KW - Isis KW - NREL test array KW - PV energy modeling KW - cadmium telluride modules KW - energy prediction guidance KW - first solar CdTe modules KW - internal prediction software KW - lifetime energy generation models KW - module temperature accuracy KW - performance characterization KW - plane-of-array irradiance KW - power 1.2 kW KW - power 600 W KW - statistical analysis KW - test systems KW - utility-scale installation KW - Accuracy KW - Current measurement KW - Energy measurement KW - Inverters KW - Power measurement KW - Temperature measurement KW - Voltage measurement KW - CdTe KW - PV energy modeling KW - PV system performance KW - degradation rate KW - photovoltaic cells KW - thin-film PV DO - 10.1109/PVSC.2014.6925309 JO - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) IS - SN - 0160-8371 VO - VL - JA - 2014 IEEE 40th Photovoltaic Specialist Conference (PVSC) Y1 - 8-13 June 2014 ER - TY - JOUR TI - Highly Transparent Compositionally Graded Buffers for New Metamorphic Multijunction Solar Cell Designs T2 - IEEE Journal of Photovoltaics SP - 347 EP - 353 AU - K. L. Schulte AU - R. M. France AU - J. F. Geisz PY - 2017 KW - aluminium compounds KW - doping KW - energy gap KW - gallium arsenide KW - gallium compounds KW - indium compounds KW - lattice constants KW - selenium KW - semiconductor junctions KW - solar cells KW - A-miscut substrate KW - AlxGayIn1-x-yAs-GaxIn1-xP:Se-GaInAs-GaAs KW - B-miscut substrate KW - GaAs KW - electron volt energy 0.74 eV KW - four-junction-inverted metamorphic multijunction cell KW - highly transparent compositionally graded buffer KW - lattice constant KW - metamorphic multijunction solar cell design KW - multijunction device structure KW - quantum efficiency measurement KW - single-graded buffer KW - tandem cell KW - two-junction band gap combination KW - voltage 0.41 V KW - wavelength 810 nm to 890 nm KW - Doping KW - Gallium arsenide KW - III-V semiconductor materials KW - Indium phosphide KW - Junctions KW - Photonic band gap KW - Substrates KW - III-V semiconductor materials KW - Photovoltaic cells KW - semiconductor device doping KW - semiconductor epitaxial layers DO - 10.1109/JPHOTOV.2016.2619183 JO - IEEE Journal of Photovoltaics IS - 1 SN - 2156-3381 VO - 7 VL - 7 JA - IEEE Journal of Photovoltaics Y1 - Jan. 2017 ER -